1、 IEEE Standard for Metal-Enclosed Bus Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy SocietyIEEE Std C37.23-2015(Revision ofIEEE Std C37.23-2003) IEEE Std C37.23-2015 (Revision of IEEE Std C37.23-2003) IEEE Standard for Metal-Enclosed Bus S
2、ponsor Switchgear Committee of the IEEE Power and Energy Society Approved 5 December 2015 IEEE-SA Standards Board 2 Copyright 2016 IEEE. All rights reserved. Abstract: Metal-enclosed (ME) bus assemblies for indoor and outdoor use are discussed in this standard. The types of assemblies covered are no
3、nsegregated-phase bus, cable bus, segregated-phase bus, and isolated-phase bus. Rated maximum voltages of ac ME bus assemblies range from 1058 V through 38 kV with continuous-current ratings of 600 A through 26 000 A for self-cooled ratings and up to 50 000 A for forced-cooled ratings. Rated maximum
4、 voltage levels of dc ME bus assemblies range from 300 V through 3200 V with continuous-current ratings of 600 A through 15 000 A. Service conditions, ratings, temperature limitations and classification of insulating materials, insulation (dielectric) withstand voltage requirements, test procedures,
5、 and application are discussed. A guide for calculating losses in isolated-phase bus is included. Keywords: cable bus, IEEE C37.23, isolated-phase bus, metal-enclosed bus, nonsegregated-phase bus, segregated-phase bus The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New Yor
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35、fringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. 5 Copyright 2016 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the Switchgear Assemblies Subcommittee Working Group had th
36、e following membership: Arthur Jur, Chair Thomas Hawkins, Vice Chair Paul Barnhart Russell Boyce Ted Burse Jon Campbell Robert Cohn Douglas J. Edwards Michael Flack Paul Gingrich S. Gohil Bruce Hack Frank Mayle Deepak Mazumdar John McClelland Mike Miller T. W. Olsen Amit Patel Edward Peters Steve Po
37、well Samala Santosh Reddy Mark Roberson Richard Rohr Paul Sullivan C. Tailor Matthew Williford The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Ficheux Arnaud Thomas Barnes Paul Barnhart George Beck
38、er W. J. (Bill) Bergman Steven Bezner Wallace Binder Thomas Blair William Bloethe Ted Burse Eldridge Byron Thomas Callsen Paul Cardinal Suresh Channarasappa Robert Cohn Gary Donner Randall Dotson Louis Doucet Neal Dowling Edgar Dullni Donald Dunn Douglas J. Edwards Michael Flack Keith Flowers Paul F
39、orquer Marcel Fortin Dale Fredrickson Frank Gerleve David Gilmer Paul Gingrich Mietek Glinkowski S. Gohil Edwin Goodwin James Graham Randall Groves Ajit Gwal Paul Hamer Thomas Hawkins Jeffrey Helzer Dan Hrncir Richard Jackson Harry Josten Arthur Jur Laszlo Kadar Chad Kennedy Joseph L. Koepfinger Jim
40、 Kulchisky Chung-Yiu Lam Frank Mayle John Mcalhaney Jr. William McBride John McClelland Darryl Moser Randolph Mullikin Jerry Murphy Arthur Neubauer Michael Newman T. W. Olsen Shawn Patterson Edward Peters Christopher Petrola Iulian Profir Larry Putman Michael Roberts Timothy Robirds Thomas Rozek Bar
41、tien Sayogo Robert Seitz Nikunj Shah Devki Sharma James Smith Jeremy Smith Jerry Smith Paul Sullivan C. Tailor David Tepen Dennis Thonsgard Wayne Timm Marcelo Valdes John Vergis Kenneth White Matthew Williford Dean Yager Larry Yonce Jian Yu Matthew Zeedyk Copyright 2016 IEEE. All rights reserved. 6
42、When the IEEE-SA Standards Board approved this standard on 5 December 2015, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis
43、Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Phillip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus Copyright 2016 IEEE.
44、All rights reserved. 7 Introduction This introduction is not part of IEEE Std C37.23-2015, IEEE Standard for Metal-Enclosed Bus. This standard has been revised to reflect needed technical changes that have been suggested since the last revision of IEEE Std C37.23 in 2003. The major revision is the a
45、ddition of cable bus (bus with flexible conductors), which had been removed in the 2003 edition. Other significant changes are as follows: Revision of text throughout for greater harmony with related standards, including IEEE Std C37.20.1 B14, IEEE Std C37.20.2, and IEEE Std C37.20.3 B15.1,2 Refinem
46、ent of information in the application section. Revision of the ratings tables for inclusion of extended ratings. Short-circuit ratings for ME bus assemblies rated 1058 V have been introduced in this revision and the short-time test has also been revised to align and harmonize with ratings and test r
47、equirements of IEEE Std C37.20.1. However, this revision is not intended to imply or require that any additional tests of existing ME bus assemblies qualified to the previous edition of this standard are necessary. It is also noted that the historic altitude correction factors listed in Table C.2 of
48、 this standard have been retained. This standard includes only the requirements for ME bus. These requirements were previously a part of IEEE Std C37.20-1969, IEEE Standard for Switchgear Assemblies Including Metal-Enclosed Bus (1974, consolidated edition). Other types of equipment previously includ
49、ed in IEEE Std C37.20-1969 are incorporated in separate publications. IEEE Std C37.20-1969 had for many years covered all switchgear assemblies, including ME bus. Standards committees of the IEEE Switchgear Assemblies Subcommittee and the NEMA Power Switchgear Assemblies Technical Committee recommended that the standard be further developed and, where appropriate, that the various sections be identified with their own standards. This approach also coordinates with the conformance test procedure standards. The IEEE Switchgear Assemblies Subcommittee was re
