1、CECC CECC*30*801- BOL*ISSUE*2 92 m 1974499 0030493 454 m CECC 30801-801 CECC Frderverein fr Elektrotechnische Normung (FEN) e. V. Cenelec Electronic Components Committee Systeme Harmonis dAssurance de la Qualit des Composants Electroniques SPEC I FI CAT I ON PARTI C U LI ER E : CONDENSATEURS FIXES A
2、U SURFACE A ELECTROLYTE SOLIDE ET A ANODE POREUSE TANTALE POUR MONTAGE EN Harmonized System of Quality Assessment for Electronic Components DETAIL SPECIFICATION: FIXED TANTALUM SURFACE MOUNTING CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE Harmonisiertes Gtebesttigungssystem fr Bauelemente der Ele
3、ktronik BAUA RTS P EZ I FI KAT1 ON : OBERFLACH EN MONTI ERBARE TANTAL-FESTKON DENSATOREN MIT FESTEM ELEKTROLYT UND SINTERANODE Edition Issue 2 Ausgabe CECC 30801-801 1992 Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or network
4、ing permitted without license from IHS-,-,-CECC CECC*30*OL- 8OL*ISSUE*2 92 Informtion about the System may be obtahedfrm: FEN e.V. secretariat and CEcCGemalseaetariat GartenspaBe 179 D - 6ooo Tekphone: Int. + 49 69 639171 Telex: 4 032 175 cecc d Tele The document was originally drafted by members of
5、 CECC WG3 and discussed as document CECC(Heidecker) 1 A by WG3 at their meeting in Brussels with the decision to publish it without voting (Item 17,l). e To allow early publication, this detail specification is issued initially in English only. Corresponding versions in French and German will follow
6、 on request of 0“s. -1- CECC 30 801-801 (Issue 2) I Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-T I I CECC CECC*30*801- 8OL*ISSUE*2 92 II974499 0030496 Lb3 I I ! SAR?!ONISE
7、D DETAIL SPECIFICATION i ! CECC 30 801-801 B I Specification available from: i CECC General Secretariat I i ! ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITE: CECC 30 O00 Issue 3 1983 CECC 30 800 Issue 2 1990 Outline and dimensions First angle projection e-e Figure
8、1 i (Other shapes are permitted within the dimensions given) Marking information: See 1.5 Por details see Fiwe 2 and Table 1 ISSUE 2 1992 j MANUFACTURERS TYPE NUMBERS See CECC O0 20G For ordering information see 1.6 DETAIL SPECIFICATION FOR FIXED TANTALUM SURFACE MOUNTING CFSACITORS WITH SOLID ELECT
9、ROLYTE, POROUS ANODE POLAR SOLID ELECTROLYTE XETALLIC TIRMINATIONS STILE I - PROTECTED FOR SURFACE PIOUNTING ASSESSMENT LEVE,: E I i j QUICK REFEPEYCE DATA: I Rated caFacitance range Capaci taxe tolerance Rated voltage range Climatic cateqory I Perfcmance level l i i I C,1 to 100 pF -t IO%, -i- 20%
10、4 to 50 V d.c. 55/125/56 Lon5 life Information about manufacturers who have components qualified to this detail specification is available in the current CECC O0 200: Register of Firms, Products, and Services Approved under the CECC System. - 2- CECC 30 801-501 (Issue 2) Copyright CENELEC Electronic
11、 Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Fiqure 2 . Fi rst angle pro j ect i on: G- 41 31 I I - Notes: - For detaile0 dimensions see Table 1 - Dimensions in mm 1) Area on upper surface of the capac
