IEEE C95 3 1-2010 en Recommended Practice for Measurements and Computations of Electric Magnetic and Electromagnetic Fields with Respect to Human Exposure to Su.pdf

上传人:figureissue185 文档编号:1249313 上传时间:2019-09-02 格式:PDF 页数:100 大小:1.98MB
下载 相关 举报
IEEE C95 3 1-2010 en Recommended Practice for Measurements and Computations of Electric Magnetic and Electromagnetic Fields with Respect to Human Exposure to Su.pdf_第1页
第1页 / 共100页
IEEE C95 3 1-2010 en Recommended Practice for Measurements and Computations of Electric Magnetic and Electromagnetic Fields with Respect to Human Exposure to Su.pdf_第2页
第2页 / 共100页
IEEE C95 3 1-2010 en Recommended Practice for Measurements and Computations of Electric Magnetic and Electromagnetic Fields with Respect to Human Exposure to Su.pdf_第3页
第3页 / 共100页
IEEE C95 3 1-2010 en Recommended Practice for Measurements and Computations of Electric Magnetic and Electromagnetic Fields with Respect to Human Exposure to Su.pdf_第4页
第4页 / 共100页
IEEE C95 3 1-2010 en Recommended Practice for Measurements and Computations of Electric Magnetic and Electromagnetic Fields with Respect to Human Exposure to Su.pdf_第5页
第5页 / 共100页
点击查看更多>>
资源描述

1、g44g40g40g40g3g54g87g71g3g38g28g24g17g22g17g20g140g16g21g19g20g19g3g44g40g40g40g3g53g72g70g82g80g80g72g81g71g72g71g3g51g85g68g70g87g76g70g72g3g73g82g85g3g48g72g68g86g88g85g72g80g72g81g87g86g3g68g81g71g3g38g82g80g83g88g87g68g87g76g82g81g86g3g82g73g3g40g79g72g70g87g85g76g70,g3g48g68g74g81g72g87g76g70,

2、g3g68g81g71g3g40g79g72g70g87g85g82g80g68g74g81g72g87g76g70g3g41g76g72g79g71g86g3g90g76g87g75g3g53g72g86g83g72g70g87g3g87g82g3g43g88g80g68g81g3g40g91g83g82g86g88g85g72g3g87g82g3g54g88g70g75g3g41g76g72g79g71g86g15g3g19g3g43g93g3g87g82g3g20g19g19g3g78g43g93g44g40g40g40g3g54g87g68g81g71g68g85g71g86g3g38

3、g82g82g85g71g76g81g68g87g76g81g74g3g38g82g80g80g76g87g87g72g72g3g22g28g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g44g40g40g40g3g44g81g87g72g85g81g68g87g76g82g81g68g79g3g38g82g80g80g76g87g87g72g72g3g82g81g3g40g79g72g70g87g85g82g80g68g74g81g72g87g76g70g3g54g68g73g72g87g92g44g40g40g40g22g3g51g68g85g

4、78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g20g23g3g48g68g92g3g21g19g20g19g38g28g24g17g22g17g20g55g48IEEE Std C95.3.1-2010 IEEE Recommended Practice for Measurements and Computations of Electric, Magnetic, and Electromagnetic Fields wi

5、th Respect to Human Exposure to Such Fields, 0 Hz to 100 kHz Sponsor IEEE International Committee on Electromagnetic Safety Approved 25 March 2010 IEEE-SA Standards Board Abstract: Techniques and instrumentation for the measurement and computation of electric, magnetic, and electromagnetic (EM) fiel

6、ds in the near field of an EM field source are presented in this recommended practice. Descriptions of the concepts, techniques, and instruments that can be applied to the measurement of the electric and magnetic fields and the currents induced in the human body by these fields are provided. Techniq

7、ues for determining the current density and the electric field strength within the human body are discussed. This recommended practice is intended primarily for use by engineers, biophysicists, and other specialists who are familiar with basic EM field theory and practice, and the potential hazards

8、associated with EM fields. It will be most useful to bioeffects researchers, instrumentation developers and manufacturers, those developing calibration systems and standards, and persons involved in critical hazard assessments or hazard surveys. Keywords: contact current measurement, electric field

