1、Designation: B631 93 (Reapproved 2010)Standard Specification forSilver-Tungsten Electrical Contact Materials1This standard is issued under the fixed designation B631; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last
2、 revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This specification covers electrical contact componentsmade from silver-tungsten by powder-metallurgical proce-dures.1.2 T
3、his specification covers compositions within the silver-tungsten system normally specified by users of contacts.1.3 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to become familiarwith all ha
4、zards including those identified in the appropriateMaterial Data Safety Sheet (MSDS) for this product/materialas provided by the manufacturer, to establish appropriatesafety and health practices, and determine the applicability ofregulatory limitations prior to use.2. Referenced Documents2.1 ASTM St
5、andards:2B328 Test Method for Density, Oil Content, and Intercon-nected Porosity of Sintered Metal Structural Parts andOil-Impregnated Bearings33. Ordering Information3.1 Orders for this material under this specification shallinclude the following information:3.1.1 Dimensions (see Section 7).3.1.2 C
6、hemical composition (see reference tables in theAppendix X1 as a possible guide).3.1.3 Physical properties (see Section 6 andAppendix X1 asguideline).3.1.4 Certification (see Section 13).3.1.5 Other features as agreed upon between the purchaserand manufacturer.4. Chemical Composition4.1 The material
7、 shall conform to composition limits asagreed upon between the manufacturer and purchaser.4.2 The chemical analysis shall be made in accordance withthe methods prescribed in the newest edition of the AnnualBook of ASTM Standards, or by any other approved methodagreed upon between the manufacturer an
8、d purchaser.5. Other Requirements5.1 The manufacturer and purchaser shall agree on qualifi-cation tests for determination of physical properties.5.2 The tests shall be performed on production parts,wherever practical or applicable (small size contacts do notlend themselves to accurate conductivity m
9、easurement).5.3 The tests shall be determined after consideration of thefunction of the part.5.4 The typical properties of the four most common types ofsilver-tungsten contacts are given in the appendix.6. Finishing of Contacts6.1 The material shall be finished by such operations asnecessary to meet
10、 requirements agreed upon by the maker anduser of the contacts (braze alloy backing, tumbling to polishsurfaces, special surface finish, silver-rich surface layer, clean-ing, etc.).7. Permissible Variations in Dimensions7.1 Permissible variations in dimensions shall be within thelimits specified on
11、drawings describing the contacts andaccompanying the order, or shall be within the limits specifiedin the purchase order.8. Workmanship8.1 The parts shall be free of defects in material or process-ing that would seriously affect their performance.9. Significance and Use9.1 Proprietary methods for ma
12、nufacture of these materialsvary significantly among suppliers, and these methods influ-ence such properties as arc erosion, contact resistance, andtendency to weld in service. Since the performance of contactsin a device depends on numerous factors outside the contactitself (opening speed, closing
13、speed, contact pressure, contactbounce, environmental variations, assembly technique and1This specification is under the jurisdiction of ASTM Committee B02 onNonferrous Metals and Alloys and is the direct responsibility of SubcommitteeB02.05 on Precious Metals and Electrical Contact Materials.Curren
14、t edition approved Oct. 1, 2010. Published October 2010. Originallyapproved in 1977. Last previous edition approved in 2004 as B631 93 (2004).DOI: 10.1520/B0631-93R10.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual
15、Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Withdrawn. The last approved version of this historical standard is referencedon www.astm.org.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959
16、, United States.variations, etc.) this specification cannot ensure performancecontrol in the application. As part of the qualification on initialsamples it is recommended that the user functionally electri-cally test the materials for all devices applicable to thematerials use. This specification wi
