1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 10. Table II, add note to Group C end-point test parameters. -gz 09-07-17 Charles F. Saffle B Add case outline M. Paragraph 1.5, add “ “ to 300 Krads (Si). (2 places) -gz 11-04-11 Charles F. Saffle REV SHET REV B B B B B B B SHEET
2、 15 16 17 18 19 20 21 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR US
3、E BY ALL DEPARTMENTS APPROVED BY Joseph D. Rodenbeck MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 09-04-28 LOW DROPOUT, ADJUSTABLE AND FIXED VOLTAGE REGULATOR AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-09216 SHEET 1 OF 21 DSCC FOR
4、M 2233 APR 97 5962-E290-11Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09216 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing
5、documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PI
6、N. 1.2 PIN. The PIN shall be as shown in the following example: 5962 F 09216 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness ass
7、urance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device types identify the circuit function as follows: Device type Generic number Circ
8、uit function 01 MSK 5800RH Radiation hardened, 4.0 A adjustable voltage regulator 02 MSK 5810RH Radiation hardened, 5.0 A adjustable voltage regulator 03 MSK 5821RH Radiation hardened, 5.0 A adjustable voltage regulator 04 MSK 5820-1.5RH Radiation hardened, 5.0 A, 1.5 V voltage regulator 05 MSK 5820
9、-1.9RH Radiation hardened, 5.0 A, 1.9 V voltage regulator 06 MSK 5820-2.5RH Radiation hardened, 5.0 A, 2.5 V voltage regulator 07 MSK 5820-2.8RH Radiation hardened, 5.0 A, 2.8 V voltage regulator 08 MSK 5820-3.3RH Radiation hardened, 5.0 A, 3.3 V voltage regulator 09 MSK 5820-5.0RH Radiation hardene
10、d, 5.0 A, 5.0 V voltage regulator 10 MSK 5820-1.8RH Radiation hardened, 5.0 A, 1.8 V voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require
11、 QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military
12、quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, man
13、ufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exceptio
14、n(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML cer
15、tified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09216 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 AP
16、R 97 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style M See figure 1 5 TO-254 with tab, gull wing leads, glass sealed N See figure 1 12 Flat pack with gull wing leads T See figure 1 20 Flat pack wit
17、h straight leads U See figure 1 20 Flat pack with gull wing leads X See figure 1 5 TO-254 with tab, straight leads, glass sealed Y See figure 1 5 TO-254 with tab, leads formed up, glass sealed Z See figure 1 5 TO-254 with tab, leads formed down, glass sealed 1.2.5 Lead finish. The lead finish shall
18、be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) +10.0 V dc Bias supply voltage (VBIAS) Device type 02, only . +10.0 V dc Output current: Device type 01 4.0 A 2/ Device types 02 through 10 5.0 A 2/ Junction temperature (TJ) +150C Storage temperature -65C to +150
19、C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Input voltage range (VIN) Device type 01 +2.9 V dc to +7.5 V dc Device type 02 +2.0 V dc to +7.5 V dc Device types 03 through 10 +2.9 V dc to +6.5 V dc Output current (minimum) 10 mA Output voltage range: Device t
20、ype 01 +1.5 V dc to +6.8 V dc Device type 02 +1.5 V dc to +7.0 V dc Device type 03 +1.5 V dc to +6.0 V dc Bias supply voltage (VBIAS) Device type 02, only . +2.9 V dc to +7.5 V dc Case operating temperature range (TC) . -55C to +125C 1.5 Radiation features. Maximum total dose available: Device type
21、01 300 Krads (Si) 3/ 4/ 5/ Device types 02 through 10 300 Krads (Si) 3/ 4/ 5/ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Output current limit is dependent on the
22、value of VIN- VOUT. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Dose rate shall b
