1、BS ISO11452-10:2009ICS 33.100.20; 43.040.10NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBRITISH STANDARDRoad vehicles Component testmethods for electricaldisturbances fromnarrowband radiatedelectromagnetic energyPart 10: Immunity to conducteddisturbances in the extended audi
2、ofrequency rangeThis British Standardwas published under theauthority of the StandardsPolicy and StrategyCommittee on 31 May 2009 BSI 2009ISBN 978 0 580 57829 8Amendments/corrigenda issued since publicationDate CommentsBS ISO 11452-10:2009National forewordThis British Standard is the UK implementati
3、on of ISO 11452-10:2009.The UK participation in its preparation was entrusted to TechnicalCommittee AUE/16, Electrical and electronic equipment.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necess
4、ary provisionsof a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunityfrom legal obligations.BS ISO 11452-10:2009Reference numberISO 11452-10:2009(E)ISO 2009INTERNATIONAL STANDARD ISO11452-10First edition2009-04-15Road vehicles Compon
5、ent test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 10: Immunity to conducted disturbances in the extended audio frequency range Vhicules routiers Mthodes dessai dun quipement soumis des perturbations lectriques par rayonnement dnergie lectromagntique en
6、 bande troite Partie 10: Immunit aux perturbations conduites dans la bande des audiofrquences tendues BS ISO 11452-10:2009ISO 11452-10:2009(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be
7、edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this file, parties accept therein the responsibility of not infringing Adobes licensing policy. The ISO Central Secretariat accepts no liability in this area. Adobe is
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9、 bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. COPYRIGHT PROTECTED DOCUMENT ISO 2009 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
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11、l copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2009 All rights reservedBS ISO 11452-10:2009ISO 11452-10:2009(E) ISO 2009 All rights reserved iiiForeword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bod
12、ies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and
13、 non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives,
14、Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies cast
15、ing a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 11452-10 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee S
16、C 3, Electrical and electronic equipment. ISO 11452 consists of the following parts, under the general title Road vehicles Component test methods for electrical disturbances from narrowband radiated electromagnetic energy: Part 1: General principles and terminology Part 2: Absorber-lined shielded en
17、closure Part 3: Transverse electromagnetic mode (TEM) cell Part 4: Bulk current injection (BCI) Part 5: Stripline Part 7: Direct radio frequency (RF) power injection Part 8: Immunity to magnetic fields Part 10: Immunity to conducted disturbances in the extended audio frequency range Part 11: Radiate
18、d immunity test method using a reverberation chamber The following parts are under preparation: Part 9: Portable transmitters BS ISO 11452-10:2009ISO 11452-10:2009(E) iv ISO 2009 All rights reservedIntroduction Immunity measurements of complete road vehicles can generally only be carried out by the
19、vehicle manufacturer, owing to, for example, high costs of absorber-lined shielded enclosures, the desire to preserve the secrecy of prototypes or a large number of different vehicle models. For research, development and quality control, a laboratory measuring method can be used by both vehicle manu
20、facturers and equipment suppliers to test electronic components. ISO 11452-1 specifies general test conditions, definitions, practical use and basic principles of the test procedure. BS ISO 11452-10:2009INTERNATIONAL STANDARD ISO 11452-10:2009(E) ISO 2009 All rights reserved 1Road vehicles Component
21、 test methods for electrical disturbances from narrowband radiated electromagnetic energy Part 10: Immunity to conducted disturbances in the extended audio frequency range 1 Scope This part of ISO 11452 specifies a conducted voltage test method and procedure for determining the immunity of electroni
22、c components of passenger cars and commercial vehicles, regardless of the propulsion system (e.g. spark-ignition engine, diesel engine, electric motor). The method is applied to each individual device under test (DUT) lead and is applicable to all power and output leads, as well as low frequency ana
23、logue leads. The method is particularly useful in evaluating DUTs with acoustic or visible display functions. The disturbances considered in this part of ISO 11452 are limited to continuous narrowband electric voltage waveforms. 2 Normative references The following referenced documents are indispens
24、able for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 11452-1, Road vehicles Component test methods for electrical disturbances from narrowband rad
25、iated electromagnetic energy Part 1: General principles and terminology 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 11452-1 apply. 4 Test conditions The applicable frequency range of the test method is 15 Hz to 250 kHz. The user of this part of I
26、SO 11452 shall specify the test severity level or levels over the frequency bands. Typical test levels are given for information purposes in Annex A. Standard test conditions are given in ISO 11452-1 for the following: test temperature; supply voltage; BS ISO 11452-10:2009ISO 11452-10:2009(E) 2 ISO
27、2009 All rights reserved dwell time; test signal quality. Unless otherwise specified, the tolerance on all parameters is 10 %. 5 Test location For the frequency range of this test, there are no special grounding or shielding requirements. 6 Test apparatus 6.1 General The primary functional requireme
28、nt is that the apparatus provide a source impedance of less than 0,5 from 15 Hz to 50 kHz and less than or equal to 2 from 50 kHz to 250 kHz at the signal source (i.e. at the output of the isolation transformer) over the test frequency range. Annex B details a procedure for verifying the source impe