9、computation, electric field measurement, electromagnetic field computation, electromagnetic field measurement, ELF/VLF/RF survey instruments, exposure assessment, induced current measurement, magnetic field computation, magnetic field measurement, nonionizing radiation, RF/ELF/VLF hazard assessment

10、The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2010 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 14 May 2010. Printed in the United States of America. IEEE is a registered trademark in

11、 the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std C95.3.1-2010, IEEE Recommended Practice for Measurements and

12、 Computations of Electric, Magnetic, and Electromagnetic Fields with Respect to Human Exposure to Such Fields, 0 Hz to 100 kHz. In 1960, the American Standards Association approved the initiation of the Radiation Hazards Standards project under the co-sponsorship of the Department of the Navy and th

13、e Institute of Electrical and Electronics Engineers, Inc. (IEEE). Prior to 1988, C95 standards were developed by Accredited Standards Committee C95, and submitted to the American National Standards Institute (ANSI) for approval and issuance as ANSI C95 standards. Between 1988 and 1990, the committee

14、 was converted to Standards Coordinating Committee 28 (SCC 28) under the sponsorship of the IEEE Standards Board. In 2001, the IEEE Standards Association Standards Board approved the name “International Committee on Electromagnetic Safety (ICES)” for SCC 28 to better reflect the scope of the committ

15、ee and its international membership. In accordance with policies of the IEEE, C95 standards are issued and developed as IEEE standards, as well as submitted to ANSI for recognition. In 2005, SCC 28 and SCC 34 became Technical Committees 95 and 34, respectively, under a new IEEE Standards Coordinatin

16、g Committee (SCC), SCC 39, which is now called ICES.aThe present scope of IEEE ICES is as follows: “Development of standards for the safe use of electromagnetic energy in the range of 0 Hz to 300 GHz relative to the potential hazards of exposure of man, volatile materials, and explosive devices to s

17、uch energy. It is not intended to include infrared, visible, ultraviolet, or ionizing radiation. The committee will coordinate with other committees whose scopes are contiguous with ICES.” There are five TC95 subcommittees, each of whose area of responsibility is described as follows in corresponden

18、ce with its designated subcommittee number: I Techniques, Procedures, Instrumentation and Computation II Terminology, Units of Measurements and Hazard Communication III Safety Levels with Respect to Human Exposure, 0 Hz3 kHz IV Safety Levels with Respect to Human Exposure, 3 kHz300 GHz V Safety Leve

19、ls with Respect to Electro-Explosive Devices Subcommittee I of ICES Technical Committee 95 (TC95) is responsible for this recommended practice. Three standards, four recommended practices, and one guide have been issued. Present versions are as follows: IEEE Std C95.1-2005 B55b IEEE Std C95.2-1999 B

20、56 IEEE Std C95.3-2002c IEEE Std C95.3.1-2010 IEEE Std C95.4-2002 B57 IEEE Std C95.6-2002 B58 IEEE Std C95.7-2005 B59 IEEE Std 1460-1996 B54 aStandards Coordinating Committees are established by the IEEE-SA Standards Board, and provide a mechanism to oversee the development of standards that are bey

21、ond the scopes of individual technical committees within IEEEs societies. bThe numbers in brackets correspond to those of the bibliography in Annex D. cInformation on references can be found in Clause 2. iv Copyright 2010 IEEE. All rights reserved. Notice to users Laws and regulations Users of these

22、 documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE

23、does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. The

24、se include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights

25、in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE documen

26、t at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata,

27、visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.

