1、Designation: D 1005 95 (Reapproved 2007)Standard Test Method forMeasurement of Dry-Film Thickness of Organic CoatingsUsing Micrometers1This standard is issued under the fixed designation D 1005; the number immediately following the designation indicates the year oforiginal adoption or, in the case o
2、f revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the Department of Defense.1. Scope1.1 This test me
3、thod covers the measurement of film thick-ness of dried films of paint, varnish, lacquer, and relatedproducts using micrometers. Procedures A and B utilize sta-tionary micrometers and Procedures C and D, hand-heldmicrometers. Procedures A and C are not recommended forfilms less than 12.5 m (0.5 mils
4、) in thickness. The minimumthickness required for Procedures B and D is a function of thatrequired to enable removal of the sample as a free film.1.2 The procedures appear as follows:1.2.1 Procedure AStationary micrometer for measuringcoatings applied to plane rigid surfaces.1.2.2 Procedure BStation
5、ary micrometer for measuringfree films.1.2.3 Procedure CHand-held micrometer for measuringcoatings applied to plane rigid surfaces.1.2.4 Procedure DHand-held micrometer for measuringfree films.1.3 The values stated in SI units are to be regarded as thestandard. The values given in parentheses are fo
6、r informationonly.1.4 This standard does not purport to address the safetyconcerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety andhealth practices and determine the applicability of regulatorylimitations prior to use.2. Refer
7、enced Documents2.1 ASTM Standards:2D 823 Practices for Producing Films of Uniform Thicknessof Paint, Varnish, and Related Products on Test PanelsD 2370 Test Method for Tensile Properties of OrganicCoatings3. Significance and Use3.1 This test method is particularly applicable to the mea-surement of f
8、ree films and is also satisfactory for the measure-ment of films on laboratory test panels.3.2 The accuracy and precision of the thickness measure-ments may be influenced by the deformability of the coating.This test method is not applicable to coatings that are readilydeformable under the load of t
9、he measuring instrument.3.3 The accuracy and precision of the thickness measure-ments are also influenced by the uniformity of the substratewhen the coatings are applied to laboratory test panels.4. Apparatus4.1 Procedures A and B:4.1.1 The apparatus shall consist of a dial comparator, dialindicator
10、, or micrometer. A rigid base is required for mountingthe dial comparator or dial indicator gages. The presser foot ofthe micrometer or dial indicator shall be circular, from 1.5 to3.0 mm (116 to18 in.) in diameter, and shall be flat on thebottom. The presser foot shall be fixed to an indicator that
11、 readsto 2.5 m (0.1 mil). The load on the presser foot shall bebetween 140 and 275 kPa (20 and 40 psi ). For Procedure B, asmooth uncoated test plate is also required.4.1.2 Verify the accuracy of instrument calibration by set-ting to zero with the anvils closed followed by measuringshims of known th
12、icknesses or standards specifically designedfor this purpose. Record the standard thickness gage measure-ment and the micrometer reading. Use these results to constructa calibration curve.4.2 Procedures C and DThe apparatus shall consist of ahand-held micrometer. The anvils of the micrometer shall b
13、ecircular, from 1.5 to 3.0 mm (116 to18 in.) in diameter, withflat bottoms. Verify the accuracy of instrument calibration bysetting to zero with the anvils closed followed by measuring1This test method is under the jurisdiction of ASTM Committee D01 on Paintand Related Coatings, Materials, and Appli
14、cations and is the direct responsibility ofSubcommittee D01.23 on Physical Properties of Applied Paint Films.Current edition approved Nov. 1, 2007. Published November 2007. Originallyapproved in 1949. Last previous edition approved in 2001 as D 1005 95 (2001).2For referenced ASTM standards, visit th
15、e ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,
16、United States.shims of known thicknesses or standards specifically designedfor this purpose. Record the standard thickness gage measure-ment and the micrometer reading. Use these results to constructa calibration curve.5. Test Specimen5.1 Procedures A and CApply test films to a suitableplane, rigid
