1、IEEE Std C37.04b-2008(Amendment to IEEE Std C37.04 -1999) IEEE Standard for Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100IEEE3 Park Avenue New York,
2、NY 10016-5997, USA3 April 2009IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at
3、02:30 from IEEE Xplore. Restrictions apply.Introduction This introduction is not part of IEEE Std C37.04-2008, IEEE Standard Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current BasisAmendment 2: To Change the Description of Transient Recovery Voltage for Harmonizatio
4、n with IEC 62271-100. This standard has been revised to change the TRV descriptions to harmonize with IEC 62271-100 (Ed. 1.1)-2003 (formerly IEC 60056)aper Amendment 1 17A-625-FDIS as produced by IEC SC17A/WG23, which is a joint IEC and IEEE Working Group on the Harmonization of Power Test Procedure
5、s for AC High Voltage Circuit Breakers. Consistent with the changes discussed in this amendment of IEEE Std C37.04TM, changes are also proceeding in parallel in other standards to align the text and preferred ratings values with these new TRV requirements. The other standards being revised concurren
6、tly are IEEE Std C37.06TM, ANSI C37.06, IEEE Std C37.09TM-1999, and IEEE Std C37.011TM-2005. The major changes implemented in this amendment are listed as follows. The TRV capability of circuit breakers according to this amendment to IEEE Std C37.04 is described by two- or four-parameter envelopes i
7、n place of 1-cosine and exponential-cosine envelopes. For breakers rated 100 kV and above, the TRV envelope is defined by four parameters where the short-circuit currents are above 30% of the breakers capability. At 30% and below, the TRV envelope is described by two parameters. For breakers rated 7
8、2.5 kV and below, the TRV envelope is described by two parameters over the entire current range. Three-phase to ground faults are the basis for rating, in accordance with the present and revised IEEE Std C37.04-1999: a) 1) 2) b) 1) 2) For circuit breakers applied on systems less than 100 kV, the TRV
9、 ratings assume that the systems can be operated ungrounded. This is equivalent to defining three-phase ungrounded faults as the basis for rating. There are two choices for TRVs on systems less than 100 kV. The first choice is for line connected systems, and the TRV values are those referred to as o
10、utdoor circuit breakers in prior revisions of ANSI standards. The second choice is for cable connected systems, and the TRV values are those found in IEC 62271-100 (Ed. 1.1)-2003 and are similar to the values for indoor circuit breakers in prior revisions of ANSI standards. For circuit breakers appl
11、ied on systems of 100 kV and above, there is also a choice: For systems 100 kV through 170 kV, the systems can be operated either ungrounded or effectively grounded so two TRV ratings are available for these systems. For systems 245 kV and above, the preferred TRV ratings assume that the systems are
12、 all effectively grounded, and the first-pole-to-clear factor is 1.3, which is similar to the approach taken by the IEC. There is also another table of values based on a first-pole-to-clear factor of 1.5 that provides alternative TRV values, which are similar to the prior revision of ANSI standards
13、that use the three-phase ungrounded fault as the basis of rating. Annex A: The methods of drawing TRV envelopes are included to illustrate the application of the four-parameter and two-parameter methods of drawing TRV envelopes to various examples. aInformation on references can be found in Clause 2
14、 iv Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply. Annex B: A comparison between the TRV terminology and symbols is included as a cross-reference of TRV terms between th
15、ose terms previously used in IEEE standards and those now employed in this standard and in IEC standards. Annex C: TRV envelopes. Annex D: TRV multipliers for related required capabilities. Annex E: The origin of out-of-phase TRV envelopes and values is included to explain the reasoning behind the c
16、hoices for out-of-phase TRV descriptions. Annex F: A list of references is included to provide the background for various statements made in this standard about the historical origin of TRV descriptions and values and of the system study basis for recent revisions. Notice to users Laws and regulatio
17、ns Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory re
18、quirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and
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20、waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An offi
21、cial IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrig
22、enda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http
23、/standards.ieee.org. v Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply.Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/
24、standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/.Patents Attention is called to the possibility that i
25、mplementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for w
26、hich a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discrimin
27、atory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this standard