28、org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following

29、 URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matter covered by patent rights. By publication of this recommended practice, no position is taken with respect t

30、o the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or

31、 conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly advised that determination of the validity of any patent rights, and the risk of infringement of

32、such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this recommended practice was submitted to the IEEE-SA Standar

33、ds Board for approval, the Techniques, Procedures, Instrumentation, and Computation Working Group had the following membership: Howard Bassen, Chair Wolfgang Kainz, Secretary Joseph Bowman Ian Brooker Jon Casamento Isaac Chang Ji Chen Chung-Kwang Chou Jules Cohen Robert Curtis John DeFrank Thanh Dov

34、an Arthur Guy Ed Hare Tim Harrington James Hatfield Roy Hubbard Veronica Ivans Edwin Mantiply Robert Needy John Osepchuk Ronald C. Petersen Brad Roberts Kazimierz Siwiak Richard Tell Paul Testagrossa Donald Umbdenstock Arthur Varanelli So-ichi Watanabe George Wimmer Richard Woods Ping Zhou Peter Zol

35、lman The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. William Bailey David Baron Howard Bassen Ralf Bodemann Joseph Bowman Ian Brooker Chung-Kwang Chou Keith Chow Brian Cramer John DeFra

36、nk David A. Dini Carlo Donati Randall Dotson Thanh Dovan George Filippopoulos Josette Gallant Kenneth Gettman Jalal Gohari Randall Groves Donald Haes James Hatfield Werner Hoelzl Masateru Ikehata Kenneth Joyner Efthymios Karabetsos Bertram Klauenberg Joseph L. Koepfinger Jim Kulchisky Sakari Lang Wi

37、lliam Lumpkins G. Luri Robert Needy Michael S. Newman John Osepchuk Ronald C. Petersen Ulrich Pohl Percy Pool Brad Roberts Michael Roberts Ervin Root Bartien Sayogo Asher Sheppard Gil Shultz James E. Smith Walter Struppler Paul Testagrossa Arthur Varanelli Robert Weller Jian Yu Donald Zipse Marvin Z

38、iskin When the IEEE-SA Standards Board approved this recommended practice on 25 March 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexan

39、der Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Boa

40、rd liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Development vii Copyright 2010. IEEE. All right

41、s reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Application 2 1.4 Frequency range 3 1.5 Quantities and exposure metrics to be evaluated. 3 1.6 Types of situations covered . 4 2. Normative references 4 3. Definitions 4 3.1 Special terms 12 4. Basic issues in measuring electric and

42、magnetic fields for use in exposure assessments (0 Hz to 100 kHz). 12 4.1 Introduction . 12 4.2 Considerations for exposure assessments of electric and magnetic fields . 12 4.3 Screening methods. 20 5. Instrumentation. 21 5.1 Introduction . 21 5.2 Magnetic field meters 21 5.3 Electric field sensing

43、. 25 5.4 Induced current meters 27 5.5 Contact current meters. 29 5.6 Instrument measurement uncertainty. 30 6. Measurement of electric and magnetic fields (0 Hz to 100 kHz) for use in exposure assessments 31 6.1 Introduction . 31 6.2 Preliminary considerations 31 6.3 Measurement checklists. 33 6.4

44、Determination of type of instruments required 34 6.5 Safety precautions 39 6.6 Measurement procedures for electric and magnetic fields. 40 6.7 Measurements of induced body current. 43 7. Theoretical calculations of induced currents (0 Hz to 100 kHz) 45 7.1 General considerations for calculations of

45、low-frequency internal fields 45 7.2 FDTD frequency-scaling method 46 7.3 Impedance method. 46 7.4 Finite element method . 47 7.5 EMF source modeling for magnetic fields. 52 7.6 EMF source modeling for electric fields . 53 7.7 Anatomical models 53 7.8 Averaging the induced current density 54 7.9 Ben

46、chmark validation calculations 54 viii Copyright 2010 IEEE. All rights reserved. ix Copyright 2010 IEEE. All rights reserved. Annex A (informative) Guide for the measurement of quasi-static magnetic and electric fields. 56 Annex B (informative) FDTD requirements for low-frequency calculations. 72 An

47、nex C (informative) Measurement uncertainty and conformity decisionsan example. 79 Annex D (informative) Bibliography . 82 IEEE Recommended Practice for Measurements and Computations of Electric, Magnetic, and Electromagnetic Fields with Respect to Human Exposure to Such Fields, 0 Hz to 100 kHz IMPO

48、RTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available

49、 for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This recommended practice describes 1) methods for measuring external electric and magnetic fields and contact currents to which persons may be expos

