1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED C Add LCC package. Convert to military drawing. Change load resistance in table I. Change code ident no. to 67268. 87-07-22 N. A. Hauck D Changes in accordance with NOR 5962-R180-92. -tvn 92-04-29 Monica L Poelking E Update to reflect latest change
2、s in format and requirements. Editorial changes throughout. -les 04-01-29 Raymond Monnin F Update to reflect latest changes in format and requirements. Correction to marking paragraph 3.5. Editorial changes throughout. les 05-03-22 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPL
3、ACED. CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Joseph A. Kerbey DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DR
4、AWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY TTL, AND GATE, BUS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 81-05-19 TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL F SIZE A CAGE C
5、ODE 14933 80020 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E227-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 22
6、34 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 80020 01 C A Drawing numb
7、er Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 54LS242 Quadruple bus transceivers with three-state outputs inverted 02 54LS243 Quadruple bus transceiv
8、ers with three-state outputs non-inverted 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 dual-in-line D GDFP1-F14 or CDFP2-F14 14 flat 2 CQCC1-N20 20 square chip ca
9、rrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range -1.5 V dc at -18 mA to 5.5 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) . 297 mW Lead temper
10、ature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): Cases C and D . See MIL-STD-1835 Case 2 80% C/W Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (V
11、IH) . 2.0 V dc Maximum low level input voltage (VIL) 0.7 V dc Case operating temperature range (TC) -55C to +125C _ 1/ Must withstand the added PDdue to short circuit test (e.g., IOS). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
12、CUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the e
13、xtent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Met
14、hod Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps
15、.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this dr
16、awing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B
17、 devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the ma
18、nufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These mod
19、ifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as speci
20、fied in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 Logic d
21、iagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requi
22、rements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition
23、, the manufacturers PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 3.5.1 Certi
24、fication/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is
25、 used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall af
26、firm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 N
27、otification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore docum
28、entation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC
29、FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min MaxHigh level input voltage VIH1, 2, 3 All 2.0 V Low level input voltage VIL 1, 2, 3 All 0.7 V Input clamp voltage VIC VCC= 4
30、.5 V, IIN= -18 mA, TC= +25C 1 All -1.5 V High level output voltage VOHVCC= 4.5 V, VIH= 2.0 V, VIL= 0.7 V, IOH= -3 mA 1, 2, 3 All 2.4 V Low level output voltage VOL VCC= 4.5 V, VIH= 2.0 V, VIL= 0.7 V, IOL= 12 mA 1, 2, 3 All 0.4 V Off-state output current, high level voltage applied IOZH VCC= 5.5 V, V
31、IH= 2.0 V, VIL= 0.7 V, VOH= 2.7 V 1, 2, 3 All 40 Off-state output current, low level voltage applied IOZL VCC= 5.5 V, VIH= 2.0 V, VIL= 0.7 V, VOL= 0.4 V 1, 2, 3 All -200 A High level input current IIH1 VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 All 0.1 mA High level input current, any input IIH2 VCC= 5.5 V, VIN
32、= 2.7 V 1, 2, 3 All 20 A Low level input current IIL VCC= 5.5 V, VIN= 0.4 V 1, 2, 3 All -200 A Output short circuit current 1/ IOS VCC= 5.5 V 1, 2, 3 All -40 -225 mA Supply current ICCVCC= 5.5 V Outputs high 1, 2, 3 All 38 mA Outputs low 1, 2, 3 01 50 mA Outputs low 1, 2, 3 02 54 mA All outputs disa
33、bled 1, 2, 3 01 50 mA All outputs disabled 1, 2, 3 02 54 mA Functional tests See 4.3.1c 7 All Propagation delay time tPLH VCC= 5.0 V, CL= 45 pF 10%, 9, 10, 11 All 25 ns tPHL RL = 110 5% 9, 10, 11 All 30 ns See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permi
34、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unless otherwise spec
35、ified Group A subgroupsDevice type Limits Unit Min MaxEnable time tPZL VCC= 5.0 V, CL= 45 pF 10%, 9, 10, 11 All 46 ns tPZH RL = 110 5% 9, 10, 11 All 36 ns Disable time tPLZ 9, 10, 11 All 39 ns tPHZ 9, 10, 11 All 46 ns 1/ Not more than one output should be shorted at a time, and the duration of the s
36、hort circuit condition should not exceed one second. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 De
37、vice types 01 and 02 Case outlines C, D 2 Terminal number Terminal symbols 1 G AB NC 2 NC G AB 3 A1 NC 4 A2 A1 5 A3 NC 6 A4 A2 7 GND NC 8 B4 A3 9 B3 A4 10 B2 GND 11 B1 NC 12 NC B4 13 GBA B3 14 VCCB2 15 - - - NC 16 - - - B1 17 - - - NC 18 - - - NC 19 - - - GBA 20 - - - VCCFIGURE 1. Terminal connectio
38、ns. INPUTS DEVICE TYPE G AB GBA 01 02 L L A to B A to B H H B to A B to A H L Isolation Isolation L H Latch A and B (A = B ) Latch A and B (A = B) FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI
39、ZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Device type 02 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI
40、ZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance wi
41、th method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under d
42、ocument revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, mini
43、mum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance
44、 with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 9, 10*, 11* Group C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to s
45、ubgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional cri
46、teria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 7 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking
47、 permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80020 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 10 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b
48、. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitt
