1、BRITISH STANDARD BS EN 60512-25-3: 2001 IEC 60512-25-3: 2001 Connectors for electronic equipment Tests and measurement Part 25-3: Test 25c Rise time degradation The European Standard EN 60512-25-3:2001 has the status of a British Standard ICS 31.220.10 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PER
2、MITTED BY COPYRIGHT LAWBS EN 60512-25-3:2001 This British Standard, having been prepared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 16 November 2001 BSI 16 November 2001 ISBN 0
3、580 38669 4 National foreword This British Standard is the official English language version of EN 60512-25-3:2001. It is identical with IEC 60512-25-3:2001. The UK participation in its preparation was entrusted by Technical Committee EPL/48, Electromechanical components for electronic equipment, to
4、 Subcommittee EPL/48/2, Connectors for electronic equipment, which has the responsibility to: A list of organizations represented on this Subcommittee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, I
5、EC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The British Standards which implement international or European publications referred to in this do
6、cument may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of
7、 British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or pr
8、oposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 12, an inside back cover and a back cover. The B
9、SI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60512-25-3 NORME EUROPENNE EUROPISCHE NORM October 2001 CENELEC European Committee for Electrotechnical Standardization Comit Europ
10、en de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60512-25-3:2001 E ICS 31.220.10
11、English version Connectors for electronic equipment - Tests and measurement Part 25-3: Test 25c - Rise time degradation (IEC 60512-25-3:2001) Connecteurs pour quipements lectroniques - Essais et mesures Partie 25-3: Essai 25c - Dgradation du temps de monte (CEI 60512-25-3:2001) Steckverbinder fr ele
12、ktronische Einrichtungen - Mess- und Prfverfahren Teil 25-3: Prfung 25c - Vernderung der Anstiegszeit (IEC 60512-25-3:2001) This European Standard was approved by CENELEC on 2001-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for g
13、iving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three officia
14、l versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committ
15、ees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.Foreword The text of document 48B/1060/FDIS, future edition 1 of IEC 60512-25-3, prepared by SC
16、 48B, Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60512-25-3 on 2001-10-01. The following dates were fixed: latest date by which the EN has to be implemente
17、d at national level by publication of an identical national standard or by endorsement (dop) 2002-07-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2004-10-01 Annexes designated “normative“ are part of the body of the standard. Annexes designated “i
18、nformative“ are given for information only. In this standard, annex A is normative and annex B is informative. _ Endorsement notice The text of the International Standard IEC 60512-25-3:2001 was approved by CENELEC as a European Standard without any modification. _ Page 2 EN 60512253:2001 BSI 16 Nov
19、ember 2001CONTENTS 1 General . 4 1.1 Scope and object 4 1.2 Definitions 4 2 Test resources.4 2.1 Equipment 4 2.2 Fixture 5 2.2.1 Method A, single-ended 5 2.2.2 Method B, differentially driven. 5 3 Test specimen . 5 3.1 Description . 5 3.1.1 Separable connectors . 5 3.1.2 Cable assembly 6 3.1.3 Socke
20、ts. 6 4 Test procedure 6 4.1 Insertion technique . 6 4.2 Reference fixture technique 6 4.3 Rise time degradation calculation . 6 5 Details to be specified . 7 6 Test documentation . 7 Annex A (normative) Diagrams and schematics of fixtures and equipment . 9 Annex B (informative) Practical guidance .