展开阅读全文
相关资源
  • IEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdfIEC TS 62492-1-2008 Industrial process control devices - Radiation thermometers - Part 1 Technical data for radiation thermometers《工业过程控制装置 辐射温度计 第1部分 辐射温度计的技术数.pdf
  • IEC TR2 61464-1998 Insulated bushings - Guide for the interpretation of dissolved gas analysis (DGA) in bushings where oil is the impregnating medium of the mai.pdfIEC TR2 61464-1998 Insulated bushings - Guide for the interpretation of dissolved gas analysis (DGA) in bushings where oil is the impregnating medium of the mai.pdf
  • IEC TR 61241-2-2-1993 Electrical apparatus for use in the presence of combustible dust part 2 test methods section 2 method for determining the electrical resis.pdfIEC TR 61241-2-2-1993 Electrical apparatus for use in the presence of combustible dust part 2 test methods section 2 method for determining the electrical resis.pdf
  • IEC TR 60972-1989 Classification and interpretation of new lighting products《新型照明产品的分类和说明》.pdfIEC TR 60972-1989 Classification and interpretation of new lighting products《新型照明产品的分类和说明》.pdf
  • IEC TR 60943 Edition 21-2009 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals《特殊终端中电气设备部件用关于允许.pdfIEC TR 60943 Edition 21-2009 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals《特殊终端中电气设备部件用关于允许.pdf
  • IEC TR 60943 AMD 1-2008 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals Amendment 1《电气设备部件(特别.pdfIEC TR 60943 AMD 1-2008 Guidance concerning the permissible temperature rise for parts of electrical equipment in particular for terminals Amendment 1《电气设备部件(特别.pdf
  • IEC TR 60919-2-2008 Performance of high-voltage direct current (HVDC) systems with line-communicated converters - Part 2 Faults and switching《带线性通信转换器的高压直流(HVDC.pdfIEC TR 60919-2-2008 Performance of high-voltage direct current (HVDC) systems with line-communicated converters - Part 2 Faults and switching《带线性通信转换器的高压直流(HVDC.pdf
  • IEC TR 60870-6-505 Edition 11-2006 Telecontrol equipment and systems - Part.6-505 Telecontrol protocols compatible with ISO standards and ITU-T recommendations .pdfIEC TR 60870-6-505 Edition 11-2006 Telecontrol equipment and systems - Part.6-505 Telecontrol protocols compatible with ISO standards and ITU-T recommendations .pdf
  • IEC TR 60344 CORR1-2012 Calculation of d c resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide Corrigendum 1《.pdfIEC TR 60344 CORR1-2012 Calculation of d c resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide Corrigendum 1《.pdf
  • IEC 62560 CORR1-2012 Self-ballasted LED-lamps for general lighting services by voltage 50 V - Safety specifications Corrigendum 1《普通照明用50 V以上自镇流LED灯 安全要求 勘误表1》.pdfIEC 62560 CORR1-2012 Self-ballasted LED-lamps for general lighting services by voltage 50 V - Safety specifications Corrigendum 1《普通照明用50 V以上自镇流LED灯 安全要求 勘误表1》.pdf
  • 猜你喜欢
