1、ANSI/IES LM-80-15Approved Method: MeasuringLuminous Flux and Color Maintenanceof LED Packages, Arrays and ModulesANSI/IES LM-80-15IES Approved Method: MeasuringLuminous Flux and Color Maintenanceof LED Packages, Arrays and ModulesPublication of this Committee reporthas been approved by IES.Suggestio
2、ns for revisionsshould be directed to IESPrepared by:The Solid-State Lighting Subcommittee of the IES Testing Procedures CommitteeANSI/IES LM-80-15Copyright 2015 by the Illuminating Engineering Society of North AmericaApproved by the IES Board of Directors, June 26, 2015 as a Transaction of the Illu
3、minating Engineering Society of North America.All rights reserved. No part of this publication may be reproduced in any form, in any electronic retrieval system or otherwise, without prior written permission of the IES.Published by the Illuminating Engineering Society of North America, 120 Wall Stre
4、et, New York, New York 10005.IES Standards and Guides are developed through committee consensus and produced by the IES Office in New York. Careful attention is given to style and accuracy. If any errors are noted in this document, please forward them to the Director of Technology, at the above addr
5、ess for verification and correction. The IES welcomes and urges feedback and comments.ISBN # 978-0-87995-315-7Printed in the United States of America.DISCLAIMERIES publications are developed through the consensus standards development process approved by the American National Standards Institute. Th
6、is process brings together volunteers representing varied viewpoints and interests to achieve consensus on lighting recommendations. While the IES administers the process and establishes policies and procedures to promote fairness in the development of consensus, it makes no guaranty or warranty as
7、to the accuracy or completeness of any information published herein. The IES disclaims liability for any injury to persons or property or other damages of any nature whatsoever, whether special, indirect, consequential or compensatory, directly or indirectly resulting from the publication, use of, o
8、r reliance on this documentIn issuing and making this document available, the IES is not undertaking to render professional or other services for or on behalf of any person or entity. Nor is the IES undertaking to perform any duty owed by any person or entity to someone else. Anyone using this docum
9、ent should rely on his or her own independent judgment or, as appropriate, seek the advice of a competent professional in determining the exercise of reasonable care in any given circumstances.The IES has no power, nor does it undertake, to police or enforce compliance with the contents of this docu
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11、aker of the statement.ANSI/IES LM-80-15Prepared by the Solid-State Lighting Subcommittee of theIES Testing Procedures CommitteeLM-80 Working GroupJeff Hulett, Technical CoordinatorSolid-State Lighting SubcommitteeEmil Radkov, Sub-ChairJ. ChoiJ. DakinR. DaubauchP. ElizondoK. HaraguchiM. HodappJ. Jiao
12、R. LeeD. NealA. NishidaY. OhnoE. RadkovR. TuttleY. ZongC. Andersen*A. BakerP. Behnke*R. BergerR. BergmanB. Besmanoff*C. Bloomfield*E. BretschneiderK. Broughton*J. Burns*D. Chan*J. Choi*P.-T. Chou*A. Chowdhury*G. Connelly*K. Cook*J. Creveling*J. Dakin*R. Daubach*L. Davis*M. Duffy*D. Eckel*P. Elizondo
13、*S. Ellersick*D. EllisC. Fox*J. Gaines*C. Galberth*A. Gelder*M. GratherY. Guan*K. HaraguchiT. Hernandez*J. Hickman*Y. Hiebert*M. Hodapp*J. HospodarskyB. Hou*J. HulettP.-C.Hung*A. JacksonD. JenkinsA. Jeon*B. Jeong*J. JiaoJ. Kahn*D. KarambelasT. Kawabata*S. Keeney*T. Y. Koo*M. KotrebaiB. KueblerJ. H.