17、base material from which the dried film may besatisfactorily removed. The panels shall be of sufficient size topermit film thickness measurements to be made 25 mm (1 in.)from any edge.5.1.1 Coatings should be applied in accordance with Prac-tices D 823 or as agreed upon between the purchaser and the
18、seller.5.2 Procedures B and DFree films of the test material arerequired. Alternatively, the test materials can be applied to anappropriate substrate in order that they can be removed as freefilms without deformation. If the method of specimen prepa-ration affects the film forming properties of the
19、test material orrequires cutting or scraping to remove the free film, useProcedures A or C instead.5.2.1 Free films may be prepared in accordance with TestMethod D 2370.6. Procedure6.1 Procedure A:6.1.1 Mount the test panel rigidly on a suitable base. Clampor hold it to the base in such a way that t
20、here will be nomovement or spring of the panel during the film thicknessmeasurement.6.1.2 Close the gage slowly until contact is made, butwithout visible distortion of the film. Read the gage, estimatingto 2.5 m (0.1 mil), and record the reading.6.1.3 Open the gage and remove the film carefully from
21、 thearea where the measurement was taken. Any suitable means,chemical or mechanical, may be used to remove the film,taking care not to distort the panel. Close the gage, slowly onthe area from which the film was removed, and take a reading,estimating to 2.5 m (0.1 mil).6.1.4 The difference in the ga
22、ge readings before and afterthe removal of the film is the thickness of the film. Record to2.5 m (0.1 mil).6.1.5 As an alternative to the above, the panels may bemeasured in distinct locations prior to the application of thecoating, and again in the identical locations after the coatinghas cured. Th
23、e difference represents the coating thickness.6.1.6 Take a sufficient number of readings to characterizethe panel. A recommended minimum is three determinationsfor a 75 by 150-mm (3 by 6-in.) panel and more in proportionto size.6.2 Procedure B:6.2.1 Mount a smooth uncoated test panel rigidly on asui
24、table base. Clamp or hold it to the base in such a way thatthere will be no movement or spring of the panel during thefilm thickness measurement. Fig. 1 illustrates one satisfactoryway of rigidly mounting the panel for measurement.6.2.2 Close the gage slowly until contact is made. Read thegage, esti
25、mating to 2.5 m (0.1 mil), and record the reading.6.2.3 Open the gage and lay a free film of the test materialon the panel in the same area where the measurement wastaken. Close the gage slowly with care not to distort the filmand take a reading, estimating to 2.5 m (0.1 mil).6.2.4 The difference in
26、 the gage readings is the thickness ofthe film. Record to 2.5 m (0.1 mil).6.2.5 When conditions permit, perform a minimum of threedeterminations adjacent to one another on each film.6.3 Procedure C:6.3.1 Hold the hand-held micrometer in such a manner thatthe micrometer can be steadied against a film
27、 surface. Separatethe micrometer anvils to a distance at least twice that of thefilm thickness to be measured.6.3.2 Place the coated base material between anvil contacts.Be sure to align the panel so that it is perpendicular to thecontact points. Carefully bring the micrometer anvil intocontact with
28、 the film by releasing the spring tension or rotatingthe adjustment barrel. Do not compress the film.6.3.3 Record the film thickness to 2.5 m (0.1 mil). Forspring-loaded micrometers, record the value directly from thedial indicator. For barrel micrometers, record the value usingthe instrument in the
29、 friction mode. The friction mode allowsthe thimble sleeve to slip without further turning the measuringscrew. The friction mode provides for a consistent measuringpressure from panel to panel.6.3.4 Open the gage and remove the film carefully from thearea where the measurement was taken. Any suitabl
30、e means,chemical or mechanical, may be used to remove the film,taking care not to distort the panel. Close the gage, slowly onthe area from which the film was removed, and take a reading,estimating to 2.5 m (0.1 mil).6.3.5 The difference in the gage readings before and afterthe removal of the film i
