1、 IEC 60679-6 Edition 1.0 2011-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators Application guidelines Oscillateurs pilots par quartz sous assurance de la
2、 qualit Partie 6: Mthode de mesure de la gigue de phase pour les oscillateurs quartz et les oscillateurs SAW Lignes directrices pour lapplication IEC 60679-6:2011 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise speci
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17、TIONAL STANDARD NORME INTERNATIONALE Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators Application guidelines Oscillateurs pilots par quartz sous assurance de la qualit Partie 6: Mthode de mesure de la
18、 gigue de phase pour les oscillateurs quartz et les oscillateurs SAW Lignes directrices pour lapplication INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE S ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-88912-403-9 Registered trademark of the International Electrotec
19、hnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 60679-6 IEC:2011 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 8 2 Normative references . 8 3 Terms, definitions and general concepts . 8 3.1 Terms and definitions 8 3.2 General concepts 8 3.2.1 Phase
20、jitter 8 3.2.2 r.m.s jitter 9 3.2.3 Peak-to-peak jitter . 10 3.2.4 Random jitter . 10 3.2.5 Deterministic jitter . 11 3.2.6 Period (periodic) jitter 11 3.2.7 Data-dependent jitter . 11 3.2.8 Total jitter 11 3.3 Points to be considered for measurement 12 3.3.1 Measurement equipment . 12 3.3.2 Factors
21、 of measurement errors 12 4 Measurement method . 13 4.1 General . 13 4.2 Frequency range and the measurement method 13 4.3 Method using the phase noise measurement value 13 4.3.1 Overview . 13 4.3.2 Measurement equipment and system . 13 4.3.3 Measurement item . 13 4.3.4 Range of detuning frequency .
22、 14 4.3.5 Phase noise measurement method 14 4.4 Measurement method using the specially designed measurement equipment 14 4.4.1 Overview . 14 4.4.2 Measurement equipment and system . 14 4.4.3 Measurement items . 14 4.4.4 Number of measurements 14 4.5 Block diagram of the measurement 14 4.6 Input and
23、output impedance of the measurement system. 15 4.7 Measurement equipment . 15 4.7.1 General . 15 4.7.2 Jitter floor 15 4.7.3 Frequency range . 15 4.7.4 Output waveform . 15 4.7.5 Output voltage . 16 4.8 Test fixture 16 4.9 Cable, tools and instruments . 16 5 Measurement and the measurement environme
24、nt . 16 5.1 Set-up before taking measurements 16 5.2 Points to be considered and noted at the time of measurement . 16 5.3 Treatment after the measurement 17 60679-6 IEC:2011 3 6 Measurement . 17 6.1 Reference temperature 17 6.2 Measurement of temperature characteristics . 17 6.3 Measurement under v
25、ibration 17 6.4 Measurement at the time of impact 17 6.5 Measurement in accelerated ageing 17 7 Other points to be noted . 17 8 Miscellaneous 17 Annex A (normative) Calculation method for the amount of phase jitter 18 Bibliography 21 Figure 1 Voltage versus time . 9 Figure 2 Explanatory diagram of t
26、he amount of jitter applied to r.m.s. jitter 10 Figure 3 Explanatory diagram of random jitter, deterministic jitter, and total jitter . 11 Figure 4 Equivalent block diagram . 15 Figure A.1 Concept diagram of SSB phase noise . 19 4 60679-6 IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ QUARTZ C
27、RYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators Application guidelines FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national
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36、ury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references
37、cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identi
38、fying any or all such patent rights. International Standard IEC 60679-6 has been prepared by lEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. This standard cancels and replaces IEC/PAS 60679-6 pub
39、lished in 2008. This first edition constitutes a technical revision. 60679-6 IEC:2011 5 The text of this standard is based on the following documents: FDIS Report on voting 49/935/FDIS 49/944/RVD Full information on the voting for the approval of this standard can be found in the report on voting in
40、dicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60679 series, published under the general title Quartz crystal controlled oscillators of assessed quality, can be found on the IEC website. The committee ha
41、s decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or
42、amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 60679-6 IEC:2011 INTRODUCTION The s
43、tudy of phase jitter measurement methods was conducted in accordance with the agreement during the IEC TC 49 Berlin international meeting in 2001. At this meeting, the decision was made that Japan should assume the responsibilities of this study. Then, the technical committee of the Quartz Crystal I
44、ndustry Association of Japan (QIAJ) proceeded with this study. This study was substantially conducted during the years 2002 to 2005 and can be referred to as the first stage of the study. The second stage is being continued at present. Phase jitter has become one of the essential measurement items b
45、y digitization of electronic devices. However, theoretically, some ambiguity is still left in the phase jitter. Since no standard measurement method is proposed, suppliers and customers may be mutually exposed to a risk which could cause enormous economic losses. To avoid this risk, this document pr
46、ovides a standard, based on the study results during the first stage, for each company of QIAJ members to avoid anxiety as to the measurement of the phase jitter and for the purpose of giving guidance without any mistakes. In this standard, a recommendation to make r.m.s. jitter a measurement object
47、 is presented. The reason why this recommendation is submitted is because the oscillators resulting in ultra- low amount of jitter are targeted as the object to be measured. Oscillators are analogue-type electronic devices. Their sine wave output signals are more favourable than the signals obtained
48、 by electronic systems. Moreover, the output is utilized as the reference clock of the measurement equipment, leading to a situation in which the amount of phase jitter is shown to be smaller than the amount of phase jitter of the measurement equipment. Accordingly, this may give the impression that
49、 the measured amount of phase jitter is not from the oscillators but rather the amount of phase jitter generated by the measurement equipment, or the measurement system. Therefore, when adopting the amount of other phase jitters as the measurement items, a recommendation is presented to select measurement equipment and a measurement system capable of being verified and confirmed sufficiently, contractually det
