IEC 60424-8-2015 Ferrite cores - Guidelines on the limits of surface irregularities - Part 8 PQ-cores《铁氧体磁芯 表面不规则性的限制指南 第8部分 PQ磁芯》.pdf

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1、 IEC 60424-8 Edition 1.0 2015-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Ferrite cores Guidelines on the limits of surface irregularities Part 8: PQ-cores Noyaux ferrites Lignes directrices relatives aux limites des irrgularits de surface Partie 8: Noyaux PQ IEC 60424-8:2015-08(en-fr) THIS PUBLI

2、CATION IS COPYRIGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing

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4、ion. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de

5、 lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, ru

6、e de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. Abou

7、t IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulting the e

8、ntire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of c

9、riteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available online a

10、nd also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in 15 additional languages. Also known as the International Electr

11、otechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 60 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC

12、TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire o

13、rganisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications IEC Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus

14、rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques sur les Normes internationales, Spcifications techniques, Rapports techniques et autres documents de lIEC. Disponible pour P

15、C, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplac

16、es ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne

17、 de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 15 langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary Plus de 60 0

18、00 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsi

19、rez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 60424-8 Edition 1.0 2015-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Ferrite cores Guidelines on the limits of surface irregularities Part 8: PQ-cores Noyaux ferrites Lignes directr

20、ices relatives aux limites des irrgularits de surface Partie 8: Noyaux PQ INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 29.100.10 ISBN 978-2-8322-2803-6 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Elec

21、trotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 60424-8:2015 IEC 2015 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Te

22、rms and definitions 5 4 Limits of surface irregularities 6 4.1 Chips and ragged edges . 6 4.1.1 Chips and ragged edges located on the mating surface . 6 4.1.2 Chips located on other surfaces . 6 4.2 Cracks 9 4.3 Pull-out . 10 4.4 Crystallites 10 4.5 Flash 11 4.6 Pores 11 Bibliography 13 Figure 1 Exa

23、mples of surface irregularities 5 Figure 2 Chips and ragged edges location . 6 Figure 3 Cracks location 9 Figure 4 Reference dimensions for PQ-cores . 9 Figure 5 Pull-out location . 10 Figure 6 Crystallites location 11 Figure 7 Flash location. 11 Figure 8 Pores location 12 Table 1 Limits for allowab

24、le chipping areas 7 Table 2 Area and length reference of irregularities for visual inspection . 8 Table 3 Limits for cracks 10 IEC 60424-8:2015 IEC 2015 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FERRITE CORES GUIDELINES ON THE LIMITS OF SURFACE IRREGULARITIES Part 8: PQ-cores FOREWORD 1) The Int

25、ernational Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and ele

26、ctronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committ

27、ees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for

28、Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee h

29、as representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accur

30、ate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regiona

31、l publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in so

32、me areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents

33、including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or

34、reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of t

35、he elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60424-8 has been prepared by technical committee 51: Magnetic components and ferrite materials. The text of this standa

36、rd is based on the following documents: CDV Report on voting 51/1078/CDV 51/1084/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2

37、. 4 IEC 60424-8:2015 IEC 2015 A list of all parts in the IEC 60424 series, published under the general title Ferrite cores Guidelines on the limits of surface irregularities, can be found on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of e

38、xisting standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific publication.

39、 At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IEC 60424-8:2015 IEC 2015 5 FERRITE CORES GUIDELINES ON THE LIMITS OF SURFACE IRREGULARITIES Part 8: PQ-cores 1 Scope This part of IEC 60424 gives guidance on allowable limits of surface irregul

40、arities applicable to PQ-cores in accordance with the relevant generic specification. This standard is considered as a sectional specification useful in the negotiation between ferrite core manufacturers and users about surface irregularities. 2 Normative references The following documents, in whole

41、 or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60401-1, Terms and nomenclature for

42、cores made of magnetically soft ferrites Part 1: Terms used for physical irregularities IEC 60424-1, Ferrite cores Guide on the limits of surface irregularities Part 1: General specification 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60424-1 and

43、 IEC 60401-1, as well as the following apply. 3.1 pores holes left on the surface of cores after sintering and surface finishing SEE: Figure 1. Figure 1 Examples of surface irregularities IEC 6 IEC 60424-8:2015 IEC 2015 4 Limits of surface irregularities 4.1 Chips and ragged edges 4.1.1 Chips and ra

44、gged edges located on the mating surface The areas of the chips located on the mating surface (see C1 and C1 irregularities in Figure 2) shall not exceed the following limits: the cumulative area of the chips located on the mating surface shall be less than 4 % of the total mating surface; the cumul

45、ative area of the chips located on the centre post mating surface shall be less than 2 % of the total mating surface; the cumulative area of the chips located on the mating surface of one outer leg shall be less than 1 % of the total mating surface; The total length of the ragged edges shall be less

46、 than 25 % of the perimeter of the relevant mating surface. 4.1.2 Chips located on other surfaces The areas of the chips located on the other surfaces (see C2, C2, C3 and C3 irregularities in Figure 2) shall not exceed the following limits: the allowable chipping areas are doubled as compared to the

47、 limits for the whole mating surfaces (see Table 1); the rule for the ragged edges is the same as for the mating surfaces; chips and ragged edges are not acceptable on the inner edges of the wire slot area. Figure 2 Chips and ragged edges location The limits of allowable chipping areas shall be in a

48、ccordance with Table 1. IEC IEC 60424-8:2015 IEC 2015 7 Table 1 Limits for allowable chipping areas Unit: mm 2Core size Chipping on mating surface of one outer leg Chipping on mating surface of centre post Overall chipping on mating surface Overall chipping on other surfaces PQ20/16 1,0 2,0 4,5 9,0

49、PQ20/20 1,0 2,0 4,5 9,0 PQ26/20 2,0 4,5 9,5 19,0 PQ26/25 2,0 4,5 9,5 19,0 PQ32/20 3,0 6,0 12,0 24,0 PQ32/30 3,0 6,0 12,0 24,0 PQ35/35 3,0 6,5 13,0 26,0 PQ40/40 3,5 7,0 14,0 28,0 PQ50/50 6,0 12,5 25,0 50,0 NOTE For the relevant core sizes refer to IEC 62317-13. The area and length reference of irregularities for visual inspection are given in Table 2.

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