1、IEEE Std 1554-2005IEEE Recommended Practice forInertial Sensor Test Equipment,Instrumentation, Data Acquisition,and AnalysisI E E E3 Park Avenue New York, NY 10016-5997, USA28 November 2005IEEE Aerospace and Electronic Systems SocietySponsored by theGyro and Accelerometer PanelRecognized as anAmeric
2、an National Standard (ANSI)IEEE Std 1554-2005(R2011)IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and AnalysisSponsorGyro Accelerometer Panel Committeeof theIEEE Aerospace and Electronic Systems SocietyApproved 5 October 2005Reaffirmed 16 April 2012
3、American National Standards InstituteApproved 9 June 2005Reaffirmed 31 March 2011IEEE-SA Standards BoardThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2005 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserv
4、ed. Published 28 November 2005. Printed in the United States of America.IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. ivCopyrigh
5、t 2005 IEEE. All rights reserved.IntroductionThis document gives recommended practices for gyroscope and accelerometer testing and test data analysis.General and sensor specific equipment and instrumentation are described, including mounting fixtures,dividing heads and rotary test tables, vibration
6、and shock machines, centrifuges, radiation test facilities, andthermal and other environmental chambers. Inertial sensor readouts, test control, data acquisition, filtering,and analysis are discussed. Analysis procedures include plotting, least-square polynomial and other fits,power spectral density
7、 and Allan variance noise analysis, and performance model parameter calibrationestimation. This recommended practice represents a consensus of manufacturers and users in industry, governmentagencies, and other interested groups. When necessary, the needs of the inertial sensor community havebeen giv
8、en preference over general technical usage. This recommended practice was prepared by the Gyro and Accelerometer Panel of the AerospaceElectronics System Society of the Institute of Electrical and Electronic Engineers. This document representsa group effort on a large scale. A total of 81 individual
9、s attended 31 meetings of the Gyro and AccelerometerPanel while this standard was in preparation. Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check
10、 this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent
11、rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patentsor patent applications for which a license may be required to implement an IEEE standard or fo
12、r conductinginquiries into the legal validity or scope of those patents that are brought to its attention.This introduction is not part of IEEE Std 1554-2005, IEEE Recommended Practice for Inertial Sensor TestEquipment, Instrumentation, Data Acquisition, and Analysis.vCopyright 2005 IEEE. All rights
13、 reserved.ParticipantsAt the time this recommended practice was completed, the Gyro and Accelerometer Working Group had thefollowing membership:Randall Curey, ChairThe following individuals also contributed to the development of this recommended practice.Jacques P. Govignon Duane E. Larsen Richard S
14、pencer Joseph A. MiolaThe following members of the individual balloting committee voted on this guide. Balloters may have votedfor approval, disapproval, or abstention.When the IEEE-SA Standards Board approved this guide on 9 June 2005, it had the following membership:Steve M. Mills, ChairRichard H.
15、 Hulett, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan H. Cookson, NIST RepresentativeJennie Steinhagen IEEE Standards Project EditorMichael E
16、. AshCleon H. BarkerStephen F. BeckaSid BennettStephen BongiovanniPierre BouniolTim BuckHerbert T. CalifanoA. T. CampbellGeorge W. EricksonYuri FilatovThomas A. FuhrmanKerry N. GreenYoshiaki HirobeTommy IchinoseJean-Franois KiefferTakashi KunimiGreg LeporeDmitri LoukianovBryan LovittJean MartelRober
17、t MooreHarold D. MorrisBart Morrow, Jr.Charles PearceRex B. PetersArkadii SinelnikovDavid RozelleVladimir SkvortzovDaniel TazartesMohammad TehraniLeroy O. ThielmanAngelo TruncaleDavid J. WinkelBruce R. YoumansMichael AshCleon H. BarkerSid BennettKeith ChowRobert CorrellusRandall CureyRobert Dahlgren
18、Jean-Franois KiefferVladimir SkvortzovDaniel TazartesLeroy O. ThielmanBruce R. YoumansMark D. BowmanDennis B. BrophyJoseph BruderRichard CoxBob DavisJulian Forster*Joanna N. GueninMark S. HalpinRaymond HapemanWilliam B. HopfLowell G. JohnsonHerman KochJoseph L. Koepfinger*David J. LawDaleep C. Mohla