23、e in accordance with MIL-STD-883, method 1019, condition A. 4/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. 5/ See figure 3. Provided by IHSNot for ResaleNo reproduction
24、 or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09216 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specifica
25、tion, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. D
26、EPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of
27、these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cite
28、d herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K s
29、hall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the t
30、ests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction
31、, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on
32、figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specifie
33、d operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The dev
34、ice shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variab
35、les format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level cont
36、rol by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitte
37、d to DLA Land and Maritime-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawi
38、ng. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09216 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test S
39、ymbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxFeedback voltage VFB10 mA IOUT 1.0 A, VOUT= 1.5 V 1,2,3 01,02,03 1.225 1.305 V M,D,P,L,R 1/ 1 01,02,03 1.225 1.305 M,D,P,L,R,F 1/ 1 01,02,03 1.225 1.310 Quiescent current IQVIN= 7.5 V 1
40、,2,3 01 20 mA IIN+ IBIAS, VBIAS= VIN= 7.5 V 02 20 VIN= 6.5 V 03-10 20 Bias current IBIASVBIAS= 7.5 V 1,2,3 02 4 mA Output voltage tolerance 4/ VOUTTOL VIN= VOUT+ 1 V, IOUT= 1.0 A 1 04-10 1.0 % 2,3 2.5 M,D,P,L,R 1/ 1 04-10 2.1 M,D,P,L,R,F 1/ 1 04-10 3.1 Line regulation 4/ VRLINEIOUT= 10 mA, 2.9 V VIN
41、 7.5 V, VOUT= 1.5 V 1,2,3 01,02 0.50 %VOUTIOUT= 50 mA, VOUT+ 0.4 V VIN VOUT+ 1.3 V 1 03 0.50 2,3 2.5 IOUT= 50 mA, VOUT+ 0.4 V VIN VOUT+ 1.3 V 1 04-10 0.50 2,3 2.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD
42、 MICROCIRCUIT DRAWING SIZE A 5962-09216 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise specified Group A subgroups Device type Li
43、mits Unit Min Max Load regulation 4/ VRLOAD10 mA IOUT 1.0 A, VOUT= 2.5 V 1,2,3 01,02 0.80 %VOUT50 mA IOUT 3.0 A, VOUT= 2.5 V 1 03 0.80 2,3 2.5 50 mA IOUT 3.0 A, VIN= VOUT+ 1 V 1 04-10 0.80 2,3 2.5 Dropout voltage 5/ VDODelta FB = 1%, IOUT= 1.0 A 1,2,3 01 0.70 V 02 0.40 Delta FB = 1%, IOUT= 2.5 A 03
44、0.40 Delta VOUT= 1%, IOUT= 2.5 A 04-10 0.40 Output current limit 6/ IOUTVIN= 4.4 V, VOUT= 3.3 V 1 01 1.5 2.0 A 2,3 1.3 2.2 VIN= 2.5 V, VOUT= 1.5 V 1 02 3.2 4.0 2,3 3.0 VIN= 3.5 V, VOUT= 2.5 V 1,2,3 03 3.0 5.0 VIN= VOUT+ 1 V Over-current latch up 1,2,3 04-10 3.0 5.0 See footnotes at end of table. Pro
45、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09216 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. T
46、est Symbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Shutdown threshold VSTVOUT 0.2 V (OFF) 1,2,3 All 1.0 1.6 V VOUT= Nominal (ON) 1.0 1.6 Shutdown hysteresis VSH Difference between voltage threshold of VSDI(ON) and VSDI(OFF) 1,2,3
47、01,02 0.2 V 1/ Device types 01 through 10 have been characterized through all levels M, D, P, L, R, and F of irradiation. However, device types 01 through 10 are tested at 1.5 times the F level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post
48、 irradiation electrical measurements for any RHA level, TC= +25C. 2/ Unless otherwise specified: Device types 01 and 03; VIN= 5.0 V, VSHUTDOWN= 0 V, and IOUT= 10 mA. Device type 02; VBIAS= VIN= 5.0 V, VSHUTDOWN= 0 V, and IOUT= 10 mA. Device types 04 through 10; VIN= VOUT+ 1 V, VSHUTDOWN= 0 V, and IOUT= 10 mA. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation e
