1、 IEC 60512-16-2 Edition 1.0 2008-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 16-2: Mechanical tests on contacts and terminations Test 16b: Restricted entry Connecteurs pour quipements lectroniques Essais et mesures Partie 16-2: Essai
2、s mcaniques des contacts et des sorties Essai 16b: Entre restreinte IEC 60512-16-2:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any mea
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6、tez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes Internatio
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15、us de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commenta
16、ires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-16-2 Edition 1.0 2008-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and mea
17、surements Part 16-2: Mechanical tests on contacts and terminations Test 16b: Restricted entry Connecteurs pour quipements lectroniques Essais et mesures Partie 16-2: Essais mcaniques des contacts et des sorties Essai 16b: Entre restreinte INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROT
18、ECHNIQUE INTERNATIONALE E ICS 31.220.10 PRICE CODE CODE PRIX ISBN 2-8318-9821-8 2 60512-16-2 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-2: Mechanical tests on contacts and terminations Test 16b: Restricted entry FOREWORD 1)
19、 The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical
20、 and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical
21、 committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organizat
22、ion for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical com
23、mittee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications
24、is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and
25、 regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in con
26、formity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for
27、any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Norma
28、tive references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held respon
29、sible for identifying any or all such patent rights. International Standard IEC 60512-16-2 has been prepared by subcommittee 48B, Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 16b of
30、 IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. The text of this standard is based on the following documents: FDIS Report on voting 48B/1878/FDIS 48B/1911/RVD Full information on the
31、voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-16-2 IEC:2008 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for e
32、lectronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publica
33、tion. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 4 60512-16-2 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-2: Mechanical tests on contacts and terminations Test 16b: Restricted entry 1 Scope and object This
34、part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to asses
35、s the effectiveness of the means by which an oversize male contact, or other similar object, is prevented from entering the equivalent female contact. NOTE Although this test is particularly applicable to cylindrical contacts, the use for contacts with other geometries is not excluded. In which case
36、, the detail specification should contain sufficient detail, given under 5.e), to enable the test to be done. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references
37、, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination 3 Preparations 3.1 Preparation of specimen The specimen shall consist of a connector
38、 with its terminations, and may be wired if so specified in the detail specification. Any preconditioning given in the component detail specification shall be applied. If lubricant is required by the detail specification, this shall be applied in the manner so specified. 3.2 Equipment A test gauge,
39、as specified in the detail specification, shall be provided. 3.3 Pre-conditioning Any pre-conditioning of the samples required by the applicable detail specification shall be applied. 3.4 Mounting If mounting of the specimen is necessary, it shall be as specified in the detail specification. 60512-1
40、6-2 IEC:2008 5 4 Test method 4.1 Procedure Attempts shall be made to enter the specified test gauge into the connector under test. If a maximum force to achieve this is given in detail specification, this shall not be exceeded. If no such force is specified, the maximum force deemed appropriate by t
41、he testing laboratory shall be applied. The value of this force shall be recorded. 4.2 Measurements and requirements 4.2.1 Before testing Visual examination according to IEC 60512-1-1 shall be carried out. There shall be no defects, which would impair the validity of the test. 4.2.2 During testing I
42、f it is possible to cause the test gauge to enter the connector under test, such force shall be measured. NOTE It is recommended that electrical contact between the test probe and the contact under test be one criterion of entry. 4.2.3 After testing Visual examination according to IEC 60512-1-1 shal
43、l be carried out. Details shall be specified. 5 Details to be specified When this test is required by a detail specification, the following shall be given therein: a) whether preconditioning is required; b) wiring of the specimen; c) whether special mounting of the specimen is required; d) maximum f
44、orce to be applied may be specified; e) if the contact is not cylindrical, sufficient details of equipment procedure, and measurements, for the test to be done; f) any deviation from the standard test method. _ 6 60512-16-2 CEI:2008 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEM
45、ENTS LECTRONIQUES ESSAIS ET MESURES Partie 16-2: Essais mcaniques des contacts et des sorties Essai 16b: Entre restreinte AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Com
46、its nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres activits publie des Normes internationales, des Spcifications techniques, des Rappor
47、ts techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernemental
48、es et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. 2) Les dcisions ou accords officiels de la CEI concernant le
49、s questions techniques reprsentent, dans la mesure du possible, un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. 3) Les publications CEI se prsentent sous la forme de recommandations internationales et elles sont agres comme telles par l
