1、 MIL-STD-1311D 19 April 2011 _ SUPERSEDING MIL-STD-1311C 31 January 2001 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR ELECTRON TUBES AMSC N/A FSC 5960 INCH - POUND Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1311D ii FOREWO
2、RD 1. This Department of Defense Standard is approved for use by all Departments and Agencies of the Department of Defense. 2. Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime VAT, P.O. Box 3990, Columbus, OH 43218-3900, or emailed to TubesAmpsdla.mil
3、. Since this contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https:/assist.daps.dla.mil. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1311D iii Paragraph P
4、age 1. SCOPE . 1 1.1 Scope. 1 2. APPLICABLE DOCUMENTS 1 2.1 General . 1 2.2 Government documents . 1 2.3 Non-Government publications 2 2.4 Order of precedence 2 3. DEFINITIONS . 2 4. GENERAL REQUIREMENTS . 2 4.1 Numbering system . 2 4.2 Methods of reference . 3 4.3 Order of precedence 3 4.4 Obsolesc
5、ent test methods 3 4.5 Destructive tests . 3 4.6 Alternate test methods . 3 4.7 Additional testing 3 4.8 General test conditions . 3 4.9 Microwave tube test setup instructions and precautions . 5 4.10 Phototube test instructions . 6 4.11 Life-test conditions . 6 4.12 Definitions and instructions for
6、 pulse modulators and pulse diodes 7 4.13 Definitions for cathode-ray charge storage tubes 13 5. DETAILED REQUIREMENTS . 14 6. NOTES . 14 6.1 Metric equivalents . 14 6.2 Subject term (key word) listing . 14 6.3 Changes from previous issue. 14 INDEXES Alphabetical Index . 15 Numerical Index of Test M
7、ethods 22 APPENDIX Test methods 28 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1311D 1 1. SCOPE 1.1 Scope. This standard establishes uniform methods for testing the environmental, physical, and electrical characteristics of electron tubes
8、 as required by MIL-PRF-1 and the applicable tube specification sheet (TSS). Unless otherwise specified or authorized, tests are to be conducted as specified herein (see 4.6). 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4 or 5 of this standa
9、rd. This section does not include documents cited in other sections of this standard or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of docu
10、ments cited in sections 3, 4, or 5 of this standard, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specifie
11、d, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-1 - Electron Tubes, General Specification for. MIL-DTL-75 - Electron Tubes, Packaging of. MIL-PRF-22684 - Resistors, Fixed, Film (Insulated), General Specification for. DEPA
12、RTMENT OF DEFENSE STANDARDS MIL-STD-188-200 - System Design and Engineering Standards for Tactical Communications. MIL-STD-202 - Test Method Standard Electronic and Electrical Component Parts. (Copies of these documents are available online at https:/assist.daps.dla.mil or from Standardization Docum
13、ent Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2.2 Other Government documents, drawings, and publications. The following other Government documents, drawings, and publications form a part of this document to the extent specified herein. Unless otherwise specified, t
14、he issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE DRAWINGS 123-JAN - Bump Test Equipment. 180-JAN - High Impact (Fly Weight) Shock Machine for Electronic Devices Bill of Materials. 182-JAN - Acoustic Chamber for AF Noise and Microphonics Test. 184-JA
15、N - End-Grip Retainer for Impact Testing of Miniature and Sub-Miniature Electron Tubes. 194-JAN - Noise and Microphonics Test Set. 200-JAN - Deflection Cone for Miniature Tube Base Strain Test. 216-JAN - Tube Clamps and Adapter Rings (for Impact Tests). 244-JAN - 900-Megacycle and Resonant Frequency
16、 Test Equipment. 245-JAN - Holder for Glass Strain Testing of Miniature and Subminiature Tubes. (Copies of specifications, standards, drawings, and publications required by suppliers in connection with specific acquisition functions should be obtained from the acquiring activity or as directed by th
17、e contracting officer. JAN and DLA Land and Maritime drawings are available from TubesAmpsdla.mil or from DLA Land and Maritime -VAT, P.O. Box 3990, Columbus, Ohio 43218.) DEPARTMENT OF DEFENSE REPORTS Measuring Light Output of Cathode Ray Tube Screens. (Primary Standard replica lamps; ref. Method 5
18、221) Material Laboratory (Naval) Final Report, 5032-B15.40. Specification Development and Technical Evaluations of Types 3ACP19 and 12SP25 Cathode Ray Tubes. (Light output measurements for P19 and P25 phosphors; ref. Method 5221) Material Laboratory (Naval) Final Report, 5032-B-15.91. (Copies requir