21、12 Figure 1 Waveform 8 Figure A.1 Technique diagrams. 9 Figure A.2 Single-ended terminations.10 Figure A.3 Differential (balanced) terminations.11 Page 3 EN 60512253:2001 BSI 16 November 2001CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 25-3: Test 25c Rise time degradation 1 Genera
22、l 1.1 Scope and object This part of IEC 60512 applies to electrical connectors, sockets, cable assemblies or inter- connection systems. This standard describes a method for measuring the effect a specimen has on the rise time of a signal passing through it. 1.2 Definitions For the purpose of this pa
23、rt of IEC 60512, the following definitions apply. 1.2.1 rise time degradation increase in rise time to a theoretically perfect (zero rise time) voltage step when the specimen is inserted in the transmission path; see figure 1. The formula used to calculate rise time degradation for gaussian signals
24、from 10 % to 90 % is as follows: Rise time degradation = square root (measured rise time) 2 ( me a s u r e me n t s y s t e m r i s e time) 2 1.2.2 measurement system rise time rise time measured with fixture in place, without the specimen, and with filtering (or normalization). Rise time is typical
25、ly measured from 10 % to 90 % levels; see figure 1 1.2.3 specimen environment impedance impedance presented to the signal conductors by the fixture. This impedance is a result of transmission lines, termination resistors, attached receivers and signal sources, and fixture parasitics 1.2.4 rise time
26、time required for a voltage step to occur, measured between its initial value and final value, typically from 10 % to 90 % levels 2 Test resources 2.1 Equipment Pulse generator and oscilloscope, time domain reflectometer (TDR) or other suitable equipment with a measurement system rise time less than
27、 or equal to 70 % of the measured rise time. Page 4 EN 60512253:2001 BSI 16 November 20012.2 Fixture Unless otherwise specified in the referencing document, the specimen environment impedance shall match the impedance of the test equipment. Typically, this will be 50 for single-ended measurements an
28、d 100 for differential. 2.2.1 Method A, single-ended The fixture shall allow one signal line to be driven at a time. The driven line shall be terminated according to one of the methods of figure A.2 with the specimen environment impedance. Unless otherwise specified, a 1:1 signal-to-ground ratio sha
29、ll be used with each end having all grounds commoned. Each line adjacent to the driven line shall also be terminated in its specimen environment impedance at both near and far ends. 2.2.1.1 Insertion technique The fixture shall be designed to allow measurement of rise time with and without the speci
30、men; see figure A.1a. 2.2.1.2 Reference fixture technique Two fixtures shall be designed to have the same fixture electrical length and characteristics of environment transmission line. The “specimen fixture” includes the specimen. The “reference fixture” does not include the specimen. The fixture e
31、lectrical length does not include the specimen length; see figure A.1b. 2.2.2 Method B, differentially driven The fixture shall allow one signal pair to be driven at a time. The driven line shall be terminated according to one of the methods of figure A.3 with the specimen environment impedance. Unl
32、ess otherwise specified, a 2:1 signal-to-ground ratio shall be used. Each line adjacent to the driven line shall also be terminated in the specimen environment impedance at both near and far ends. 2.2.2.1 Insertion technique The fixture shall be designed to allow measurement of rise time with and wi
33、thout the specimen; see figure A.1a. 2.2.2.2 Reference fixture technique Two fixtures shall be designed to have the same fixture electrical length and characteristics of environment transmission line. The “specimen fixture” includes the specimen. The “reference fixture” does not include the specimen
34、. The fixture electrical length does not include the specimen length; see figure A.1b. 3 Test specimen 3.1 Description For this test procedure, the test specimen shall be as follows. 3.1.1 Separable connectors A mated connector pair. Page 5 EN 60512253:2001 BSI 16 November 20013.1.2 Cable assembly A
35、ssembled connectors and cables, and mating connectors. 3.1.3 Sockets A socket and test device or a socket and pluggable header adaptor. 4 Test procedure Unless otherwise specified, the measurement system rise time shall be less than or equal to 70 % of the measured rise time with the specimen, see f
