1、 IEC 60891 Edition 2.0 2009-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Photovoltaic devices Procedures for temperature and irradiance corrections to measured I-V characteristics Dispositifs photovoltaques Procdures pour les corrections en fonction de la temprature et de lclairement appliquer aux
2、 caractristiques I-V mesures IEC 60891:2009 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2009 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including phot
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16、es questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60891 Edition 2.0 2009-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Photovoltaic devices Procedures for temperature and irradiance corrections to measured I-V charact
17、eristics Dispositifs photovoltaques Procdures pour les corrections en fonction de la temprature et de lclairement appliquer aux caractristiques I-V mesures INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE R ICS 27.160 PRICE CODE CODE PRIX ISBN 2-8318-1073-1 Regist
18、ered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60891 IEC:2009 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Correction procedures 5 3.1 General .5 3.2 Correction procedure 16 3.3 Correction procedure 27 3.4
19、Correction procedure 38 4 Determination of temperature coefficients.13 4.1 General .13 4.2 Apparatus13 4.3 Procedure in natural sunlight.14 4.4 Procedure with a solar simulator .15 4.5 Calculation of temperature coefficients15 5 Determination of internal series resistance R Sand R S .15 5.1 General
20、.15 5.2 Correction procedure 116 5.3 Correction procedure 217 6 Determination of the curve correction factor and 18 6.1 General .18 6.2 Procedure .18 7 Reporting .19 Bibliography21 Figure 1 Example of the correction of the I-V characteristics by Equations (6) and (7) .10 Figure 2 Schematic diagram o
21、f the relation of G 3and T 3which can be chosen in the simultaneous correction for irradiance and temperature, for a fixed set of T 1 , G 1 , T 2 , and G 2by Equations (8) and (9)11 Figure 3 Schematic diagram of the processes for correcting the I-V characteristics to various ranges of irradiance and
22、 temperature based on three measured characteristics 12 Figure 4 Schematic diagram of the processes for correcting the I-V characteristics to various ranges of irradiance and temperature based on four measured characteristics .13 Figure 5 Positions for measuring the temperature of the test module be
23、hind the cells14 Figure 6 Determination of internal series resistance.16 Figure 7 Determination of V OCirradiance correction factor and internal series resistance.18 Figure 8 Determination of curve correction factor.19 60891 IEC:2009 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PHOTOVOLTAIC DEVICES
24、 PROCEDURES FOR TEMPERATURE AND IRRADIANCE CORRECTIONS TO MEASURED I-V CHARACTERISTICS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is t
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34、e for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60891 has bee
35、n prepared by IEC technical committee 82: Solar photovoltaic energy systems. This second edition cancels and replaces the first edition issued in 1987 and its Amendment 1 (1992) and constitutes a technical revision. The main technical changes with regard the previous edition are as follows: extends
36、edition 1 translation procedure to irradiance change during I-V measurement; adds 2 new translation procedures; revises procedure for determination of temperature coefficients to include PV modules; defines new procedure for determination of internal series resistance; defines new procedure for dete
37、rmination of curve correction factor. 4 60891 IEC:2009 The text of this standard is based on the following documents: FDIS Report on voting 82/581/FDIS 82/588/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This
38、publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publ
39、ication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60891 IEC:2009 5 PHOTOVOLTAIC DEVICES PROCEDURES FOR TEMPERATURE AND IRRADIANCE CORRECTIONS TO MEASURED I-V CHARACTERISTICS 1 Scope This standard defines procedures to be followed for te
40、mperature and irradiance corrections to the measured I-V (current-voltage) characteristics of photovoltaic devices. It also defines the procedures used to determine factors relevant for these corrections. Requirements for I-V measurement of photovoltaic devices are laid down in IEC 60904-1. NOTE 1 T
41、he photovoltaic devices include a single solar cell with or without a protective cover, a sub-assembly of solar cells, or a module. A different set of relevant parameters for I-V correction applies for each type of device. Although the determination of temperature coefficients for a module (or sub-a
42、ssembly of cells) may be calculated from single cell measurements, it should be noted that the internal series resistance and curve correction factor should be separately measured for a module or subassembly of cells. NOTE 2 The term “test specimen” is used to denote any of these devices. NOTE 3 Car
43、e should be taken regarding the use of I-V correction parameters. The parameters are valid for the PV device for which they have been measured. Variations may occur within a production lot or the type class. 2 Normative references The following referenced documents are indispensable for the applicat
44、ion of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60904-1, Photovoltaic devices Part 1: Measurements of photovoltaic current-voltage characteristics IEC 60904-2, Ph
45、otovoltaic devices Part 2: Requirements for reference solar devices IEC 60904-7, Photovoltaic devices Part 7: Computation of the spectral mismatch correction for measurements of photovoltaic devices IEC 60904-9, Photovoltaic devices Part 9: Solar simulator performance requirements IEC 60904-10, Phot
46、ovoltaic devices Part 10: Methods of linearity measurement 3 Correction procedures 3.1 General Three procedures for correcting measured current-voltage characteristics to other conditions of temperature and irradiance (such as STC) can be applied. The first is identical to the procedure given in Edi
47、tion 1 of this standard, but the equation has been rewritten for easier understanding. The second procedure is an alternative algebraic correction method which yields better results for large irradiance corrections (20 %). Both procedures require that correction parameters of the PV device are known
48、. If not known they need to be determined prior to performing the correction. The third procedure is an interpolation method which does not require correction parameters as input: It can be applied when a minimum of three current-voltage curves have been measured for the test device. These three cur
49、rent-voltage curves span the temperature and irradiance range for which the correction method is applicable. 6 60891 IEC:2009 All methods are applicable to linear devices as defined in IEC 60904-10. NOTE 1 An estimate on the translation accuracy is required (see Clause 7). NOTE 2 All PV devices should be linear within a limited range of irradiances and device temperature. Detail