19、Paul NikolichT. W. OlsenGlenn ParsonsRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenRichard L. TownsendJoe D. WatsonHoward L. WolfmanContents1. Overview 11.1 Scope . 11.2 Purpose 22. Normative references 22.1 IEEE standards 22.2 ISO standards. 32.3 Nuclear radiation test standards. 33
20、. Test planning 43.1 Classification of tests. 43.2 Calibrated parameter characteristics 43.3 Test plan outline 53.4 Test station log book 54. General equipment 64.1 Calibration of equipment . 64.2 Test station power supplies and grounds . 64.3 Time and frequency standard. 64.4 Precision voltage refe
21、rence 74.5 Voltmeters . 74.6 Ammeters and wattmeters . 74.7 Resistance references. 74.8 Magnetic field shielding 84.9 Magnetic field generation and measurement . 84.10 Frequency synthesizers 84.11 Oscilloscopes. 94.12 Spectrum analyzer . 94.13 Signal analyzer 94.14 Voltage- or current-to-frequency c
22、onverters . 94.15 Frequency counters 94.16 Temperature controllers. 104.17 Temperature-monitoring equipment 104.18 Bubble levels and tilt meters 104.19 Autocollimator. 114.20 Displacement measurement systems . 114.21 Other general commercial equipment 124.22 Specially built equipment 135. Sensor-spe
23、cific equipment 136. Mounting fixture. 146.1 Fixture mechanical design . 146.2 Thermal control of fixture . 146.3 Vibration fixture 146.4 Centrifuge fixture 156.5 Radiation test fixture . 15viCopyright 2005 IEEE. All rights reserved. 7. Test piers 167.1 Location of test piers . 167.2 Vibration envir
24、onment of test pier. 167.3 Tilt and azimuth motion of test pier. 167.4 Active control of test pad. 178. Accelerometer dividing heads (or turntables). 178.1 Use of accelerometer dividing heads . 178.2 Placement of dividing head . 188.3 Thermal control on dividing head 188.4 Alignment of dividing head
25、 and mounting fixture. 198.5 Wiring to dividing head. 198.6 Rotation of dividing head 208.7 Readout of dividing head angles 209. Rate tables 219.1 Use of rate tables . 219.2 Single-axis rate table . 219.3 Two-axis rate table 249.4 Three-axis rate tables for inertial sensor assembly (ISA) testing. 27
26、10. Vibration and shock equipment 3010.1 Use of vibration and shock machines 3010.2 Vibrators 3010.3 Drop shock and hammer shock machines3410.4 Air guns . 3410.5 Shock and vibration monitors 3411. Centrifuge. 3711.1 Use of centrifuges 3711.2 Lesser accuracy and high-speed centrifuges 3711.3 Precisio
27、n centrifuge . 3811.4 Double turntable centrifuge . 3911.5 Centrifuge instrumentation 3911.6 Other rotating inertial sensor test equipment. 4212. Environmental chambers 4312.1 Thermal control on a test table, vibrator, or centrifuge 4312.2 Refrigerated and heated chambers. 4412.3 Barometric chambers
28、. 4412.4 Equipment for electromagnetic susceptibility and emissions testing. 4412.5 Acoustic absorption and generation. 4512.6 Other environmental chambers 4513. Nuclear radiation effects testing. 4513.1 Use of nuclear radiation testing . 4513.2 Basis of radiation testing requirements (radiation eff
29、ects) 4613.3 TID effects testing . 47viiCopyright 2005 IEEE. All rights reserved. 13.4 Ionizing dose rate effects testing . 4713.5 Displacement damage effects testing (neutron and protons) . 4813.6 SEE testing 4913.7 TME testing. 4914. Counter and frequency readouts . 5014.1 Counters and continuous
30、counters . 5014.2 Period readouts 5114.3 Frequency readouts 5114.4 Phase-locked loops (PLLs) 5114.5 Other ways of reading out frequency. 5215. A/D conversion readouts 5215.1 Commercial voltmeters 5215.2 A/D converters. 5215.3 Voltage- and current-to-frequency converters . 5216. Temperature monitorin
31、g. 5316.1 General comments . 5316.2 Calibration of temperature readout 5316.3 Types of temperature monitors 5417. Other monitoring and commanding 5417.1 Analog input signals and signal conditioning 5417.2 Analog output signals 5417.3 Asynchronous interfaces 5517.4 Digital input and output signals. 5
32、517.5 Microprocessor interfaces 5517.6 IEEE 488 bus. 5517.7 Other interface buses . 5517.8 Radio telemetry interfaces . 5618. Computer data acquisition, control, filtering, and storage 5618.1 Real-time operation . 5618.2 Initialization and running of test 5618.3 Interfaces to computer backplane 5818
33、.4 Experiment control and automatic test equipment. 5818.5 Acquired signals 5818.6 Event recording 5918.7 Real-time digital filtering 5918.8 Data storage . 6218.9 Data transmission 6319. Data analysis. 6319.1 Data file format 6319.2 Plots versus time 6419.3 Plots of one channel versus another. 6619.
