1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I; For the power dissipation (PD) test, combined subgroup 1 with subgroups 2 and 3 for pre-irradiation testing with the maximum limit of 20 W. Paragraph 4.3.5 table for the single event upset survival level (LET) changed the units from “MeV
2、“ to “MeV-cm2/mg“. Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 12-03-01 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLU
3、MBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert M. Heber MICROCIRCUIT, HYBRID, LINEAR, 15 VOLT, DUAL CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE
4、 DRAWING APPROVAL DATE 08-10-08 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-06224 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E229-12Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06224 DLA LAND AND MAR
5、ITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or I
6、dentifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 06224 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1
7、.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device
8、. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SMRT2815D DC-DC converter, 35 W, 15 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance lev
9、el. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available.
10、 This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screenin
11、g and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G)
12、 with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified qual
13、ity class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06224 DLA LAND AND MAR
14、ITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 12 Flange mount 1.2.5 Lead finish. The lead finish
15、shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) -0.5 V dc to +80 V dc Power dissipation (PD) . 20 W Output power . 35 W Lead soldering temperature (10 seconds) . +300 C Storage temperature range -65 C to +150 C 1.4 Recommended operating conditions.
16、Input voltage range (VIN) +19 V dc to +56 V dc Case operating temperature range (TC) . -55 C to +125 C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rads(Si)/s): Device type 01 (RHA levels P, R, and F) . 300 krads(Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, sta
17、ndards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybr
18、id Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780
19、 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between th
20、e text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to
21、 the device. Input voltage transients between 56 V to 80 V are allowed for no more than 120 milliseconds. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose ra
22、te effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rads(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUI
23、T DRAWING SIZE A 5962-06224 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance wi
24、th MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance
25、requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction,
26、and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiati
27、on exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristic
28、s are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s).
29、 Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the
30、 device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guar
31、anteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to suppl
32、y to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-3853
33、4 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM
34、plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained
35、 by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent spe
36、cified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of th
37、e manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06224 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteris
38、tics. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTVOUTIOUT= 1.17 A 1 01 14.85 15.15 V 2,3 14.70 15.30 P,R,F 1,2,3 14.48 15.53 Output current IOUTVIN= 19 V dc
39、, 28 V dc, and 1,2,3 01 1.17 A 50 V dc P,R,F 1,2,3 1.17 Output ripple voltage VOUTVRIPIOUT= 1.17 A, B.W. 20 MHz 1 01 140 mVp-p 2,3 180 P,R,F 1,2,3 250 Line regulation VOUTVRLINEIOUT= 1.17 A, VIN= 19 V dc to 50 V dc 1,2,3 01 30 mV P,R,F 1,2,3 60 Load regulation VOUTVRLOADIOUT= 0 to 1.17 A, both outpu
40、ts changed 1,2,3 01 40 mV simultaneously P,R,F 1,2,3 60 Input current IINIOUT= 0, Inhibit (pin) 3 = 0 V dc (tied to pin 2) 1,2,3 01 50 mA P,R,F 1,2,3 60 IOUT= 0, Inhibit (pin) 3 = 1,2,3 110 open P,R,F 1,2,3 120 Input ripple current 3/ IRIPIOUT= 1.17 A, 1,2,3 01 50 mAp-p B. W. 20 MHz P,R,F 1,2,3 60 S
41、ee footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06224 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performan
42、ce characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Efficiency Eff IOUT= 1.17 A 1 01 76 % 2,3 75 P,R,F 1,2,3 72 Isolation ISO Input to either output or
43、to sync return, or any pin to case at 500 V dc, 1 01 100 MW TC= +25 C P,R,F 1 100 Capacitive load 4/ 5/ VOUTCLNo affect on dc 4 01 5000 mF performance, TC= +25 C P,R,F 4 5000 Power dissipation PDShort circuit on both outputs simultaneously: PD= PIN- total POUT 1,2,3 01 20 W P,R,F 1,2,3 22 Switching
44、frequency FSIOUT= 1.17A 4,5,6 01 270 330 kHz P,R,F 4,5,6 270 330 External sync range 6/ FSYNCIOUT= 1.17 A, TTL level to 4,5,6 01 270 330 kHz pin 4 P,R,F 4,5,6 270 330 Output response to step load transient 7/ VOUTVOTLOAD50 percent load to/from 100 percent load; balanced4,5,6 01 575 mV pk loads on ea
45、ch output P,R,F 4,5,6 1000 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06224 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 T
46、ABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Recovery time from step load transient 7/ 8/ VOUTTTLOAD50 percent load t
47、o/from 100 percent load; balanced4,5,6 01 3 ms loads on each output P,R,F 4,5,6 4 Output response to step line transient 5/ 9/ VOUTVOTLINEIOUT= 1.17 A, Input step 19 V dc to/from 50 V dc 4,5,6 01 700 mV pk P,R,F 4,5,6 1400 Recovery time from step line transient 5/ 8/ 9/ VOUTTTLINEIOUT= 1.17 A, Input
48、 step 19 V dc to/from 50 V dc 4,5,6 01 4 ms P,R,F 4,5,6 5 Start up overshoot VOUTVtonOSIOUT= 1.17 A, VIN= 0 to 4,5,6 01 150 mV pk 28 Vdc P,R,F 4,5,6 250 Start up delay 10/ VOUTTonDIOUT= 1.17 A, VIN= 0 to 28 V dc 4 01 20 ms 5,6 25 P,R,F 4,5,6 30 Load fault recovery 5/ 8/ VOUTTrLFIOUT= from S.C. to 1.17 A 4,5,6 01 25 ms P,R,F 4,5,6 30 1/ Post irradiation testing shall be in accordance with paragraph 4.3.5 herein. 2/ These parts may be dose rate sensitive in a space env