17、ll provide a means for thecontact manufacturer and contact user to reach agreement onthe details of material to be supplied for a specific use andreasonable assurance that future lots will be similar in proper-ties and microstructure to the initial test or sample contactssupplied.10. Sampling10.1 Lo
18、tUnless otherwise specified, a lot shall consist ofparts of the same form and dimensions, made of powders of thesame particle size range and composition, processed under thesame conditions, and submitted for inspection at one time.10.2 Chemical AnalysisAt least one sample for chemicalanalysis shall
19、be taken from each lot. A representative sampleof chips may be obtained by milling, drilling, or crushing atleast two pieces with dry tools, without lubrication. In order toobtain oil-free chips, the parts selected for test shall have theoil extracted in accordance with Test Method B328.10.2.1 These
20、 specification limits do not preclude the pos-sible presence of other unnamed elements, impurities oradditives. Analysis shall be regularly made only for the minorelements listed in the table. However, if a user knows ofelements that might be detrimental to their application or hasother reasons for
21、requiring analysis for specific elements, thenagreement between manufacturer and purchaser for both limitsand methods of analysis should be required for elements notspecified.10.3 Physical TestsThe manufacturer and purchaser shallagree on a representative number of specimens for physicaltests includ
22、ing microstructure.11. Inspection11.1 Unless otherwise specified, inspection of parts suppliedon contract shall be made by the purchaser.12. Rejection12.1 Unless otherwise specified, rejections based on testsmade in accordance with the specification shall be reported tothe manufacturer within 30 day
23、s of the receipt of shipment.13. Certification13.1 A certification, when requested by the purchaser, basedon the manufacturers quality control, that the material con-forms to the requirements of this specification, shall befurnished upon request of the purchaser, provided the request ismade at the t
24、ime of cost quotation and at the time of orderplacement.14. Keywords14.1 contacts; powder metallurgy; silver; silver-tungsten;tungsten; tungsten-silverAPPENDIX(Nonmandatory Information)X1. Typical Property ValuesX1.1 ScopeX1.1.1 The following information provides guidelines forusers and manufacturer
25、s of silver-tungsten contact material.Typical ranges of chemistry and properties are given for thethree most popular compositions, 27 silver/73 tungsten, 35silver/65 tungsten, and 50 silver/50 tungsten. These propertiesare influenced by the particle size, shape, and distribution oftungsten, homogene
26、ity, impurities or additives, and othermanufacturing process variables (Note). The best choice for agiven application should be decided mutually between thepurchaser and supplier using their mutual experience andapplication of engineering knowledge.NOTE X1.1 Table X1.1, Table X1.2, Table X1.3, and T
27、able X1.4represent the major manufacturing techniques used in industry. The sizeand shape of the part is important in choosing the optimum technique aswell as other considerations such as frequency of operation of the device,and how crucial is its application.X1.2 With the knowledge that several typ
28、es are available,care should be taken to ensure that production lots are the samein all respects as samples and that if a vendor change is made,noticeable property or performance variations are possible.B631 93 (2010)2TABLE X1.1 Typical Chemical Ranges for Infiltrated Silver-Tungsten ContactsComposi
29、tion,Aweight %Class A Class B Class CTungsten remainder remainder remainderSilver 2529 3337 4751Copper, max 0.2 0.2 0.2Cobalt or nickel, max 1.0 1.0 1.0Carbon, max 0.2 0.2 0.2Total impurities, max 1.0 1.0 1.0PropertiesData for typical physical properties of infiltrated sintered silver-tungsten conta
30、cts are given in this table for contacts having a mean tungsten particle size asdetermined by a Fisher sub-sieve sizer of 1 to 6.5 m.Class A Class B Class CHardness, Rockwell B 85105 7386 5060Density, Mg/m315.1415.74 14.5715.12 13.213.85Electrical conductivity, % IACS 4054 4560 5868Theoretical densi
31、ty, min, % 96 96 96Modulus of rupture,Bpsi 110 000130 000 108 000120 000 80 00082 000MPa 760900 740830 550570Youngs modulus,Bpsi 39.00 3 10635 3 10628.00 3106MPa 270 3 103240 3 103190 3 103Tensile strength,Bpsi 70 000 55 000 35 000MPa 480 380 240Coefficient of expansion,Bin./in.F 5.9 3 1066.75 3 106
