IEEE C37 42-2016 en Specifications for High-Voltage ( 1000 V) Fuses and Accessories.pdf

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1、IEEE Standard Specifications for High- Voltage (1000 V) Fuses and Accessories IEEE Std C37.42-2016 IEEE Power and Energy Society Sponsored by the Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USAIEEE Std C37.42-2016 IEEE Standard Specifications for High-Voltage (1000 V) Fuses and A

2、ccessories Sponsor Switchgear Committee of the IEEE Power and Energy Society Approved 22 September 2016 IEEE-SA Standards BoardAbstract: Specifications for high voltage (above 1000 V) Class A and Class B expulsion and cur- rent-limiting fuses are detailed in this standard. They include: expulsion ty

3、pe Class A distribution class fuses, fuse cutouts, fuse disconnecting switches, their associated fuse links or refill units, disconnecting cutouts, and accessories for these devices with rated voltages from 1 kV through 38 kV; expulsion type Class B power class fuses, fuse disconnecting switches, th

4、eir associated fuse links or refill units, disconnecting cutouts, and accessories for these devices with rated voltag- es from 1 kV through 170 kV; class A and class B current-limiting fuses and accessories for these devices with rated voltages 1 through 38 kV; distribution and power class expulsion

5、, current-limit- ing, and combination-type external capacitor fuses and accessories, with rated voltages from 1 kV through 38 kV, for protecting shunt capacitors complying with IEEE Std 18 and NEMA CP 1; any of the above devices used in fuse enclosure packages; all of these devices are intended for

6、use on alternating current distribution systems. Keywords: Class A fuses, Class B fuses, current-limiting fuses, distribution and power class current-limiting fuses, distribution class fuses, distribution fuse cutouts, expulsion fuses, fuse, fuse applications, fuse disconnecting switches, fuse enclo

7、sure packages, fuses for the protection of shunt capacitors, fuse hooks, fuse links, high-voltage fuses, IEEE C37.42, power class fuses, supports and mountings, tongs The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2017 by The Institu

8、te of Electrical and Electronics Engineers, Inc. All rights reserved. Published 26 May 2017. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness

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31、s standards development process, visit the IEEE-SA Website at http:/ standards .ieee .or g. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/ standards .ieee .org/ findstds/ errata/ index .html. Users are encouraged to check this URL fo

32、r errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in c

33、onnection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE- SA Website at http:/ standards .ieee .or g/ about/ sasb/ patcom/ patents .html. Letters of Assurance may indicate whether the

34、Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrim- ination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for

35、 which a Letter of Assurance has not been received. The IEEE is not re- sponsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provide

36、d in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the valid- ity of any patent rights, and the risk of infringement of such rights, is entirely thei

37、r own responsibility. Further information may be obtained from the IEEE Standards Association.6 Copyright 2017 IEEE. All rights reserved. Participants At the time this standard was completed, the Revision of Fuse Specifications Standards Working Group had the following membership: Mark W . Stavnes,

38、Chair Alan Y erges, Vice Chair Chris Ambrose Glenn R. Borchardt Sam Chang Sterlin Cochran Jonathan H. Deverick Rodolfo Elizondo David L. Frisch Gary W. Haynes Frank C. Lambert John G. Leach Chris Lettow Bradley B. Lewis James R. Marek Sean W . Moody R. Neville Parry Timothy E. Royster Jon Spencer To

39、m Stefanski William Walter James Wenzel Charles Worthington The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Chris Ambrose Paul Barnhart Craig Befus Robert Behl Jean-Marc Biasse Glenn R. Borchardt C

40、hristopher Borck Clarence Bradley Gustavo Brunello William Byrd Paul Cardinal Gary Donner Edgar Dullni Rodolfo Elizondo Marcel Fortin David L. Frisch Mietek Glinkowski Edwin Goodwin Randall Groves John Harley Gary W. Haynes Richard Jackson John Kay Yuri Khersonsky Boris Kogan Jim Kulchisky Saumen Ku

41、ndu Frank C. Lambert John G. Leach Bradley B. Lewis William McBride Sean W . Moody Daniel Mulkey Michael Newman T. W . Olsen Lorraine Padden Iulian Profir Michael Roberts Timothy Robirds Charles Rogers Timothy E. Royster Thomas Rozek Bartien Sayogo Nikunj Shah Jerry Smith Jon Spencer Tom Stefanski J

42、ames Van De Ligt John Vergis William Walter John Wang James Wenzel Kenneth White Terry Woodyard Charles Worthington Alan Yerges When the IEEE-SA Standards Board approved this standard on September 22, it had the following membership: Jean-Philippe Faure, Chair Ted Burse, Vice-chair John D. Kulick, P

43、ast Chair Konstantinos Karachalios, Secretary Chuck Adams Masayuki Ariyoshi Stephen Dukes Jianbin Fan J. Travis Griffith Gary Hoffman Ronald W. Hotchkiss Michael Janezic Joseph L. Koepfinger* Hung Ling Kevin Lu Annette D. Reilly Gary Robinson Mehmet Ulema Yingli Wen Howard Wolfman Don Wright Yu Yuan Daidi Zhong *Member Emeritus

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