31、s the thickness of the film. Record to2.5 m (0.1 mil).6.3.6 As an alternative to the procedures in 6.3.2 through6.3.5, the panels may be measured in distinct locations prior tothe application of the coating, and again in the identicallocations after the coating has cured. The difference representsth
32、e coating thickness.FIG. 1 Test Panel Mounted on BaseD 1005 95 (2007)26.3.7 Take a sufficient number of readings to characterizethe panel. A recommended minimum is three determinationsfor a 75 by 150-mm (3 by 6-in.) panel and more in proportionto size.6.4 Procedure D:6.4.1 Hold the hand-held microme
33、ter in such a manner thatthe micrometer can be steadied against a film surface. Separatethe micrometer anvils to a distance at least twice that of thefilm thickness to be measured.6.4.2 Place the free film to be measured between anvilcontacts. Be sure to align the film so that it is perpendicular to
34、the contact points. Carefully bring the micrometer anvil intocontact with the film by releasing the spring tension or rotatingthe adjustment barrel. Do not compress the film.6.4.3 Record the film thickness to 2.5 m (0.1 mil). Forspring-loaded micrometers, record the value directly from thedial indic
35、ator. For barrel micrometers, record the value usingthe instrument in the friction mode. The friction mode allowsthe thimble sleeve to slip without further turning the measuringscrew. The friction mode provides for a consistent measuringpressure from film to film.6.4.4 When conditions permit, perfor
36、m a minimum of threedeterminations adjacent to one another on each film.7. Report7.1 Report the results as the mean thickness of a number ofdeterminations, accompanied by a statement of the number ofobservations and the standard deviation of the determinations.8. Precision and Bias8.1 PrecisionOn th
37、e basis of an interlaboratory study ofProcedure C in which operators in two laboratories on two orthree days made four replicate measurements on each of threecoated panels differing in film thickness, the within-laboratorystandard deviations were found to be 4.3 m (0.17 mil) at the25-m (1-mil) thick
38、ness level, 8 m (0.32 mils) at the 100-m(4-mil) thickness level, and 7 m (0.28 mils) at the 200-m(8-mil) thickness level. On the basis of the same interlabora-tory study of Procedure C in which operators in sevenlaboratories made four replicate measurements on each of threecoated panels differing in
39、 film thickness, the between-laboratories standard deviations were found to be 2.25 m(0.09 mils) at the 25-m (1-mil) thickness level, 7 m (0.28mil) at the 100-m (4-mil) thickness level, and 8 m (0.33mils) at the 200-m (8-mil) thickness level. Based on thesestandard deviations, the following criteria
40、 should be used tojudge the precision of results at the 95 % confidence level:8.1.1 RepeatabilityTwo measurements, each the mean offour replicates, obtained by the same operator should beconsidered suspect if they differ by more than 17.5 m (0.7mils) at the 25-m (1-mil) thickness level and by more t
41、han 30m (1.2 mils) at the 100 to 200-m (4 to 8-mil) thickness level.8.1.2 ReproducibilityTwo measurements, each the meanof four replicates, obtained by operators in different laborato-ries should be considered suspect if they differ by more than7.5 m (0.3 mils) at the 25-m (1-mil) thickness level an
42、d bymore than 27.5 m (1.1 mils) at the 100 to 200-m (4 to 8-mil)thickness level.8.2 BiasBias depends almost entirely on the accuracy ofthe measuring devices and care taken to set up the equipment.No interlaboratory data are available with which to estimatebias.9. Keywords9.1 dial comparator; dial in
43、dicator; dial indicator gage;filmdry film thickness; measurement of organic coatings;micrometerASTM International takes no position respecting the validity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determina
44、tion of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subject to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or with
45、drawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquarters. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that you
46、r comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org).D 1005 95 (2007)3