19、ed by suppliers in connection with specific acquisitions may be obtained from SPACE AND NAVAL WARFARE SYSTEMS COMMAND, 4301 Pacific Highway, San Diego, CA 92110-3127.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1311D 2 2.3 Non-Government
20、 publications. The following documents form a part of this standard to the extent specified herein. Unless otherwise indicated, the issue in effect on date of invitation for bids or request for proposal applies. NATIONAL CONFERENCE OF STANDARDS LABORATORIES (NCSL) NCSL-Z540.3 - Laboratories, Calibra
21、tion, and Measuring and Test Equipment (DoD adopted). (Copies are available online at http:/www.ncsli.org or from National Conference of Standards Laboratories NCSL, 2995 Wilderness Place Suite 107, Boulder, Colorado 80301-5405.) ELECTRONIC COMPONENTS ASSOCIATION (ECA) EIA-256-A - Deflecting Yokes f
22、or Cathode Ray Tubes. EIA-501-A - Recommended Practice for the Measurement of X-Radiation from Raster-Scanned Direct- View Data Display Cathode-Ray Tubes. EIA-502-A - Recommended Practice for Measurement of X-Radiation from Non-Raster-Scanned Direct- View Cathode Ray Tubes. EIA-503-A - Recommended P
23、ractice for Measurement of X-Radiation from Direct-View Television Picture Tubes. EIA-191-D - Measurement of Direct Interelectrode Capacitances of Electron Tubes. EIA-209-A - Electron Tubes Supplement 1- 1965; Supplement 2 - 1968 R (1976). (Copies of these documents are available online at http:/ec-
24、central.org or from Electronic Components Association, 2500 Wilson Boulevard, Suite No. 310, Arlington, VA 22201.) 2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein (except for relat
25、ed specification sheets), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. DEFINITIONS For the purpose of this standard, the abbreviations, symbols, and definitions are specifie
26、d in appendices A and B of MIL-PRF-1. 4. GENERAL REQUIREMENTS 4.1 Numbering system. The test methods are designated by numbers assigned in accordance with the following system. 4.1.1 Category of tests. Each test method is designated by a four-digit number, with significance, assigned in accordance w
27、ith the following criteria: a. Category of tubes Numerical series (first digit) General (tests applicable to more than one tube category) 1000 to 1999 Receiving, transmitting, and power 2000 to 2999 Cold cathode, corona and glow discharge voltage regulators, graphic indicator, ignitron pulse modulat
28、ors, and thyratrons . 3000 to 3999 Crossed field, gas switching, klystrons, magnetrons, M-backward wave, O-type backward wave, and traveling-wave tubes . 4000 to 4999 Cathode ray, cathode-ray charge storage, phototubes, image orthicons, and vidicons 5000 to 5999 Radiation counter 6000 to 6999 b. Wit
29、hin the above series, numbers will be assigned as follows: Category of tests Last three digits of series Environmental/Mechanical (physical) . 001 to 199 Electrical 200 to 499 Life 500 to 699 4.1.2 Revisions. Revisions to test methods will be indicated by a capital letter following the method number
30、. For example, the first revision of method 1001 will be 1001A. Letters I and O will not be used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1311D 3 4.2 Methods of reference. Applicable test methods contained herein shall be referenced o
31、n the TSS by specifying the method number of this standard and details required by the test method. Applicable methods shall be referenced without specifying a revision letter. Paragraph numbers within test methods shall not be referenced. If a particular paragraph(s) is applicable, the title shall
32、be specified. 4.3 Order of precedence. Unless otherwise specified, in the event of conflict between this standard and the tube specification sheet (TSS), the latter shall govern (see MIL-PRF-1, paragraphs 2.4, 3.1.1 and A.2.4, Order of precedence.) 4.3.1 Quantity measurement. When it is stated in an
33、y test method that a quantity is to be measured, it is implied that the measurement, after application of any necessary correction factors or calculations, is to be within the limits specified on the TSS, or herein. Consequently, the words “. . . and shall be within the limits specified . . .“ are f
34、requently implied but not stated, to avoid constant repetition. 4.3.2 Parameter values. Where any specific value or limit for a parameter is stated herein, the TSS may specify a different value, for good reasons; such value will automatically govern, in accordance with MIL-PRF-1 order of precedence