12、itor to allow vacuum pick-up 2) Area to be examined after solderability 3) Substrate 4) Area for polarity mark 5) Dimension Wi applies to the shaded area 6) This notch is an optional feature. YI O A test only -3- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by
13、 IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*8OL- 8OL*ISSUE*2 92 W 1974499 0030498 T3b W 1 General data 1.1 Eethods of mow- For normal use the capacitors may be mounted by hand soldering, infrared soldering, wave solderin
14、g or condensation soldering. For tests carried out in accordance with Table 4B Group C3 the mounting shall be in accordance with 4.3 of CECC 30 800 using glass epoxy FR4 printed board 1,6 mm thick. 1.2 Dirnensi.0- Table 1 l I I I I ! 3,5+02. 2,8+0,2 i 1,9+0,2 2,20,1 1 0,8+0,3 i 1,4 j 0,7 I I I I I i
15、 I l iB i I j 6,OIOI3 i 3,2i0,3 i 2.,5+0,3 1 2,2?0,1 j I13+O,3 1 2,9 1 1,0 1 7,3+0,3 I 4,3I0,3 ! 2,8t0,3 2,.4?0,1 1,3+0,3 4,l 1,0 I ! 1 ! I i I IC i ID ! l I 1 l I Notes: Dimension VI applies over length Tmin. and A. The minimw, value specified for S inplies that the full ranges of tolerances for L
16、and A may not be simultaneously available. 1.3 Ratinqs an chargcteristics Capacitance range Tolerance 03 rated capacitance Rated voltage Cateqory voltage Climatic category Rated temperature variation of capacitance with temperature Tangent of loss angle Leakage current (pA) max. Impedance at 100 kHz
17、 and 20C Swqe voltage See Table 2A t lo%, t 20% See Table 2A See Table 2A 55/125/56 85“ C See Table 2B See Table 2B See Table 2B See TaHe 2C 1,3 UR or 1,3 Uc as applicable -4- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for R
18、esaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*801- 801*ISSUE*2 92 1974499 0030499 972 Table 2A Values of capxitance and voltage related to case size I 16 1 20 25 ! 35 I 50 1 i ! , ! I 6,3 10 I !Rated voltage IJR (V) 4 ! Category voltage Uc (V)! 2,s 4 i 6.3 j
19、10 13 I 16 23 i 33 I I j Rated capacitance (pF) i Case size -5- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i l I I i CECC CECC*30*BOL- BOL*ISSUE*
20、2 92 m It974499 0030500 414 m ! Table 2B Characteristics at low and high temperatures I 1 I i 0,5 5 1 0,5 5 6,3 I 6.3 I ! 4 ! 3,3 I O,. L O, 2 O I O109 0,06 0,072, 0,09 i i 10 i 12 ., 6,3 715 11 1 34 50 6,3 6f3 6,3 7f5 11 17 37 50 6,3 6,3 6,3 85 12 19 37 62 6,3 6,3 6,3 10 14 20 44 62 5,3 6,3 6,3 8,5
21、 11 17 37 55 i ! j 1 ! j 1 ! I i i I ! ! ! j ! i i i I ! i j j i 1 i ! ! ! I I ! v i i 0,5 5 G,6 6 0,9 9 i,3 13 2,7 27 4 40 0,5 5 0,5 5 0,5 5 0,5 6 0,9 9 1,4 14 3 30 4 40 0,5 5 0,5 5 0,5 5 0,7 7 1 10 1,5 15 3 30 5 50 0,5 5 0,5 5 0,5 5 0,8 8 1:1 11 1,6 16 3,5 35 5 50 0,5 5 0,5 5 0,5 5 0,7 7 Cf9 9 1,4
22、 14 3 30 4,4 44 Y i Y 0,11 0,08 O,!i 0,?4 ,O9 0,.06 0,072 009 1 i i j I j ! i I j i I i l ! ! j ! ! I i j 1 2,2 j 4,7 i 6,8 10 i 15 i i 33 I 47 LO i,u j 1,5 1 1 6,8 1 10 ! I 3,3 1 1 4,7 I i 22 1 33 1 I 0,.68/ 2,2 6,8 ! 15 i 22 1 l,o j 3,3 1 4,7 i i 0,06 0,04 0,06 0,09 0,09 0,06 0,072 0,09 I l I I !