28、 was completed, the TRV Working Group had the following membership: R. Kirland Smith, Chair Robert J. Behl William J. Bergman Stan Billings Anne Bosma John H. Brunke Frank Chapman Chih C. Chow Patrick DiLillo Randall Dotson Denis Dufournet Kenneth S. Edwards Leslie T. Falkingham Thomas E. Field Marc
29、el Fortin Detlef Fredrich Ruben D. Garzon Charles R. Hampe, Jr. Helmut Heiermeier Richard Jackson Paul P. Leufkens R. William Long Antonio Mannarino Neil McCord Georges Montillet Yasin I. Musa Hugh Ross Jim Ross Roger A. Sarkinen Roderick Sauls Devki Sharma H. Mel Smith R. Kirkland Smith David Stone
30、 Charles L. Wagner Keith Wallace Terry Williams Richard A. York Xi Zhuvi Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply.vii Copyright 2009 IEEE. All rights reserved. The f
31、ollowing members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Roy Alexander Mauricio Aristizabal Adam Bagby Munnu Bajpai Robert Barnett William J. Bill Bergman Stan Billings Wallace Binder Thomas Blair Frank Blalock
32、William Bloethe Anne Bosma Steven Brockschink Steven Brown Gustavo Brunello John H. Brunke Ted Burse Eldridge Byron Yunxiang Chen Chih C. Chow Tommy Cooper John Crouse Stephen Dare Randall Dotson Dana Dufield Denis Dufournet Douglas J. Edwards Kenneth S. Edwards Gary Engmann C. Erven Leslie T. Falki
33、ngham Thomas E. Field Marcel Fortin George Gela Kenneth Gettman Randall Groves Helmut Heiermeier Gary Heuston Scott Hietpas David Horvath Dennis Horwitz James Houston Richard Jackson Anders Johnson Yuri Khersonsky J. Koepfinger Jim Kulchisky Saumen Kundu Carl Kurinko Chung-Yu Lam Stephen Lambert Ger
34、ald Lee Boyd Leuenberger Jason Yy-Shung Lin Hua Liu Albert Livshitz R. William Long G. Luri Keith Malmedal Frank Mayle Peter Meyer Gary Michel Georges Montillet Charles Morse Jerry Murphy Yasin I. Musa Jeffrey Nelson Michael S. Newman Joe Nims T. Olsen Miklos Orosz Donald Parker R. Parry David Peelo
35、 Paulette Payne Powell Iulian Profir Ryland Revelle Michael Roberts Charles Rogers Steven Sano Devki Sharma Hyeong Sim H. Mel Smith James E. Smith R. Kirkland Smith David Stone James Swank S. Telander Malcolm Thaden Norbert Trapp Michael Wactor Charles L. Wagner Keith Wallace Joe Watson James Wilson
36、 Larry Yonce Richard A. York Janusz Zawadzki Xi Zhu Ahmed Zobaa When the IEEE-SA Standards Board approved this standard on 10 December 2008, it had the following membership: Robert M. Grow, Chair Tom A. Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeB
37、lasio Andrew Drozd Mark Epstein Alexander Gelman William R. Goldbach Arnold M. Greenspan Kenneth S. Hanus James Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Chuck Powers Narayanan Ramachandran Jon Walter Rosdahl Anne-Marie Sa
38、hazizian Malcolm V. Thaden Howard L. Wolfman Don Wright*Member Emeritus Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply.Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal
39、 NRC Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stepha
40、nie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply.Contents 2. Normative references 2 3. Definitions and special terms . 2 3.1 Definitions . 2 3.2 Special terms 2 5. Ratings 3 5.9 Rated transient recovery voltage (TRV) 3 Annex A (normative) Methods of drawing TRV
41、 envelopes 27 Annex B (informative) Comparison between the TRV terminology and symbols. 31 Annex C (informative) TRV envelopes 33 Annex D (informative) TRV multipliers for related required capabilities . 35 Annex E (informative) Basis for out-of-phase TRV envelopes and values 40 Annex F (informative
42、) Bibliography 44 ix Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply.Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from I
43、EEE Xplore. Restrictions apply.IEEE Standard for Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization with IEC 62271-100 IMPORTANT NOTICE: This standard is not intended to ens
44、ure safety, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important
45、 notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/
46、standards.ieee.org/IPR/disclaimers.html.NOTEThe editing instructions contained in this amendment define how to merge the material contained herein into the existing base standard and its amendments to form the comprehensive standard. The editing instructions are shown in bold italic. Four editing in
47、structions are used: change, delete, insert, and replace. Change is used to make small corrections in existing text or tables. The editing instruction specifies the location of the change and describes what is being changed by using strikethrough (to remove old material) and underscore (to add new m
48、aterial). Delete removes existing material. Insert adds new material without disturbing the existing material. Insertions may require renumbering. If so, renumbering instructions are given in the editing instruction. Replace is used to make large changes in existing text, subclauses, tables, or figu
49、res by removing existing material and replacing it with new material. Editorial notes will not be carried over into future editions because the changes will be incorporated into the base standard. 1 Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on April 17, 2009 at 02:30 from IEEE Xplore. Restrictions apply.IEEE Std C37.04b-2008 IEEE Standard for Rating Structure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis Amendment 2: To Change the Description of Transient Rec