  • SAE AS 81822 6A-2011 Wire Electrical Solderless Wrap Extruded Polytetrafluoroethylene (PTFE) Insulation Silver Coated Solid Conductor《挤压四氟乙烯(ETFE)无焊包装绝缘层和银涂层导线组成的电线》.pdf SAE AS 81822 6A-2011 Wire Electrical Solderless Wrap Extruded Polytetrafluoroethylene (PTFE) Insulation Silver Coated Solid Conductor《挤压四氟乙烯(ETFE)无焊包装绝缘层和银涂层导线组成的电线》.pdf
  • SAE AS 81822 7A-2011 Wire Electrical Solderless Wrap Polyimide Jacket Over Extruded Polyvinyl Chloride (PVE) Insulation Tin Coated Solid Conductor《锡涂层固体导体带聚酰亚胺绝缘护套的挤压聚氯乙烯(PVE)绝缘无焊包.pdf SAE AS 81822 7A-2011 Wire Electrical Solderless Wrap Polyimide Jacket Over Extruded Polyvinyl Chloride (PVE) Insulation Tin Coated Solid Conductor《锡涂层固体导体带聚酰亚胺绝缘护套的挤压聚氯乙烯(PVE)绝缘无焊包.pdf
  • SAE AS 81822 8A-2011 Wire Electrical Solderless Wrap Polyimide Jacket Over Extruded Fluorinated Ethylene Propylene (FEP) Insulation Silver Coated Solid Conductor《镀银实心导体聚酰亚胺护套氟化乙烯丙烯.pdf SAE AS 81822 8A-2011 Wire Electrical Solderless Wrap Polyimide Jacket Over Extruded Fluorinated Ethylene Propylene (FEP) Insulation Silver Coated Solid Conductor《镀银实心导体聚酰亚胺护套氟化乙烯丙烯.pdf
  • SAE AS 81822A-2011 Wire Electrical Solderless Wrap Insulated and Uninsulated General Specification for《绝缘和非绝缘无焊包装电线的一般规格说明》.pdf SAE AS 81822A-2011 Wire Electrical Solderless Wrap Insulated and Uninsulated General Specification for《绝缘和非绝缘无焊包装电线的一般规格说明》.pdf
  • SAE AS 81824 10-2012 SPLICE IN-LINE ELECTRIC CRIMP NI CU ENVIRONMENTAL HEAT-SHRINKABLE SLEEVE (175  3 X 3 SEALANT OPENING《3 X 3密封剂开口热缩管(175℃)NI CU环境电气卷曲同轴连接》.pdf SAE AS 81824 10-2012 SPLICE IN-LINE ELECTRIC CRIMP NI CU ENVIRONMENTAL HEAT-SHRINKABLE SLEEVE (175 3 X 3 SEALANT OPENING《3 X 3密封剂开口热缩管(175℃)NI CU环境电气卷曲同轴连接》.pdf
  • SAE AS 81824 11-2011 SPLICE ELECTRIC PERMANENT CRIMP STYLE NI CU INSULATED ENVIRONMENT RESISTANT CLASS 1 200 MAX 1X1 SEALANT OPENING《最高能够承受200 ℃的1X1密封剂开口用I级耐环境的绝缘镍铜压接永久型电气接.pdf SAE AS 81824 11-2011 SPLICE ELECTRIC PERMANENT CRIMP STYLE NI CU INSULATED ENVIRONMENT RESISTANT CLASS 1 200 MAX 1X1 SEALANT OPENING《最高能够承受200 ℃的1X1密封剂开口用I级耐环境的绝缘镍铜压接永久型电气接.pdf
  • SAE AS 81824 12A-2016 SPLICE ELECTRIC PERMANENT CRIMP STYLE TIN-COATED COPPER INSULATED ENVIRONMENT RESISTANT CLASS 1 150 C HEATLESS SEALING.pdf SAE AS 81824 12A-2016 SPLICE ELECTRIC PERMANENT CRIMP STYLE TIN-COATED COPPER INSULATED ENVIRONMENT RESISTANT CLASS 1 150 C HEATLESS SEALING.pdf
  • SAE AS 81824 13-2012 SPLICE STUB ELECTRIC PERMANENT CRIMP STYLE NICKEL COPPER INSULATED ENVIRONMENT RESISTANT 175 MAX《最高175℃ 环境耐受性 绝缘 镍 铜 卷曲式 永久 电气接合》.pdf SAE AS 81824 13-2012 SPLICE STUB ELECTRIC PERMANENT CRIMP STYLE NICKEL COPPER INSULATED ENVIRONMENT RESISTANT 175 MAX《最高175℃ 环境耐受性 绝缘 镍 铜 卷曲式 永久 电气接合》.pdf
  • SAE AS 81824 14B-2016 SPLICE ELECTRIC PERMANENT CRIMP STYLE NICKEL-COATED COPPER INSULATED ENVIRONMENT RESISTANT CLASS 1 175 HEATLESS SEALING.pdf SAE AS 81824 14B-2016 SPLICE ELECTRIC PERMANENT CRIMP STYLE NICKEL-COATED COPPER INSULATED ENVIRONMENT RESISTANT CLASS 1 175 HEATLESS SEALING.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > IEC

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1