1、BRITISH STANDARDBS EN 62008:2005Performance characteristics and calibration methods for digital data acquisition systems and relevant software The European Standard EN 62008:2005 has the status of a British StandardICS 33.200g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g
2、48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSIBS EN 62008:2005This British Standard was published under the authority of the Standards P
3、olicy and Strategy Committee on 24 January 2006 BSI 24 January 2006ISBN 0 580 46888 7National forewordThis British Standard is the official English language version of EN 62008:2005. It is identical with IEC 62008:2005.The UK participation in its preparation was entrusted to Technical Committee PEL/
4、85, Measuring equipment for electrical and electromagnetic quantities, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary.Cross-referencesThe British Standards which implement international or European publications refer
5、red to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online.This publication does not purport to include all the necessary provisi
6、ons of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, o
7、r proposals for change, and keep UK interests informed; monitor related international and European developments and promulgate them in the UK.Summary of pagesThis document comprises a front cover, an inside front cover, the EN title page, pages 2 to 47 and a back cover.The BSI copyright notice displ
8、ayed in this document indicates when the document was last issued.Amendments issued since publicationAmd. No. Date CommentsLicensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSIEUROPEAN STANDARD EN 62008 NORME EUROPENNE EUROPISCHE NORM October 2005 CENELEC European Com
9、mittee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELE
10、C members. Ref. No. EN 62008:2005 E ICS 33.200 English version Performance characteristics and calibration methods for digital data acquisition systems and relevant software (IEC 62008:2005) Caractristiques de performance et mthodes dtalonnage pour les systmes dacquisition de donnes numriques et log
11、iciels appropris (CEI 62008:2005) Leistungseigenschaften und Kalibrierverfahren fr digitale Datenerfassungssysteme und entsprechende Software (IEC 62008:2005) This European Standard was approved by CENELEC on 2005-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations w
12、hich stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This Europe
13、an Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are th
14、e national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and Un
15、ited Kingdom. Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSIEN 62008:2005 2 Foreword The text of document 85/267/FDIS, future edition 1 of IEC 62008, prepared by IEC TC 85, Measuring equipment for electrical and electromagnetic quantities, was submitted to the
16、IEC-CENELEC parallel vote and was approved by CENELEC as EN 62008 on 2005-10-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2006-07-01 latest date by which the national s
17、tandards conflicting with the EN have to be withdrawn (dow) 2008-10-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62008:2005 was approved by CENELEC as a European Standard without any modification. _ Licensed Copy: Wang Bin, na, Tue Apr 25 01:
18、57:02 BST 2006, Uncontrolled Copy, (c) BSI 3 EN 62008:2005 CONTENTS INTRODUCTION.5 1 Scope 6 2 Normative references .6 3 Terms, definitions, abbreviations and symbols.7 3.1 Terms and definitions 7 3.2 Abbreviations and symbols 8 4 General requirements .8 4.1 Test procedures and measurement uncertain
19、ty estimation8 4.2 General requirements for ADMs .9 4.3 Descriptions of parameters 9 4.4 Testing methods of measurable parameters .13 5 Hardware functionality for calibration 25 5.1 Onboard calibration information .25 5.2 General measurement adjustment hardware.25 5.3 Self-adjustment hardware 26 6 S
20、oftware calibration methods26 6.1 Calibration application programming interface (API) .26 6.2 Self-calibration methods 26 6.3 External calibration methods27 7 Calibration procedures27 Annex A (informative) Examples of calculation of modular DAQ system uncertainty.28 Annex B (normative) Pseudo-code t
21、o perform static test by method B (see 4.4.1.2) and a numerical example 31 Annex C (informative) ADM characteristics.41 Bibliography .46 Figure 1 Test signals applied to the ADM15 Figure 2 Test procedure.17 Figure 3 Representation in different grey tones of the cumulative histograms computed in each
22、 step in the case of a 5-bit ADM and a test with 4 steps 17 Figure 4 Test arrangement for noise measurements on ADMs.21 Figure C.1 Bipolar ADM with true zero42 Figure C.2 Bipolar ADM with no true zero .43 Figure C.3 Offset (specified at step 000) 44 Figure C.4 Gain component of uncertainty (after co
23、rrection of offset) (specified at step 011) 45 Annex ZA (normative) Normative references to international publications and theircorresponding European publications47 Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSIEN 62008:2005 4 Table 1 Precision of estimates of
24、 code transition level for different record lengths14Table 2 Example of parameters specification of ADM for measurement uncertainty estimation of DAQ device24 Table B.1 Derivation of the amplitude (A) and offset (Cj) of the small triangular waves, the number of samples per record (M) and the number
25、of records (R). .36 Table B.2 Results of the histogram test and corresponding transition voltages for a 5-bit ADM tested by method B in 4 steps .37 Table B.3 Deriving INL and DNL from the measured transition voltages. .39 Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy,
26、(c) BSI 5 EN 62008:2005 INTRODUCTION Totally automated measurement systems are becoming the norm for manufacturing test, research and any other area where measurements are made. Measurement automation leads to extensive data sharing, inter-instrument communication and remote measurement control. Mul
27、tifunction data acquisition (DAQ) devices meet these measurement needs. They rely on standard computer technology, allowing measurement systems developers to leverage open computer standards. The measurements made by DAQ devices are accurate and traceable. The need for measurement integrity requires
28、 developing standards not only for the measurement hardware but also for the software that calibrates the hardware. Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSIEN 62008:2005 6 PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SY