34、4 Polynomial and other linear least-squares-fit residual plots 6619.5 Power spectral density (PSD) 69viiiCopyright 2005 IEEE. All rights reserved. 19.6 Allan variance 7219.7 Noise processes 7519.8 Time series to verify PSD and Allan variance software 7819.9 Allan variance autofit procedure 8419.10 R
35、egression analysis and cross PSD . 8419.11 Parameter estimation . 8519.12 Analysis of gyroscope and accelerometer drift data 8719.13 Analysis of data with varying test conditions 8719.14 Database of test results 9220. Geophysics instrumentation . 9320.1 Gravimeters . 9320.2 Tilt and azimuth motion.
36、9420.3 Seismometers. 9420.4 Gyrocompass . 9520.5 Surveying and global positioning system (GPS) positioning 9520.6 Star sightings . 9821. Calibration of test equipment and instrumentation. 9921.1 Site coordinates, gravity, and components of earths rotation rate 9921.2 Time and frequency references 99
37、21.3 Calibration of electrical equipment 10021.4 Calibration of temperature-measuring instrumentation . 10021.5 Calibration of other equipment 100AnnexA.1 General bibliography. 102 A.2 Nuclear radiation testing bibliography.102 ixCopyright 2005 IEEE. All rights reserved. A (informative) Bibliography
38、102IEEE Recommended Practice forInertial Sensor Test Equipment, Instrumentation, Data Acquisition,and Analysis 1.1.1OverviewScopeRecommended practices for gyroscope and accelerometer testing are discussed, ranging from the equipment and instrumentation employed to the way that tests are carried out
39、and data are acquired and analyzed.Normative references are given in Clause 2, and a bibliography is given in Annex A. Test planning isdescribed in Clause 3. General equipment and sensor-specific equipment for testing gyroscopes and accelerometers are described in Clause 4 and Clause 5. Mounting fix
40、tures, test piers, accelerometerdividing heads, and gyroscope rate tables are discussed in Clause 6, Clause 7, Clause 8, and Clause 9.Three-axis tables for inertial sensor assembly (ISA) testing are described in 9.4.Vibration and shock equipment, centrifuges, and environmental chambers are described
41、 in Clause 10,Clause 11, and Clause 12. Nuclear radiation facilities are discussed in Clause 13. Special readoutinstrumentation required in gyroscope and accelerometer testing is discussed in Clause 14, Clause 15, Clause 16, and Clause 17. Such instrumentation includes counter and frequency readouts
42、, analog-to-digital(A/D) conversion readouts, temperature monitoring, and other monitoring and commanding functions overvarious types of interfaces and buses.Computer data acquisition, control, filtering, and storage are described in Clause 18. The analysis of testdata is discussed in Clause 19. Suc
43、h analysis includes the plotting of data channels versus time and otherdata channels, least-squares fits of polynomials and other models to data, power spectral density (PSD) andAllan variance noise analysis, and regression analysis and parameter estimation.Geophysics instrumentation is discussed in
44、 Clause 20 because inertial sensors are tested on the earth, whichprovides seismic, tilt, and other disturbances, but also provides the fundamental gravity and earth rotationinputs against which sensor parameters (such as scale factor) are calibrated. Therefore, the acceleration due to gravity at a
45、test site and the site latitude and longitude must be accurately determined.The calibration of test site coordinates and gravity acceleration, the calibration of test station electrical andother equipment, and fundamental time and frequency references are discussed in Clause 21.1Copyright 2005 IEEE.
46、 All rights reserved. IEEE Std 1554-2005IEEE Recommended Practice for Inertial Sensor Test Equipment, Instrumentation, Data Acquisition, and Analysis1.22.2.1PurposeThis recommended practice is intended for people who test inertial sensors and analyze the results fromsuch testing. The general and spe
47、cialized test equipment employed in such testing is described, andrecommendations are made on techniques for acquisition, filtering, storage, and analysis of the test data in keeping with modern practice.Normative referencesThe following referenced documents are indispensable for the application of
48、this recommended practice.For dated references, only the edition cited applies. For undated references, the latest edition of thereferenced document (including any amendments or corrigenda) applies. In the event of any conflict, therecommended practices of this document shall have precedence over th
49、e documents listed in this clause.IEEE standardsIEEE/ASTM SI 10, Standard for Use of the International System of Units (SI): The Modern Metric System.1IEEE Std 260.1, American National Standard Letter Symbols for Units of Measurement (SI Units, Customary Inch-Pound Units, and Certain Other Units).2IEEE Std 292, IEEE Specification Format for Single-Degree-of-Freedom Spring-Restrained Rate Gyros.IEEE Std 293, IEEE Test Procedure for Single-Degree-of-Freedom Spring-Restrained Gyros. IEEE Std 315, IEEE Standard Graphic Symbols for Electrical and Electronics Diagrams.IEEE