14、Lee*R. LeeS. Lee*M. Lehman*J. Leland*K. Liepmann*S. LongoM.-H. Lu*R. Ma*V. Mahajan*J. MarellaP. McCarthyM. McClear*G. McKeeJ. Melman*D. Miletich*Z. Mooney*M. Nadal*D. Nava*D. Neal*B. Neale*A. Nishida*M. OBoyle*D. OHare*Y. Ohno*M. ORegan*M. Pabst*D. Park*M. Piscitelli*M. Poplawski*B. Primerano*M. Raf
15、fetto*B. Rao*I. Rasputnis*E. RichmanK. Rong*E. Sahaja*M. SapcoeJ. SchutzK. ScottG. SteinbergH. Steward*D. Szombatfalvy*R. TuttleT. Uchida*Y. Wang*Y. Wang*D. Weiss*B. Willcock*V. Wu*We. Xu*S. Yamauchi*J. Yon*R. Young*W. Young*G. Yu*J. ZhangY. Zong* Advisory Member* Honorary MemberANSI/IES LM-80-15IES
16、 Testing Procedures CommitteeCameron Miller, ChairBecky Kuebler, Vice ChairDavid Ellis, SecretaryJianzhong Jiao, TreasurerC. AndersenL. Ayers*A. BakerP. Behnke*R. BergerR. Bergin*R. BergmanJ. C. Blacker*C. Bloomfield*E. BretschneiderK. Broughton*E. Carter*D. Chan*P.-T. Chou*G. Connelly*J. Dakin*R. D
17、aubach*L. Davis*J. Demirjian*M. Duffy*P. Elizondo*D. Ellis*P. Franck*A. Gelder*M. GratherY. Guan*K. Haraguchi*R. Heinisch*K.Hemmi*T. Hernandez*Y. Hiebert*R. Higley*R.Horan*J. HospodarskyS. Hua*P.-C. HungD. Husby*A. JacksonD. Jenkins*D. Karambelas*H. Kashani*T. Kawabata*R. Kelley*T.Y. Koo*M. Kotrebai
18、J. Lawton*L. Leetzow*J. Leland*K. Lerbs*R. Levin*R. Li*K. Liepmann*S. LongoR. Low*M-H. Lu*J. MarellaP. McCarthyG. McKeeM. Minarczyk*Z. Mooney*F.-X. Morin*M. Nadal*D. Nava*B. Neale*D. OHare*Y. Ohno*J. Pan*D. Park*N. Peimanovic*E. Perkins*M. Piscitelli*G. Plank*E. RadkovD. RandolphC. Richards*E. Richm
19、an*K. Rong*M. SapcoeJ. SchutzA. Serres*A. SmithR. Speck*L. Stafford*G. SteinbergR. Tuttle*T. Uchida*K. WagnerJ. Walker*Y. Wang*H. Waugh*D. Weiss*J. Welch*K. Wilcox*B. Willcock*V. Wu*J. YonR. Young*J. Zhang* Advisory Member* Honorary MemberANSI/IES LM-80-15AMERICAN NATIONAL STANDARDApproval of an Ame
20、rican National Standard requires verification by ANSI that the requirements for due process, consensus, and other criteria have been met by the standards developer.Consensus is established when, in the judgment of the ANSI Board of Standards Review, substantial agreement has been reached by directly
21、 and materially affected interests. Substantial agreement means much more than a simple majority, but not necessarily unanimity. Consensus requires that all views and objections be considered, and that a concerted effort be made toward their resolution.The use of American National Standards is compl
22、etely voluntary; their existence does not in any respect preclude anyone, whether that person has approved the standards or not, from manufacturing, marketing, purchasing, or using products, processes, or procedures not conforming to the standards.The American National Standards Institute does not d
23、evelop standards and will in no circumstances give an interpretation to any American National Standard. Moreover, no person shall have the right or authority to issue and interpretation of an American National Standard in the name of the American National Standards Institute. Requests for interpreta
24、tions should be addressed to the secretariat or sponsor whose name appears on the title page of this standard.CAUTION NOTICE: This American National Standard may be revised at any time. The procedures of the American National Standards Institute require that action be taken to reaffirm, revise, or w
25、ithdraw this standard no later than five years from the date of approval. Purchasers of American National Standards may receive current information on all standards by calling or writing the American National Standards Institute.ANSI/IES LM-80-15ANSI/IES LM-80-15Please refer to the IES Bookstore aft