35、provisions. Consequently the words “. . . or the specified value . . .“ are frequently implied but not stated, to avoid constant repetition. In the interests of standardization, TSSs should not adopt different values of such parameters without good reason. 4.4 Obsolescent test methods. Test methods
36、labeled “OBSOLESCENT“ are retained in this standard because they are specified on TSSs for a limited number of older tubes. Obsolescent methods shall not be specified on new TSS. If a similar measurement is required for new tube types, a new test method will be prepared under a different number, ref
37、lecting current practice. Obsolescent methods will be deleted from this standard when no further requirements exist. 4.5 Destructive tests. Tubes subjected to a destructive test (see MIL-PRF-1, para. 4.1) shall not be delivered on the contract or order. The manufacturer has the option of using diffe
38、rent or the same sample tubes when more than one destructive test is required. Tubes subjected to deteriorating tests, such as environmental, physical, or life tests, which have electrical tests specified as end-point limits, shall conform to the initial limits for those electrical tests, prior to b
39、eing subjected to deteriorating tests. 4.6 Alternate test methods. An alternate test method may be substituted for a method specified herein provided it is demonstrated to the qualifying Government activity that there is adequate correlation between the results of the manufacturers test method and t
40、he test method specified herein, and provided that such substitution in no manner relaxes the requirements of MIL-PRF-1 and of this standard. The schematic diagrams and description of the test equipment to be used, shall be made available for review by the qualifying activity (DLA Land and Maritime-
41、VQE, P.O. Box 3990, Columbus, OH 43218). 4.7 Additional testing. The manufacturer may make such additional tests as he may deem necessary to insure proper control of his product. 4.8 General test conditions. 4.8.1 Order of testing. Conformance inspection tests may be conducted in any order, at the d
42、iscretion of the manufacturer. For qualification testing (verification), the following tests, when specified, shall be performed after all other tests in any sequence: bump, emission, pulse cathode current, rough handling (formerly drop test), shock, and vibration. 4.8.2 Ambient conditions. Unless o
43、therwise specified, test temperature, relative humidity, and atmospheric pressure conditions shall be in accordance with GENERAL REQUIREMENTS of MIL-STD-202. 4.8.3 Calibration of measuring and test equipment. Calibration and certification procedures for standards and instruments used to test and mea
44、sure completely assembled electron tubes acquired in accordance with MIL-PRF-1, shall be as specified in NCSL-Z540.3. In addition, the following requirements shall apply: a. The accuracy of a calibrating instrument shall be at least four times greater than that of the item being calibrated. b. Calib
45、ration intervals shall be established on the basis of stability, purpose, and degree of usage for the standards and instruments and shall not exceed a 1-year interval except as indicated below. Intervals shall be shortened as required to assure continued accuracy, as evidenced by the results of prec
46、eding calibrations, and may be lengthened only when the results of previous calibrations provide definite indications that such action will not adversely effect the accuracy of the system. The individual changes shall be approved by the qualifying activity (DLA Land and Maritime-VQE, P.O. Box 3990,
47、Columbus, OH 43218). 4.8.4 Accuracy of measurements. The specified limits are for values obtained with the specified test conditions and measuring equipment of accuracy consistent with general industry practice and calibrated in accordance with NCSL-Z540.3. Allowances are made for normal distributio
48、n and measuring instrument accuracy in establishing test specification sheet test conditions and test limits. Accuracy of measurements shall be appropriate to the test parameter(s) being measured and specific point instrument calibrations may be utilized when better accuracy than that specified and
49、maintained for the basic measuring instrument is desired. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-STD-1311D 4 4.8.5 Holding periods. After completion of all manufacturing processes through final pinch-off of the vacuum envelope, the tube shall be held non-operating for minimum periods a