29、dance of the test apparatus. The frequency range of the apparatus used for the test shall meet the test plan frequency range requirements. NOTE 1 The upper frequency limit for the apparatus in 6.2.1, 6.2.2 and 6.2.3 can be reduced in accordance with the users frequency range requirements. NOTE 2 It
30、is recognized that other types of apparatus can produce equivalent signals, e.g. a power oscillator can replace the oscillator and amplifier, a power operational amplifier can replace the amplifier and power supply, etc. The test apparatus consists of the following: an audio oscillator or signal gen
31、erator, an extended range audio amplifier, an isolation transformer, a voltage measuring instrument, a current measuring instrument, a power supply, and a capacitor. 6.2 Apparatus 6.2.1 Audio oscillator, 15 Hz to 250 kHz frequency range. 6.2.2 Audio power amplifier, 15 Hz to 250 kHz frequency range;
32、 50 W output power minimum with output impedance equal to or less than 2,0 (capable of delivering 50 W into a 0,5 resistive load connected across the specified isolation transformer secondary). The amplifier shall be capable of operating open circuit without damage. 6.2.3 Isolation transformer, 15 H
33、z to 250 kHz frequency range; 4:1 impedance ratio; secondary as connected shall be capable of handling the total lead (supply plus test signal) current flow without saturating the core. NOTE It has been verified that at least one commercially available 30 Hz to 250 kHz transformer satisfies the exte
34、nded frequency requirements of this part of ISO 11452. BS ISO 11452-10:2009ISO 11452-10:2009(E) ISO 2009 All rights reserved 36.2.4 Voltage measuring instrument, i.e. oscilloscope, a.c. voltmeter, or other suitable high impedance meter. 6.2.5 Current measuring instrument, i.e. negligible series impe
35、dance inducing probe with appropriate magnitude capability. NOTE A clip-on Hall effect probe is suitable. 6.2.6 The power supply defined in ISO 11452-1 shall be used for this test method. 6.2.7 A 100 F capacitor may be used (for lines other than power lines) to shunt the source end of the isolation
36、transformer to ground if difficulty is encountered in obtaining sufficient test voltage. Verification shall be made that desired signals are not excessively disturbed by the inclusion of the 100 F capacitor. 7 Test set-up The test set-up is shown in Figure 1. A d.c. power amplifier that satisfies th
37、e source impedance requirement of this part of ISO 11452 and can supply the power required by the DUT may be substituted for the power amplifier and isolation transformer for power supply lead testing. Key 1 audio oscillator 7 current probe 2 test wire 8 device under test (DUT) 3 connection to power
38、 supply or sensor or load 9 current measuring instrument 4 ground wire 10 power amplifier 5 capacitor (see 6.2.7) 11 isolation transformer 6 voltage measuring instrument Figure 1 Test set-up for measuring conducted immunity, 15 Hz to 250 kHz BS ISO 11452-10:2009ISO 11452-10:2009(E) 4 ISO 2009 All ri
39、ghts reserved8 Test method 8.1 General For the frequency range of this test, the impedances seen by the signal, load and power supply leads are generally known and can be treated as lumped constants. In this test, a wide range audio voltage source is coupled through a transformer in differential mod
40、e to each specified pin of the DUT. The signal source impedance must be low in comparison to the impedance of the circuit being tested. Experience has shown that a signal source impedance as defined in Clause 6 is adequate for the test. The DUT should be connected such that it will operate in its no
41、rmal manner. Actual loads and sources should be used where appropriate or may be simulated. Filters incorporated into DUTs may experience excessive and potentially damaging current flow. To prevent this type of over stress in the DUT, a current probe is included in the test set-up. The impedance cha
42、racteristics of the DUT line being tested may cause distortion to the test signal. This complicates the use of an a.c. voltmeter. A method of addressing this phenomenon is included in the test procedures. 8.2 Test plan Prior to performing the tests, a test plan shall be generated which shall include
43、: test set-up; frequency range; test frequencies or step sizes; DUT leads to be tested; DUT mode of operation; DUT acceptance criteria; test severity levels; DUT monitoring conditions; test report content. 8.3 Test procedure 8.3.1 Power supply voltage The system power supply voltage shall be set as
44、specified in the test plan and shall be measured at the DUT to account for voltage drop in the isolation transformer secondary winding. NOTE The voltage drop across the transformer secondary can become significant at higher currents. 8.3.2 Audio oscillator The audio oscillator shall be tuned through
45、 the required frequency range as specified in the test plan. BS ISO 11452-10:2009ISO 11452-10:2009(E) ISO 2009 All rights reserved 58.3.3 Test signal injection The injected signal level shall be progressively increased toward the level specified in the test plan. Alternatively, the test signal may b
46、e held at a specified test level and, if an effect on the DUT is detected, the test voltage reduced to determine the threshold. The lead current shall be simultaneously monitored to ensure that the injected test current does not exceed a root mean square current, Irms, of 1 A. 8.3.4 DUT monitoring T
47、he DUT shall be monitored for malfunction, degradation of performance or deviation of parameters beyond tolerances indicated in the apparatus specification or the test plan. 8.3.5 Test signal amplitude Where the impedance of the DUT lead causes significant distortion of the test signal, a suggested
48、method of measuring the amplitude of the test signal is to connect a 4 non-inductive load in place of the DUT lead. This will allow an accurate reading to be taken in the substitute configuration. Do not change the signal generator or amplifier controls when: substituting the DUT lead in place of th
49、e 4 resistor when setting the level; substituting the 4 resistor in place of the DUT lead when determining the threshold level. 8.3.6 Test signal frequency and threshold level The effects resulting from the injection of electromagnetic energy, the frequency and the threshold level shall be recorded. 8.4 Test report As required in the test plan, a test report shall be submitted detailing information regarding the test apparatus, test se