CISPR 16-2-1-2014 Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-1 Methods of measurement of disturbances and immunity - Conducted distur.pdf

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1、 Specification for radio disturbance and immunity measuring apparatus and methods Part 2-1: Methods of measurement of disturbances and immunity Conducted disturbance measurements Spcifications des mthodes et des appareils de mesure des perturbations radiolectriques et de limmunit aux perturbations r

2、adiolectriques Partie 2-1: Mthodes de mesure des perturbations et de limmunit Mesures des perturbations conduites CISPR 16-2-1 Edition 3.0 2014-02 INTERNATIONAL STANDARD NORME INTERNATIONALE CISPR 16-2-1:2014-02(en-fr) INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INTERNATIONAL SPCIAL

3、DES PERTURBATIONS RADIOLECTRIQUES BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form o

4、r by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this

5、publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectron

6、ique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou

7、contactez le Comit national de lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization tha

8、t prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might h

9、ave been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC pub

10、lications search - www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up

11、 to date on all new IEC publications. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions i

12、n English and French, with equivalent terms in 14 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 55 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions cl

13、ause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Se

14、rvice Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications IEC Le conten

15、u technique des publications IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques sur les Normes

16、 internationales, Spcifications techniques, Rapports techniques et autres documents de lIEC. Disponible pour PC, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de

17、 rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en li

18、gne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 14 langues additionnelles. Egalement app

19、el Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary Plus de 55 000 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures ex

20、traites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. CISPR 16-2-1 Edition 3.0 2014-02 INTERNATIONAL STANDARD NORME INTERNATIONALE I

21、NTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XE ICS 33.100.10, 33.100.20 PRICE CODE CODE PRIX ISBN 978-2-8322-1445-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Mak

22、e sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. Specification for radio disturbance and immunity measuring apparatus and methods Part 2-1: Methods of measurement of disturbances

23、 and immunity Conducted disturbance measurements Spcifications des mthodes et des appareils de mesure des perturbations radiolectriques et de limmunit aux perturbations radiolectriques Partie 2-1: Mthodes de mesure des perturbations et de limmunit Mesures des perturbations conduites INTERNATIONAL SP

24、ECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INTERNATIONAL SPCIAL DES PERTURBATIONS RADIOLECTRIQUES BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM colourinside 2 CISPR 16-2-1:2014 IEC 2014 CONTENTS FOREWORD . 8 1 Scope 10 2 Normative references 10 3 Terms, definitions and abbreviations . 11 3.

25、1 Terms and definitions . 11 3.2 Abbreviations . 16 4 Types of disturbance to be measured 17 4.1 General 17 4.2 Types of disturbance 17 4.3 Detector functions 17 5 Connection of measuring equipment 18 5.1 General 18 5.2 Connection of ancillary equipment . 18 5.3 Connections to RF reference ground 18

26、 5.4 Connection between the EUT and the artificial mains network 19 6 General measurement requirements and conditions 20 6.1 General 20 6.2 Disturbance not produced by the equipment under test 20 6.2.1 General 20 6.2.2 Compliance testing . 20 6.3 Measurement of continuous disturbance 20 6.3.1 Narrow

27、band continuous disturbance . 20 6.3.2 Broadband continuous disturbance . 20 6.3.3 Use of spectrum analyzers and scanning receivers . 21 6.4 EUT arrangement and measurement conditions . 21 6.4.1 EUT arrangement . 21 6.4.2 Normal load conditions . 23 6.4.3 Duration of operation 23 6.4.4 Running-in/wa

28、rm-up time 23 6.4.5 Supply 24 6.4.6 Mode of operation . 24 6.4.7 Operation of multifunction equipment 24 6.4.8 Determination of EUT arrangement(s) that maximize(s) emissions . 24 6.4.9 Recording of measurement results 24 6.5 Interpretation of measuring results . 24 6.5.1 Continuous disturbance 24 6.

29、5.2 Discontinuous disturbance 25 6.5.3 Measurement of the duration of disturbances 25 6.6 Measurement times and scan rates for continuous disturbance 25 6.6.1 General 25 6.6.2 Minimum measurement times . 25 6.6.3 Scan rates for scanning receivers and spectrum analyzers . 26 6.6.4 Scan times for step

30、ping receivers . 27 6.6.5 Strategies for obtaining a spectrum overview using the peak detector 28 CISPR 16-2-1:2014 IEC 2014 3 6.6.6 Timing considerations using FFT-based instruments . 31 7 Measurement of disturbances conducted along leads, 9 kHz to 30 MHz 33 7.1 General 33 7.2 Measuring equipment (

31、receivers, etc.) . 33 7.2.1 General 33 7.2.2 Use of detectors for conducted disturbance measurements 33 7.3 Ancillary measuring equipment 34 7.3.1 General 34 7.3.2 Artificial networks (ANs) . 34 7.3.3 Voltage probes . 34 7.3.4 Current probes . 35 7.4 Equipment under test configuration 35 7.4.1 Arran

32、gement of the EUT and its connection to the AN 35 7.4.2 Procedure for the measurement of unsymmetric disturbance voltages with V-networks (AMNs) . 40 7.4.3 Measurement of common mode voltages at differential mode signal terminals 47 7.4.4 Measurements using voltage probes . 48 7.4.5 Measurement usin

33、g a capacitive voltage probe (CVP) 51 7.4.6 Measurements using current probes . 51 7.5 System test configuration for conducted emissions measurements 51 7.5.1 General approach to system measurements . 51 7.5.2 System configuration 52 7.5.3 Measurements of interconnecting lines . 54 7.5.4 Decoupling