29、STEMS AND RELEVANT SOFTWARE 1 Scope This International Standard specifies performance characteristics and calibration methods for digital data acquisition systems and relevant software to ensure that all measurement systems relying on DAQ devices meet a common standard. This standard covers: the min
30、imum specifications that the DAQ device manufacturer must provide to describe the performance of the analogue-to-digital module (ADM) of the DAQ device; standard test strategies to verify the minimum set of specifications; the minimum calibration information required by the ADM that is stored on the
31、 DAQ device; the minimum calibration software requirements for external and self-calibration of the ADM of the DAQ device. This standard deals with low frequency signal conversion, e.g. applications such as plant control, vibration measurement, vibro-diagnostics, acoustics, ultrasonic measurements,
32、temperature measurements, pressure measurements, measurement in power electronics, etc. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition o
33、f the referenced document (including any amendments) applies. IEC 60748-4:1997, Semiconductor devices Integrated circuits Part 4: Interface integrated circuits IEC 60748-4-3:_1 ), Semiconductor devices Integrated circuits Part 4-3: Interface integrated circuits Dynamic criteria for analogue-to-digit
34、al converters (ADC) ISO/IEC 17025, General requirements for the competence of testing and calibration laboratories BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, Guide to the Expression of Uncertainty in Measurement (GUM) 1)To be published. Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncon
35、trolled Copy, (c) BSI 7 EN 62008:2005 3 Terms, definitions, abbreviations and symbols 3.1 Terms and definitions For the purposes of this document, the following definitions apply. 3.1.1 analogue-to-digital module ADM analogue input of a multifunction DAQ device 3.1.2 application program interface AP
36、I standardized set of subroutines or functions along with the parameters that a program can call. An API for DAQ devices allows the programmer to communicate and control the operation of the device 3.1.3 code transition level value of the input parameter of an ADM at the transition point between two
37、 adjacent output codes. The transition point is defined as the input value that causes 50 % of the output codes to be less than and 50 % to be greater than or equal to the upper code of the transition. The transition level Tk lies between code k -1 and code k 3.1.4 data acquisition device DAQ device
38、 for entering or collecting data NOTE Multifunction DAQ devices rely on a personal computer (commercial PC, Industrial PC, Compact PCI, notebook etc.) for control. These devices are designed to meet the needs of a general-purpose measurement system. They are not designed for a specific type of measu
39、rement. DAQ devices generally provide multiple measurement modes such as analogue input, analogue output, digital input, digital output, and counter-timer functionality. This standard only deals with the ADM of a DAQ device. 3.1.5 midstep value analogue value for the centre of the step excluding the
40、 steps at the two ends of the total range of analogue values NOTE For the end steps, the midstep value is defined as the analogue value that results when the analogue value for the transition to the adjacent step is reduced or enlarged as appropriate by half the nominal value of the step width. 3.1.
41、6 nominal midstep value specified analogue value within a step that is ideally represented and free of error by the corresponding digital output code 3.1.7 rated operating conditions set of conditions that must be fulfilled during the measurement in order that the parameters determining the measurem
42、ent uncertainty may be valid. Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSIEN 62008:2005 8 3.1.8 step the fractional range of analogue input values and the corresponding digital output value. 3.1.9 step width the absolute value of the difference between the tw
43、o ends of the range of analogue values corresponding to one step. 3.2 Abbreviations and symbols ADM Analogue to digital module API Application program interface CMRR Common mode rejection ratio DAQ Data acquisition device DIFF Differential DNL Differential non-linearity ENOB Effective number of bits
44、 FS Full scale INL Integral non-linearity LSB Least significant bit NRSE Non-referenced single ended PC Personal computer RSE Referenced single ended SINAD Signal to noise and distortion SFDR Spurious free dynamic range VFSFull scale VFSnomNominal full scale range VFSRPractical full scale range VZZe
45、ro VZSZero scale 4 General requirements 4.1 Test procedures and measurement uncertainty estimation A common set of specifications must be presented for comparing the ADM of one DAQ device to the ADM of another DAQ device. This is especially true when different manufacturers produce the ADMs. This do
46、cument includes a core set of information that allows a side-by-side comparison of ADM capabilities. DAQ devices are designed to meet their published specifications. If there is a need to verify these specifications, this standard presents procedures for testing the ADM to confirm the specifications
47、 of the DAQ device. Using the specifications listed in 4.2, the measurement uncertainty of the ADM of a DAQ device can be determined. Licensed Copy: Wang Bin, na, Tue Apr 25 01:57:02 BST 2006, Uncontrolled Copy, (c) BSI 9 EN 62008:2005 4.2 General requirements for ADMs The required specifications li
48、sted below are a minimum subset of the possible specifications. The basic parameters describing an ADM include: number of channels; types of inputs; full-scale input range; overvoltage protection; resolution; sampling rate; input impedance; maximum working voltage; rated operating conditions. The me
49、asurable parameters that can be tested include the following2): gain component of uncertainty; offset; common mode rejection ratio; temperature drift of gain and offset; integral non-linearity; differential non-linearity; noise; settling time; channel switching error; crosstalk; analogue input bandwidth. Where appropriate the following parameters apply: signal-to-noise and distortion ratio (SINAD); effective number of bits (E