32、7.9 3 106m/mK 10.6 3 10612.15 3 10614.4 3 106Thermal conductivity,BBtuin./hft2F 2920 3130 3130W/mK 420 451 451AAnalysis is regularly made for the elements for which specific limits are listed. If, however, the presence of “other” elements is suspected or indicated in the courseof routine analysis, f
33、urther analysis shall be made to determine that the total of these “other” elements and the listed impurities are not in excess of the total impurities limit.BItems that are normally useful for engineering calculations in contact design but are not specified.TABLE X1.2 Typical Chemical Ranges for Hi
34、gh-Density Press and Sintered Silver-Tungsten ContactsComposition,Aweight %Class A Class B Class CTungsten remainder remainder remainderSilver 2529 3337 4246Nickel, cobalt, or copper, max 1.50 1.50 1.50Carbon, max 0.20 0.20 0.20Total impurities, max 0.50 0.50 0.50PropertiesData for typical physical
35、properties of pressed and sintered silver-tungsten contacts are given in this table for contacts having a mean tungsten particle size asdetermined by a Fisher sub-sieve sizer, or 1 to 4 m.Class A Class B Class CHardness, Rockwell B 90105 70100 5085Density, Mg/m314.715.6 14.114.8 13.314.0Electrical c
36、onductivity, % IACS 3850 4560 5267Youngs modulus,Bpsi 32 3 10+630 3 10+625 3 10+6MPa 220 3 10+3210 3 10+3170 3 10+3Coefficient of expansion,Bin./in.F 5.9 3 1066.77 3 1067.78 3 106m/mK 10.6 3 10612.2 3 10614.00 3 106Thermal conductivity,BBtuin./hft2F 2880 3160 3420W/mK 415 451 493AAnalysis is regular
37、ly made for the elements for which specific limits are listed. If, however, the presence of “other” elements is suspected or indicated in the courseof routine analysis, further analysis shall be made to determine that the total of these “other” elements and the listed impurities are not in excess of
38、 the total impurities limit.BItems that are normally useful for engineering calculations in contact design but are not specified.B631 93 (2010)3ASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of t
39、his standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five y
40、ears andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical comm
41、ittee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19
42、428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the s
43、tandard may also be secured from the ASTM website (www.astm.org/COPYRIGHT/).TABLE X1.3 Typical Chemical Ranges for Pressed, Sintered and Repressed Silver-Tungsten ContactsComposition,Aweight %Class A Class B Class CTungsten remainder remainder remainderSilver 2529 3337 4852Copper, max 0.2 0.2 0.2Car
44、bon, max 0.2 0.2 0.2Total impurities, max 0.5 0.5 0.5PropertiesData for typical physical properties of repressed, sintered silver-tungsten contacts are given in this table for contacts having a mean tungsten particle size asdetermined by a Fisher sub-sieve sizer of 1 to 6.5 m.Class A Class B Class C
45、Hardness, Rockwell B 4570 5070 4055Density, Mg/m314.9515.31 14.1814.93 12.9213.67Electrical conductivity,% IACS 3845 4255 5065Theoretical density, min, % 95 95 95AAnalysis is regularly made for the elements for which specific limits are listed. If, however, the presence of “other” elements is suspec
46、ted or indicated in the courseof routine analysis, further analysis shall be made to determine that the total of these “other” elements and the listed impurities are not in excess of the total impurities limit.TABLE X1.4 Typical Chemical Ranges for Low-Density Pressed and Sintered Silver-Tungsten Co
47、ntactsComposition,Aweight %Class A Class B Class CTungsten remainder remainder remainderSilver 2529 3337 4652Copper, max 0.20 0.20 0.20Carbon, max 0.20 0.20 0.20Total impurities, max 0.50 0.50 0.50PropertiesData for typical physical properties of pressed and sintered silver-tungsten contacts are giv
48、en in this table for contacts having a mean tungsten particle size asdetermined by a Fisher sub-sieve sizer of 1 to 4 m.Hardness, Rockwell B 5570 4560 3550Density, Mg/m313.9715.2 13.7414.19 12.5212.93Electrical conductivity, % IACS 3545 4555 5060Youngs modulus,Bpsi 32 3 10+630 3 10+625 3 10+6MPa 220
49、 3 10+3210 3 10+3170 3 10+3Coefficient of expansion,Bin./in.F 5.9 3 1066.77 3 1067.78 3 106m/mK 10.6 3 10612.2 3 10614.00 3 106Thermal conductivity,BBtuin./hft2F 2880 3160 3420W/mK 415 451 493AAnalysis is regularly made for the elements for which specific limits are listed. If, however, the presence of “other” elements is suspected or indicated in the courseof routine analysis, further analysis shall be made to determine that the total of these “other” elements and the lis