26、er you have purchased this IES Standard, for possible Errata, Addenda, and Clarifications, www.ies.org/bookstore.ContentsIntroduction.11.0 Scope .12.0 Normative References12.1 The IES Nomenclature Committee .12.2 ASTM Standard E230/E23M-112 .13.0 Definitions .13.1 Air Temperature (TA) .13.2 Case Tem
27、perature (Ts) .13.3 Centroid Wavelength (c).13.4 Device Under Test (DUT) .23.5 Dominant Wavelength (d) 23.6 Drive Level.23.7 DUT Failure 23.8 Luminous Flux Maintenance 23.9 Maintenance Test .23.10 Measurement Interval23.11 Peak Wavelength (p) 23.12 Photon Flux (p) 23.13 Photon Flux Maintenance 23.14
28、 Radiant Flux (e) 23.15 Radiant Flux Maintenance 24.0 Physical and Environmental Conditions.24.1 General24.2 Humidity.34.3 Air Temperature 34.4 Air Movement 34.5 Temperature Measurement Equipment or System 35.0 Electrical Conditions.35.1 DUT Drivers35.2 Drive Level Value .35.3 DC Constant Current Dr
29、ive .35.3.1 Circuit Arrangement.35.3.2 Current Regulation .35.4 Pulse Width Modulated (PWM) Current Drive 35.4.1 Circuit Arrangement.35.4.2 Current Regulation .35.5 DC Constant Voltage Drive .35.5.1 Circuit Arrangement.35.5.2 DC Voltage Regulation 45.6 AC Regulated Voltage Drive 45.6.1 Circuit Arran
30、gement.45.6.2 AC Voltage Regulation 4ANSI/IES LM-80-156.0 Photometric and Electrical Measurement Procedures .46.1 DUT Photometric and Electrical Measurements 46.2 DUT Measurement Temperature Condition 46.3 DUT Measurement Drive Level 47.0 Maintenance Test Procedures .47.1 Seasoning or Aging .47.2 DU
31、T Tracking.57.3 Timekeeping .57.4 DUT Case Temperatures .57.5 Maintenance Test Duration and Measurement Interval 57.6 Recording DUT Failures .58.0 Test Report .5Annex A DUT Sample Selection (Informative)7Annex B Monitoring of Case Temperatures (Normative) .71ANSI/IES LM-80-15INTRODUCTIONLEDs typical
32、ly exhibit very long operational life char-acteristics and, depending on drive current and use conditions, can be in use for 50000 hours or longer. The light output from LEDs slowly decreases over time. This characteristic of declining output without catastrophic failure creates a risk that an LED-b
33、ased lighting product near end-of-life may be operating, but performing outside the products specification, or out-side required codes, standard practices or regulations. LEDs may also undergo gradual shifts in the emitted spectra over time that may result in unacceptable appearance, color rendering
34、 or degraded efficacy.This document describes the procedures by which LEDs are tested for the luminous (or radiant, or pho-ton) flux maintenance and chromaticity maintenance or wavelength changes over time when operated under controlled environmental and operational con-ditions. The resulting measur
35、ements may be used for comparison of LEDs, and they may be utilized in models that project long-term changes in light output during the life of the LEDs.Summary of changes from the previously published IES LM-80-08 Approved Method: Measuring Lumen Maintenance of LED Light SourcesThe scope within thi
36、s ANSI/IES LM-80-15 has been expanded to include tests for three types of flux maintenance along with tests for how chromaticity changes over time. LED drive characteristics have been updated to include pulse width modulated cur-rent, DC constant voltage and AC regulated voltage drive. The maintenan
37、ce test duration and measure-ment interval are no longer specified but rather left for determination according to the intended usage of the data. The reporting section is more specific with regard to the required data. Requirements for thermal measurements have been clarified to reflect industry bes
38、t practices.1.0 SCOPEANSI/IES LM-80-15 provides the methods for mea-surement of luminous flux and color maintenance for LED packages, arrays, and modules.The document covers luminous, radiant, or photon flux mainte-nance and color maintenance including changes in chromaticity coordinates, peak wavel
