IEC 60512-12-4-2006 Connectors for electronic equipment - Tests and measurements - Part 12-4 Soldering tests - Test 12d Resistance to soldering heat solder bath.pdf

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1、 NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 60512-12-4Premire ditionFirst edition2006-02Connecteurs pour quipements lectroniques Essais et mesures Partie 12-4: Essais de soudure Essai 12d: Rsistance la chaleur de soudage, mthode de bain de soudage Connectors for electronic equipment Tests and

2、measurements Part 12-4: Soldering tests Test 12d: Resistance to soldering heat, solder bath method Numro de rfrence Reference number CEI/IEC 60512-12-4:2006 Numrotation des publications Depuis le 1er janvier 1997, les publications de la CEI sont numrotes partir de 60000. Ainsi, la CEI 34-1 devient l

3、a CEI 60034-1. Editions consolides Les versions consolides de certaines publications de la CEI incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la public

4、ation de base incorporant les amendements 1 et 2. Informations supplmentaires sur les publications de la CEI Le contenu technique des publications de la CEI est constamment revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements relatifs cette publication, y compris sa valid

5、it, sont dispo-nibles dans le Catalogue des publications de la CEI (voir ci-dessous) en plus des nouvelles ditions, amendements et corrigenda. Des informations sur les sujets ltude et lavancement des travaux entrepris par le comit dtudes qui a labor cette publication, ainsi que la liste des publicat

6、ions parues, sont galement disponibles par lintermdiaire de: Site web de la CEI (www.iec.ch) Catalogue des publications de la CEI Le catalogue en ligne sur le site web de la CEI (www.iec.ch/searchpub) vous permet de faire des recherches en utilisant de nombreux critres, comprenant des recherches tex

7、tuelles, par comit dtudes ou date de publication. Des informations en ligne sont galement disponibles sur les nouvelles publications, les publications remplaces ou retires, ainsi que sur les corrigenda. IEC Just Published Ce rsum des dernires publications parues (www.iec.ch/online_news/justpub) est

8、aussi dispo-nible par courrier lectronique. Veuillez prendre contact avec le Service client (voir ci-dessous) pour plus dinformations. Service clients Si vous avez des questions au sujet de cette publication ou avez besoin de renseignements supplmentaires, prenez contact avec le Service clients: Ema

9、il: custserviec.ch Tl: +41 22 919 02 11 Fax: +41 22 919 03 00 Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated ver

10、sions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC public

11、ations is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including its validity, is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Informa

12、tion on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on

13、the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text searches, technical committees and date of publication. On-line information is also available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Pu

14、blished This summary of recently issued publications (www.iec.ch/online_news/justpub) is also available by email. Please contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, p

15、lease contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 . NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 60512-12-4Premire ditionFirst edition2006-02Connecteurs pour quipements lectroniques Essais et mesures Partie 12-4: Essais de soudure Essai

16、12d: Rsistance la chaleur de soudage, mthode de bain de soudage Connectors for electronic equipment Tests and measurements Part 12-4: Soldering tests Test 12d: Resistance to soldering heat, solder bath method Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2006 Droits de re

17、production rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may

18、be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11

19、Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE F Commission Electrotechnique InternationaleInternational Electrotechnical Commission 2 60512-12-4 CEI:2006 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Parti

20、e 12-4: Essais de soudure Essai 12d: Rsistance la chaleur de soudage, mthode de bain de soudage AVANT-PROPOS 1) La Commission lectrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). L

21、a CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres activits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifica

22、tions accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales,

23、 en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. 2) Les dcisions ou accords officiels de la CEI concernant les questions techniques repr

24、sentent, dans la mesure du possible, un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. 3) Les publications de la CEI se prsentent sous la forme de recommandations internationales et sont agres comme tels par les Comits

25、nationaux de la CEI. Tous les efforts raisonnables sont entrepris afin que la CEI sassure de lexactitude du contenu technique de ses publications; la CEI ne peut pas tre tenue responsable de lventuelle mauvaise utilisation ou interprtation qui en est faite par un quelconque utilisateur final 4) Dans

26、 le but dencourager luniformit internationale, les Comits nationaux de la CEI sengagent, dans toute la mesure possible, appliquer de faon transparente les Publications de la CEI dans leurs publications nationales et rgionales. Toute divergence entre toute Publication de la CEI et toute publication n

27、ationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5) La CEI na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un matriel est dclar conforme lune de ses normes. 6) Tous les utilisateurs doivent

28、 sassurer quils sont en possession de la dernire dition de cette publication. 7) Aucune responsabilit ne doit tre impute la CEI, ses administrateurs, employs, auxiliaires ou mandataires, y compris ses experts particuliers et les membres de ses comits dtudes et des Comits nationaux de la CEI, pour to

29、ut prjudice caus en cas de dommages corporels et matriels, ou de tout autre dommage de quelque nature que ce soit, directe ou indirecte, ou pour supporter les cots (y compris les frais de justice) et les dpenses dcoulant de la publication ou de lutilisation de cette Publication de la CEI ou de toute

30、 autre Publication de la CEI, ou au crdit qui lui est accord. 8) Lattention est attire sur les rfrences normatives cites dans cette publication. Lutilisation de publications rfrences est indispensable pour une application correcte de la prsente publication. 9) Lattention est attire sur le fait que c

31、ertains des lments de la prsente Publication de la CEI peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CE

32、I 60512-12-4 a t tablie par le sous-comit 48B: Connecteurs, du comit dtudes 48 de la CEI: Composants lectromcaniques et structures mcaniques pour quipements lectroniques. La prsente Norme annule et remplace lessai 12d de la CEI 60512-6, parue en 1984, et constitue une rvision technique. La prsente n

33、orme doit tre lue conjointement avec la CEI 60512-1 et la CEI 60512-1-100 qui explique la structure de la srie CEI 60512. 60512-12-4 IEC:2006 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 12-4: Soldering tests Test 12d: Resistance to so

34、ldering heat, solder bath method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions

35、concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”).

36、 Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborat

37、es closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the

38、 relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that

39、 the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the ma

40、ximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsi

41、ble for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical

42、committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publi

43、cations. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

44、patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-12-4 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. Thi

45、s standard cancels and replaces Test 12d of IEC 60512-6, issued in 1984, and constitutes a technical revision. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. 4 60512-12-4 CEI:2006 Le texte de la prsente norme est

46、issu des documents suivants: FDIS Rapport de vote48B/1579/FDIS 48B/1612/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de la prsente norme. Cette publication a t rdige selon les Directives ISO/CEI, Partie 2. La CEI 60512-12 compr

47、end les parties suivantes, publies sous le titre gnral Connecteurs, pour quipements lectroniques Essais et mesures: Partie 12-1: Essais de soudure Essai 12a: Soudabilit, mouillage, mthode du bain dalliage1Partie 12-2: Essais de soudure Essai 12b: Soudabilit, mouillage, mthode du fer souder Partie 12

48、-3: Essais de soudure Essai 12c: Soudabilit, dmouillage Partie 12-4: Essais de soudure Essai 12d: Rsistance la chaleur de soudage, mthode de bain de soudage Partie 12-5: Essais de soudure Essai 12e: Rsistance la chaleur de soudage, mthode du fer souder Partie 12-6: Essais de soudure Essai 12f: Etanchit au flux et solvants de nettoyage dans une machine souder Partie 12-7: Essais de soudure Essai 12g: Soudabilit, mthode de la balance de mouillage Le comit a d

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