23、i ! l i l j j i 1) Measured at category voltage See clause 1.9 -6- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*801- 801*ISSUE*2 92 m
24、1974499 0030501 350 m Table 2B (continued) Characteristics at low and hiqh temperatures Maximum values I I ! , UR j CR I - I : (V) (pF) , Capcitance change */ Tangent of loss anqle * (% ) I i -55C 85C 125C -55C 20C 85C 125C j 25 i 0147/ i O, 2 O, 2 O ! j 0,684 2 -10 i 10 i 12 ! ! 1,5 ! I 2,2 j ! 3,3
25、 I ! 4,7 I ! 10 i 6,8 I ! 15 j i ! I I 35 I 0,l ! ! 0,15 o 22 I i j 0,33 1 0,68 i ! 1,5 i I 1 6,8 ! ! 0.47 i 1 1-0 I I 2:2 I I 3,3 j 4,7 ! i 1 10 I I i 50 ! 0,l I I 0,15 i I 0,22 I 1,o i ! 2,2 i 3,3 ! I 1 4,7 i 1 ! 0,33 j 0:47 I ! 0,68 ! 1 1,5 i i I i I i 1 i I I i ! ! 1 ! i i I i ! ! ! j 1 I I ! i
26、I i , I I I t 0,06 0,.04 0,06 0,04 0,09 0,06 1 ! ! j I ! I I l I 1 Y* 0,06 0,04 i I I i I i 1 i 0,09 0,06 I i ! j i I i i I I 0,06 3,04 ! ! : i ! I ! i i 0:06 0,09 0,06 0,09 0,072 0,03 i ! I ! ! ! ,i I jcl 0,06 0,09 I i / I ! 1 1 l 1 G O, 72 0,09 I I / ! 1 I 1 ! ! i i ti 0,06 0,09 j ! i i ! ; I I I
27、i Leakage current“ (PA) 1) 20C 85C 125C 0,5 5 6,3 0,5 5 6,3 0,5 5 6,3 0,6 6 7,5 0,8 8 10 1,2 12 15 i,7 17 21 2,5 25 31 4 40 50 0,5 5 6,3 0,5 5 6,3 0,5 5 6.,3 0,5 5 6,3 0,5 5 6,3 ,5 5 6,3 0,5 5 6,3 0,5 5 6,3 5,8 8 10 1,2 12 15 1,6 16 20 2,4 24 30 3,5 35 44 0,5 5 6,3 0,5 5 6,3 0,s 5 6,3 0,5 5 6,3 0,5
28、5 6,3 0,5 5 6,3 0,5 5 6,3 0,8 8 10 1,i li 14 i,7 17 21 2,4 24 30 1) Measured at category voltage See clause 1.9 . .- I .- -7- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted witho
29、ut license from IHS-,-,-CECC CECC*30*801- 801*ISSUE*2 92 1974499 0030502 297 I I i I I I I m b 8 b 8 B b D Table 2C Maximum impedance at 100 kHz and 20C I Rated capacitance (pF)j max. impedance (8) -8- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under
30、license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*8OL- 8OL*ISSUE*2 92 W 1974497 0030503 I123 1.4 Related documents Generic specification CECC 30 O00 Issue 3, Amdts 1 to 5 Sectional specification CECC 30 803 Issue 2, 1990 1.5 Markinu Mzrk
31、ing of the capacitor, as a minimum, shall comprise items i), 2) and 3) froin the list below. The package containing the capacitors shall be clearly marked with all the information listed below except 1). 1) Polarity of terminations (unless identified by the construction) 2) Rated capacitance 3) Rate
32、d voltage 4) Tolerance on rated capaciLLance 5) Style 6) Year and month (or week) of manufacture 7) Manufacturers name a?o/or trade mark 8) Climatic category 9) Manufacturers type designation 10) Reference to this detail specification Where tape packaging is used it should comply with IEC 286-3. 1.6
33、 Orderinq information Orders for capacitors covered by this specification shall contain, in clear or coded form,. the fdlowinq minimum information: (1) Rated capacitance (2) Tolerance on rated capacitance (3) Rated voltage (d.c.) (4) Number and issue reference of detail specification and case size r
34、eference (5) Packagiw (bulk or taped; if taped, according to IEC 286-3) 1.7 Ce-rtif ied teerecords Not required. -9- CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without licens
35、e from IHS-,-,-CECC CECC*30*8OL- 8OL*ISSUE*2 92 1974499 0030504 ObT 1.8 Ad.ditior!al Information (not for inspection purposes) Reliability: Failure rate 0,01% over 100 O00 h at 0,s UR and 40 OC. Ratio catastrophic / parametric: 50/50 Failure criteria: Catastrophic: Short circuit or cpen circuit Para
36、metric: AC/C outside 3 times the I, 10 Ir, (Ira = initial limit in TaSle 2B) 2 3 times initial limit in Table 2C applicable tolerance These data refer to OPC, 0,s times rated voltage an (See Note 2) I i l i i Sub- Group Al I 1 s-4 I , j j i4.4 Visual examination j Dimensions ! ! I I jSUb-Group A2 i