39、ength, or cen-troid wavelength versus time.The maintenance char-acteristics are measured under controlled conditions that allow direct comparison of results obtained at different laboratories.ANSI/IES LM-80-15 does not provide guidance or make any recommendation regarding predictive estimations or e
40、xtrapolation for the maintenance characteristics beyond the time duration of the actual measurements.2.0 NORMATIVE REFERENCES2.1 The IES Nomenclature CommitteeANSI/IES RP-16-10, Nomenclature and Definitions for Illuminating Engineering. Illuminating Engineering Society of North America. New York, Ne
41、w York, 2010.2.2 ASTM Standard E230/E23M-112Standard Specification and Temperature-Electromotive Force (EMF) Tables for Standardized Thermocouples, ASTM International, West Conshohocken, PA, www.astm.org.3.0 DEFINITIONS3.1 Air Temperature (TA)The temperature of the air surrounding the DUT (Device Un
42、der Test) during the maintenance test.3.2 Case Temperature (Ts)The temperature measurement point for the DUT is defined by the DUT manufacturer. In some cases the temperature measurement point is defined as the solder point on the printed circuit board. In other instances this is defined as a specif
43、ic location on the DUT case. Thus Tsis sometimes designated as Tsp or Tcin manufacturers literature.3.3 Centroid Wavelength (c)Wavelength at the “center of gravity” of the spectrum shape of a monochromatic DUT is the weighted average of each wavelength defined bywhere is the wavelength; and S() is t
44、he spectral power distribution of the monochromatic DUT.2ANSI/IES LM-80-153.4 Device Under Test (DUT)An LED package, array or module which is undergo-ing the maintenance test.3.5 Dominant Wavelength (d)The dominant wavelength dis the wavelength of a monochromatic stimulus that, when additively mixed
45、 in suitable proportions with the specified achromatic stimulus, matches the color stimulus considered.3.6 Drive LevelThe nominal external voltage or current applied to a DUT during the maintenance test or a photometric or electrical measurement. Drive level is specified in amperes for DC constant c
46、urrent drive, volts for DC constant voltage drive, or RMS volts for AC regu-lated voltage.3.7 DUT FailureA DUT shall be declared a failure if it suffers dam-age due to mishandling or if its luminous flux, photon flux or radiant flux decreases by 90 percent, i.e., (10 percent of the initial flux valu
47、e) or more.3.8 Luminous Flux MaintenanceLuminous flux maintenance (often referred to as “lumen maintenance”) is the remaining luminous flux output (typically expressed as a percentage of the initial luminous flux output) at any selected elapsed operating time. Luminous flux maintenance (or “lumen ma
48、intenance”) is the converse of lumi-nous flux depreciation (or “lumen depreciation”).3.9 Maintenance TestMaintenance test is the continuing steady operation test for the DUT when it is energized under specific electrical and environmental conditions.3.10 Measurement IntervalThe measurement interval
49、is the elapsed time between two photometric and electrical measurements.3.11 Peak Wavelength (p)The peak wavelength p, is the wavelength at the maximum of the spectral distribution.3.12 Photon Flux (p)The photon flux emitted by a DUT in the wavelength interval from 1to 2is:where N is Avogadros number; h is Plancks con-stant; c is the speed of light and is () the spec-tral radiant flux, measured in W/nm. pis usually expressed in mol/s.3.13 Photon Flux MaintenancePhoton flux maintenance is the remaining photon flux output (expressed as a percentage of the initia