36、igure 1. It is recommended to use the fastest output signal of which the equipment is capable. Each of the two techniques below apply to both single-ended and differential measurements. For differential measurements, it is necessary to determine if any phase and/or amplitude errors exist between the
37、 channels, and to provide necessary compensation for these errors. Place the specimen a minimum of 5 cm from any object that would affect measured results. NOTE The test professional should be aware of limitations of any mathematical operation(s) performed by an instrument (e.g. normalization or sof
38、tware filtering). 4.1 Insertion technique 4.1.1 Measure the rise time and plot the waveform of the output signal that is transmitted through the fixture without the specimen and with filtering or normalization. This is the measurement system rise time. 4.1.2 Measure the rise time and plot the wavefo
39、rm of the output signal that is transmitted through the fixture with the specimen and with filtering or normalization. This is the measured rise time. 4.2 Reference fixture technique 4.2.1 Measure the rise time and plot the waveform of the output signal that is transmitted through the reference fixt
40、ure without the specimen and with filtering or normalization. This is the measurement system rise time. 4.2.2 Measure the rise time and plot the waveform of the output signal that is transmitted through the reference fixture with the specimen and with filtering or normalization. This is the measured
41、 rise time. 4.3 Rise time degradation calculation If the signal is Gaussian in nature and the rise time was measured from 10 % to 90 % levels, then calculate the rise time degradation as follows: Rise time degradation = square root (measured rise time) 2 ( me a s u r e me n t s y s t e m r i s e tim
42、e) 2 The equation may not be used if the signal was not Gaussian in nature or the signal rise time was not measured from 10 % to 90 % levels. In this case, report the measured rise times and waveform plots. Page 6 EN 60512253:2001 BSI 16 November 20015 Details to be specified The following details s
43、hall be specified in the reference document. 5.1 Measurement system rise time (if available). 5.2 Specimen environment impedance if other than 50 for single-ended or 100 for differential. 5.3 Signal/ground pattern, including the number and location of signal and grounds to be wired for this test. 5.
44、4 Fixture requirements, if any. 5.5 Rise time levels if other than 10 % to 90 %. 5.6 Method A (single-ended), method B (differentially driven), or both. 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following. 6.1 Title of test. 6.2
45、Test equipment, and date of last and next calibration. 6.3 Test procedure and method. 6.4 Fixture description. 6.5 Measurement system rise time, see clause 4, as applicable. 6.6 Measured rise times with specimen. 6.7 Waveform plots (required if the signals are not Gaussian in nature or the rise time
46、 was not measured from 10 % to 90 % levels). 6.8 Values and observations. 6.9 Name of operator and date of test. Page 7 EN 60512253:2001 BSI 16 November 200190 % V in 90 % V out 100 % V in 100 % V out 10 % V out 10 % V in Input rise time Input waveform Output rise time Output waveform IEC 1193/01 Co
47、mponents V in input voltage V out output voltage NOTE Ignore overshoot and undershoot when calculating 0 % and 100 % levels. Figure 1 Waveform Page 8 EN 60512253:2001 BSI 16 November 2001Annex A (normative) Diagrams and schematics of fixtures and equipment Source Specimen fixture A Specimen Specimen
48、 fixture B Receiver Source Specimen fixture A Specimen fixture B Receiver IEC 1188/01 Figure A.1a Insertion technique Source Reference fixture (without specimen) Receiver Source Specimen fixture (with specimen) Receiver IEC 1189/01 Figure A.1b Reference fixture technique Figure A.1 Technique diagram
49、s Page 9 EN 60512253:2001 BSI 16 November 2001V 0 + Test specimen a) b) 50 receiver Z 0= 50 c) Z 050 or R 1 R 2 R 2 R 1 50 receivers IEC 1190/01 Components R 1 resistor 1 R 2 resistor 2 Z o characteristic impedance V o source voltage Minimum loss pad equations: R 1= 50 1 (Z o/ 50) 0,5 R 1= Z o1 (50 / Z o ) 0,5 R 2= Z o/ 1 (Z o/ 50) 0,5 R 2= 50 / 1 (50 / Z o ) 0,5 Figure A.2 Single-ended terminations Page 10 EN 60512253:2001 BSI 16 November 2001