37、Non-destructive l i current Iresictor: I i !4.5.2 Capacitance #Frequency 120 Hz j j i i 1 4.5.3 Tangen r (See Note 1) I I I. I I As in 4.4.2 Marking legible, see 1.5 I See Table 1 of this detail specification See Table 2B of this detail specification * Within the specified tolerance See Table 2B of
38、this detail specification * %e Table 2C of this j detail specification t 2,5 I i i I i 1 i !As in 4.7.2 I CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-
39、,-,-CECC CECC*30*OL- BOLtISSUEt2 92 D 1974499 003050b 932 D Table 4B Peridic tests !clause ne land test ! I (See Note i) ! 1 Conditioas of test I See Note 1) I ! sub- Group c1 ! i 4.6.1 Initial measurement 4.5 Resistance to soldering heat 4.6.3 Final measurement I I I l ISub-Group C2 4.9 Substrate b
40、ending test Destructive Capacitance Method 1 Immersion time: 10s Recovery time: 22 k-26 h Visual examination Capacitance Tangent of loss angle Destruct ive Capacitance (during last bend) Eeflection: 3 mm Nmber of Sends: 3 i I Visual examination Destxct ive ! I 14.3 Mounting Visu? examination I Leaka
41、qe current I (see 1.1 of this Oetaii specification! I ! ! Capacitance i I I I hb-(jroup c3 I I i i l I !Tangent of loss ansle i l ! Impedance at 20“ C ! I J ln IC !Performance requirements i I 1 Note 3) I ! 1 I (See Note 1) (see l I 1 I i ! 1 For reference I/ ! I I I i As in 4.6.3 I /C/C/ L 3% of va
42、lue 1 measure in 4.6.1: See Table 2B of this detail specification ;/c/c; L 3% I- No visible damage No visiSie roup c3.1 4.8 Shear test 4.10.1 Initial I measurement 14.10 Rapid change of I temperature ! 14.10.3 Final I ! i I measurement I !.?.II Climatic sequence i 14.11.1 Intermediate measurement !
43、I I 4.11.2 Dry heat 4.11.3 Damp heat cyclic, first cycle 0.11.4 Cold 4.11.5 Damp heat cyclic, rema in i ng cycles 4.11.6 Final measurement 1 Destructive 16 Ivisual examination 1 I I I I !Not required, /see Group C3 j5 cycles TA = -55C ITB = 125“ C !hation: 30 min !Recovery: 1 h to 2 h I I Leakage cu
44、rrent j I Capacitance ! i !Tangent of loss anqle 1 I I /Not required I ! i Temperature : 125“ C !Duration: 16 h j I I Temperature : -55“ C Duration: 2 h Recovery: 1 h to 2 h Visual examination Leakage current See clause 1.9 /- - 13 - - 181 1 l ! i 1 i Performance requirements (See Note lj I No visib
45、le damage See T&le 2B of &his ietail specification 1 /C/C/ i 5% of the value measure6 in Group CI %e Table 2B of &is ietil specification Yo visible damage larking legible See Table 2B of this ietail specification I CECC 30 801-801 (Issue 2) Copyright CENELEC Electronic Components Committee Provided
46、by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*801- Clause number and test (See Note 1) Sub-Group C3.2 4.12 Damp heat 4.12.1 Initial steady state measuremefit 801*ISSUE*2 92 m 1974479 0030508 705 m Table 43 Periodic tests
47、 Conditions of test (See Note 1) Capac i tame Tangent of loss angle Destructive 56 %YS Recovery: 1 h to 2 h Not required, see -roup C3 P Visual examination I measurement I I I. !i jji Ilj i !Leakage current ! ! ! III i iiI I Capacitance ! I * See clause 1.9 Tangent of loss angle ! Destructive Durati
48、on: 2000 h 12 srecimecs at UR and 85“ C, 12 speciniens at Uc and 125C Recovery: 1 h to 2 h Not required, see Group C3 Visual examination Leakage current Capacitance - 14 - ! i -A- 3 124 I : i I i I i ! i i j ! l l i l i ! i I l I I Performance requirements I (See Note 1) i /C/C1 L 5% of value I measured in 4.10.3 *! i I i , I- i 1,2 times limit in TaSle 2B of this detail specification I -_I I i i ! No visible damage Marking legi3le See Table 2B of this detail specification ! /C/Ci i 5% GE valile I- measured in Group C3 * i 1,2 times limit in TaM
