1、 IEC 60512-16-1 Edition 1.0 2008-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 16-1: Mechanical tests on contacts and terminations Test 16a: Probe damage Connecteurs pour quipements lectroniques Essais et mesures Partie 16-1: Essais mc
2、aniques des contacts et des sorties Essai 16a: Endommagement par sonde dessai IEC 60512-16-1:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or
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15、ontient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner de
16、s commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-16-1 Edition 1.0 2008-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tes
17、ts and measurements Part 16-1: Mechanical tests on contacts and terminations Test 16a: Probe damage Connecteurs pour quipements lectroniques Essais et mesures Partie 16-1: Essais mcaniques des contacts et des sorties Essai 16a: Endommagement par sonde dessai INTERNATIONAL ELECTROTECHNICAL COMMISSION
18、 COMMISSION ELECTROTECHNIQUE INTERNATIONALE F ICS 31.220.10 PRICE CODE CODE PRIX ISBN 2-8318-9820-X 2 60512-16-1 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-1: Mechanical tests on contacts and terminations Test 16a: Probe da
19、mage FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization i
20、n the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrus
21、ted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the Interna
22、tional Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since ea
23、ch technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of I
24、EC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in th
25、eir national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment decla
26、red to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National
27、 Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is dr
28、awn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall no
29、t be held responsible for identifying any or all such patent rights. International Standard IEC 60512-16-1 has been prepared by subcommittee 48B, Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and repl
30、aces test 16a of IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. 60512-16-1 IEC:2008 3 The text of this standard is based on the following documents: FDIS Report on voting 48B/1877/FDIS
31、 48B/1910/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title
32、Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the
33、specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 4 60512-16-1 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-1: Mechanical tests on contacts and terminations Test 16a: Probe damage 1 Scope and
34、object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test met
35、hod to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe. Although this test is intended for cylindrical contacts, the use for contacts with other geometries is not excluded. In which case, the detail specification should contain
36、 sufficient detail, given under the Clause 5 f), to enable the test to be done. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the re
37、ferenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination IEC 60512-16-5, Connectors for electronic equipment Tests and measurements Part 16-5: Mechanical tests on contacts
38、 and terminations Test 16e: Gauge retention force (resilient contacts) 13 Preparations 3.1 Preparation of specimen The specimen shall consist of the female part of a connector with its terminations, and may be wired if so specified in the detail specification. If the design of the connector does not
39、 prevent the rotation of the contact in its cavity, means to ensure this shall be used. Any such means shall not affect the validity of the test. If this is not possible, the contact shall be installed in its insert, and or housing, in the manner specified in the detail specification. Any preconditi
40、oning given in the detail specification shall be applied. 3.2 Equipment A test pin and handle, such as that shown in Figure 1, shall be provided. They shall conform to the following requirements. _ 1To be published. 60512-16-1 IEC:2008 5 a) Length A, shall be 0,75 times the minimum depth specified f
41、or the bore of the female contact under test. b) Diameter B, shall be equal to the nominal diameter of the male mating contact. c) Length L shall not be less than 10 A. d) Mass M shall be such that M L = the specified torque. The mass of the handle shall be taken into account in this calculation. e)
42、 The test pin shall have a hemispherical end. f) The test pin shall be made from hardened steel and have a polished surface. g) The handle shall have a spherical radius at the point marked “fulcrum”. h) Either, an alternative test pin with length A reduced to 0,50 times the minimum depth specified f
43、or the bore of the contact under test, or a spacer, which replicates the fulcrum of the handle, to achieve the same effect, shall be provided. M centre of mass F fulcrum A length L length B diameter Figure 1 Test pin, handle and mass F “M” L A B IEC 813/08 6 60512-16-1 IEC:2008 3.3 Mounting If mount
44、ing of the specimen is appropriate, it shall be as specified in the detail specification. 4 Test method 4.1 Procedure The axis of the contact shall be horizontal at all times during the test. The specified test probe shall be fully inserted. The connector under test shall then be slowly rotated thro
45、ugh 360 such that test load is applied in all possible positions. This forgoing procedure shall be repeated, either with the reduced length test pin, or the spacer specified in 3.2 h). Test IEC 60512-16-5, gauge retention force, shall then be carried out. 4.2 Measurements and requirements 4.2.1 Befo
46、re testing Visual examination according to IEC 60512-1-1 shall be carried out. The gauge retention requirements defined in the relevant detail specification shall be met. 4.2.2 After testing The requirements of the detail specification for gauge retention shall be met. Visual examination according t
47、o IEC 60512-1-1 shall be carried out. Special attention shall be given to elastic members within the contact under test. 5 Details to be specified When this test is required by a detail specification, the following shall be given therein: NOTE It is anticipated that the detail specification will con
48、tain sufficient detail to allow calculation required in 3.2 to be carried out. a) whether preconditioning required; b) wiring of the specimen; c) whether special mounting of the specimen is required; d) torque to be applied; e) gauge retention requirements; f) if the contact is not cylindrical, suff
49、icient details of equipment procedure, and measurements, for the test to be done; g) any deviation from the standard test method. _ 8 60512-16-1 CEI:2008 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 16-1: Essais mcaniques des contacts et des sorties Essai 16a: Endommagement par s