34、of system components 55 7.6 In situ measurements . 55 7.6.1 General 55 7.6.2 Reference ground . 55 7.6.3 Measurement with voltage probes . 56 7.6.4 Selection of measuring points . 56 8 Automated measurement of disturbances 56 8.1 Precautions for automating measurements. 56 8.2 Generic measurement pr

35、ocedure . 57 8.3 Prescan measurements . 57 8.4 Data reduction . 58 8.5 Disturbance maximization and final measurement 58 8.6 Post processing and reporting 59 8.7 Disturbance measurement strategies with FFT-based measuring instruments 59 9 Test set-up and measurement procedure using the CDNE in the f

36、requency range 30 MHz to 300 MHz . 59 9.1 General 59 9.2 Test set-up 60 9.3 Measurement procedure 62 Annex A (informative) Guidelines for connection of electrical equipment to the artificial mains network 63 A.1 General 63 A.2 Classification of the possible cases 63 A.2.1 Well-shielded but poorly fi

37、ltered EUT (Figures A.1 and A.2) 63 4 CISPR 16-2-1:2014 IEC 2014 A.2.2 Well-filtered but incompletely shielded EUT (Figures A.3 and A.4) 64 A.2.3 Practical general case 64 A.3 Method of grounding 66 A.4 Conditions of grounding . 66 A.4.1 General 66 A.4.2 Classification of typical testing conditions

38、. 67 A.5 Connection of the AMN as a voltage probe 68 Annex B (informative) Use of spectrum analyzers and scanning receivers . 70 B.1 General 70 B.2 Overload 70 B.3 Linearity test 70 B.4 Selectivity 70 B.5 Normal response to pulses . 70 B.6 Peak detection . 70 B.7 Frequency scan rate 71 B.8 Signal in

39、terception . 71 B.9 Average detection 71 B.10 Sensitivity 71 B.11 Amplitude accuracy 72 Annex C (informative) Decision tree for use of detectors for conducted disturbance measurements 73 Annex D (informative) Scan rates and measurement times for use with the average detector 75 D.1 General 75 D.2 Su

40、ppression of impulsive disturbance 75 D.2.1 General 75 D.2.2 Suppression of impulsive disturbance by digital averaging 76 D.3 Suppression of amplitude modulation . 76 D.4 Measurement of slowly intermittent, unsteady or drifting narrowband disturbances 76 D.5 Recommended procedure for automated or se

41、mi-automated measurements . 78 Annex E (informative) Guidelines for the improvement of the test set-up with ANs . 79 E.1 In situ verification of the AN impedance and voltage division factor 79 E.2 PE chokes and sheath current absorbers for the suppression of ground loops 82 Annex F (normative) Deter

42、mination of suitability of spectrum analyzers for compliance tests . 84 Annex G (informative) Basic guidance for measurements on telecommunications ports . 85 G.1 Limits . 85 G.2 Combination of current probe and capacitive voltage probe (CVP) . 86 G.3 Basic ideas of the capacitive voltage probe 86 G

43、.4 Combination of current limit and voltage limit . 87 G.5 Adjusting the TCM impedance with ferrites 89 G.6 Ferrite specifications for use with methods of Annex H 89 Annex H (normative) Specific guidance for conducted disturbance measurements on telecommunication ports . 92 H.1 General 92 CISPR 16-2

44、-1:2014 IEC 2014 5 H.2 Characteristics of AANs . 93 H.3 Characteristics of current probe . 94 H.4 Characteristics of capacitive voltage probe 94 H.5 Procedures for common mode measurements 94 H.5.1 General 94 H.5.2 Measurement procedure using AANs 94 H.5.3 Measurement procedure using a 150 load conn

45、ected to the outside surface of the cable screen 95 H.5.4 Measurement procedure using a combination of current probe and capacitive voltage probe 96 H.5.5 Measurement of cable, ferrite and AE common mode impedance 97 Annex I (informative) Examples of AANs and ANs for screened cables 99 Bibliography

46、108 Figure 1 Example of a recommended test set-up with PE chokes with three AMNs and a sheath current absorber on the RF cable . 19 Figure 2 Measurement of a combination of a CW signal (“NB”) and an impulsive signal (“BB”) using multiple sweeps with maximum hold 28 Figure 3 Example of a timing analy

47、sis 29 Figure 4 A broadband spectrum measured with a stepped receiver 30 Figure 5 Intermittent narrowband disturbances measured using fast short repetitive sweeps with maximum hold function to obtain an overview of the disturbance spectrum . 30 Figure 6 FFT scan in segments 32 Figure 7 Frequency res

48、olution enhanced by FFT-based measuring instrument 32 Figure 8 Illustration of current ICCM35 Figure 9 Test configuration: table-top equipment for conducted disturbance measurements on power mains . 37 Figure 10 Arrangement of EUT and AMN at 40 cm distance, with a) vertical RGP and b) horizontal RGP

49、 38 Figure 11 Optional example test configuration for an EUT with only a power cord attached . 38 Figure 12 Test configuration: floor-standing equipment (see 7.4.1 and 7.5.2.3) 39 Figure 13 Example test configuration: floor-standing and table-top equipment (see 7.4.1 and 7.5.2.3) . 40 Figure 14 Schematic of disturbance voltage measurement configuration (see also 7.5.2.3) . 42 Figure 15 Equivalent circuit for meas

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