1、 IEC 61671-2 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) instrument description IEC 61671-2:2016-04(en) IEEEStd1671.2-2012IEEE Std 1671.2 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEEE All rights reserved. IEEE is a registered trademark
2、in the U.S. Patent 35.060 IEC ISBN 978-2-8322-3265-1 IEEE ISBN 978-1-5044-0862-2STD20900Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.2 Registered trademark of the International Electrotechnical Commission Contents 1. Overview 1 1.1 General 1 1.2
3、 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 3 2. Normative references 4 3. Definitions, abbreviations, and acronyms 4 3.1 Definitions . 4 3.2 Abbreviations and acronyms . 5 4. InstrumentDescription schema . 7 4.1 General 7 4.2 El
4、ements 7 4.3 Child elements 10 4.4 Complex types 13 4.5 Simple types .28 5. InstrumentDescription instance schema 28 5.1 Elements .28 5.2 Complex types 29 5.3 Simple types .31 6. ATML InstrumentDescription XML schema names and locations .31 7. ATML XML schema extensibility 33 8. Conformance .33 Anne
5、x A (informative) IEEE download Web site material associated with this document 34 Annex B (informative) Users information and examples 35 Annex C (informative) Glossary .38 Annex D (informative) Bibliography 39 $QQH( LQIRUPDWLYH ,(/LVWRI3DUWLFLSDQWV,( any IEC National Committee interested in the su
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18、n this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this standard, no
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21、, and the risk of infringement of such rights, is entirely their own responsibility. LLLIEC 61671-2:2016 IEEE Std 1671.2-2012 Published by IEC under license from IEEE. 2012 IEEE. All rights reserved. International Standard IEC 61671-2/IEEE Std 1671.2-2012 has been processed through IEC technical com
22、mittee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting IEEE Std 1671.2-2012 91/1314/FDIS 91/1338/RVD Full information on the voting for the approval of this standard can be foun
23、d in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the sp
24、ecific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. LYIEEE Std 1671.2-2012 (Revision of IEEE Std 1671.2-2008) IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description Sponsor IEEE Standards Coordinating Co
25、mmittee 20 on Test and Diagnosis for Electronic Systems Approved 5 December 2012 IEEE-SA Standards Board ,( explanatory information will be provided, along with examples, if additional clarification is needed. The explanatory information will include information on the intended use of the elements a
26、nd/or attributes where the name of the entity does not clearly indicate its intended use. For elements derived from another source type (e.g., an abstract type), only attributes that extend the source type will be listed; details regarding the base type will be listed along with the base type. When
27、referring to an attribute of an XML element, the convention of elementattribute will be used. In cases where an attribute name is referred to with no associated element, the attribute name will be enclosed in single quotes. Element and type names will always be set in italics when appearing in text.
28、 This standard uses the vocabulary and definitions of relevant IEEE standards. In case of conflict of definitions, except for those portions quoted from standards, the following precedence shall be observed: 1) Clause 3, 2) The IEEE Standards Dictionary Online.B5 1.5.2 Precedence The InstrumentDescr
29、iption schema (InstrumentDescription.xsd) element, child element, and annotation information shall take precedence over the descriptive information contained in Clause 4. The InstrumentDescription schema and the material contained in Clause 4 shall take precedence over the InstrumentDescription inst
30、ance document information represented in Clause 5 as well as the examples in Annex B. The InstrumentInstance schema (InstrumentInstance.xsd) element, child element, and annotation information shall take precedence over the descriptive information contained in Clause 5. The InstrumentInstance schema
31、and the material contained in Clause 5 shall take precedence over the InstrumentDescription instance document information represented in Clause 5 as well as the examples in Annex B. 1.5.3 Word usage In accordance with the IEEE Standards Style Manual B6, the word shall is used to indicate mandatory r
32、equirements strictly to be followed in order to conform to the standard and from which no deviation is permitted (shall equals is required to). The use of the word must is used only to describe unavoidable situations. The use of the word will is only used in statements of fact. The word should is us
33、ed to indicate that among several possibilities one is recommended as particularly suitable, without mentioning or excluding others (should equals is recommended that). 3The numbers in brackets correspond to those of the bibliography in Annex D. ,(&,(6WGThe word may is used to indicate a course of a
34、ction permissible within the limits of the standard (may equals is permitted to). The word can is used for statements of possibility and capability (can equals is able to). 2. Normative references The following referenced document is indispensable for the application of this document (i.e., they mus
35、t be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IE
36、EE Std 1671, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML.4,53. Definitions, abbreviations, and acronyms 3.1 Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Di
37、ctionary Online B56should be consulted for terms not defined in this clause. In the event a term is explicitly redefined, or defined in more detail in an ATML component standard, the component standards definition shall be normative for that ATML component standard. abstract type: A declared type th
38、at can be used to define other types through derivation. Only non-abstract types derived from the declared type can be used in instance documents. When such a type is used, it must be identified by the xsi:type attribute. automatic test markup language (ATML) instance document: See: instance documen
39、t. dynamic current: The rated current capacity of a particular VersaModule Eurocard (VME) extensions for instrumentation (VXI) or Peripheral Component Interconnect (PCI) extensions for instrumentation (PXI) backplane voltage for the frequencies from 20 Hz to 1 GHz.7element: A bounded component of th
40、e logical structure of an extensible markup language (XML) document that has a type and that may have XML attributes and content.8entity: Something that has a distinct separate existence. extensible markup language (XML) attribute: Name-value pair associated with an XML element. 4IEEE publications a
41、re available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855, USA (http:/standards.ieee.org/). 5The standards or products referred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 6IEEE Standards Dictionar
42、y Online subscription is available at: http:/www.ieee.org/portal/innovate/products/standard/standards_dictionary.html 7Adapted from VXI-1, VXIbus System Specification, Revision 3, 24 Nov. 2003. 8Adapted from Extensible Markup Language (XML) 1.0 (Fifth Edition). This document is available from the Wo
43、rld Wide Web Consortium (W3C) (http:/www.w3.org/xml). ,(&,(6WG extensible markup language (XML) document: A data object that conforms to the XML requirements for being well formed. In addition, the data object is valid if it additionally conforms to semantic rules of the XML schema. extensible marku
44、p language (XML) schema: The definition of a class of XML document, typically expressed in terms of constraints on the structure and the content of documents of that class, above and beyond the basic syntax constraints imposed by XML itself. instance document: An extensible markup language (XML) doc
45、ument which conforms to a particular XML schema. instrument: Devices (chemical, electrical, hydraulic, magnetic, mechanical, optical, pneumatic) that may be utilized to test, observe, measure, monitor, alter, generate, record, calibrate, manage, or control physical properties, movements, or other ch
46、aracteristics.9object: An object consists of state and behavior. An object stores its states in fields (variables in some programming languages) and exposes it behavior through methods (functions in some programming languages). peak current: The rated dc current of a particular VersaModule Eurocard
47、extensions for instrumentation (VXI) or peripheral component interconnect extensions for instrumentation (PXI) backplane voltage.10synthetic instrument: A series of hardware and software components, with standardized interfaces, to generate signals or make measurements using algorithmic/numeric proc
48、essing techniques. well formed: Conforming to all extensible markup language (XML) syntax rules. 3.2 Abbreviations and acronyms ANSI American National Standards Institute ATE automatic test equipment ATML automatic test markup language ATS automatic test system dc direct current DHCP dynamic host configuration protocol ECL emitter coupled logic ECLTRIG0-1 ECL triggers 0 and 1 EIA Electronics Industry Association GHz gigahert
