1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A NOR 5962-R149-93. Revisions to paragraphs 4.2a(1) and 4.3.2b(1). -tvn 93-04-30 Monica L. Poelking B Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 02-06-26 Raymond Monnin C Update drawing to curren
2、t requirements. Editorial changes throughout. - gap 09-07-20 Charles F. Saffle Current CAGE code is 67268 The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY David W. Queenan D
3、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL, BIPOLAR, FOUR-BIT SHIFTE
4、R, MONOLITHIC SILICON DRAWING APPROVAL DATE 86-12-19 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 14933 5962-86718 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E175-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 596
5、2-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Iden
6、tifying Number (PIN). The complete PIN is as shown in the following example: 5962-86718 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit fu
7、nction 01 25S10 Four-Bit shifter with three-state outputs 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package F GDFP2-F16 or CDFP3-F16 16 Flat packa
8、ge 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc to +7.0 V dc Storage temperature range -65C to +150C Maximum power dissipation
9、(PD) 1/ 1.02 W Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C DC output current into outputs . 30 mA DC input current -30 mA to +5.0 mA 1.4 Recommended operating conditions. Supply voltage range (VCC) . +4.5
10、 V dc to +5.5 V dc Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) . 0.8 V dc Ambient operating temperature (TA) -55C to +125C _ 1/ Must withstand the added PDdue to short circuit test (e.g. IOS). Provided by IHSNot for ResaleNo reproduction or networking permit
11、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standa
12、rds, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
13、 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of th
14、ese documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited h
15、erein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI
16、NG SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifie
17、d herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved pro
18、gram plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not aff
19、ect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, a
20、ppendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram
21、shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical
22、 test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN
23、 may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices buil
24、t in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manuf
25、acturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the
26、requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that a
27、ffects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for R
28、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -5
29、5C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max High level output voltage VOH VCC= 4.5 V, IOH= -1.0 mA, VIN= 0.7 V or 2.0 V 1, 2, 3 2.4 V Low level output voltage at Q outputs VOL VCC= 4.5 V, IOL= 12 mA, VIN= 2.0 V or 0.7 V 1, 2, 3 0.5 V Input clamp voltage VI CVCC= 4.5 V
30、, IIH= -18 mA 1, 2, 3 -1.5 V Low level input current IILVCC= 5.5 V, VIN= 0.5 V I3, I-3, S0, S1, OE 1, 2, 3 -2.0 mA All other inputs 1, 2, 3 -3.0 mA High level input current II H1 VCC= 5.5 V, VIN= 2.7 V I3, I-3, S0, S1, OE 1, 2, 3 50 A All other inputs 1, 2, 3 75 A II H2 VCC= 5.5 V, VIN= 5.5 V 1, 2,
31、3 1.0 mA Short circuit output current IOS VCC= 5.5 V, 1, 2, 3 -40 -100 mA Supply current ICC VCC= 5.5 V, all outputs open, all inputs = GND 1, 2, 3 85 mA Off-state output current IOZH VCC= 5.5 V, VOUT= 2.4 V 1, 2, 3 50 A IOZL VCC= 5.5 V, VOUT= 0.5 V 1, 2, 3 -50 A Propagation delay time, data to outp
32、ut Y tPLH1 CL= 15 pF 10%, RL= 280 5% 2/ 9 7.5 ns 3/ 9, 10, 11 10 ns tPHL1 2/ 9 12 ns 3/ 9, 10, 11 16 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENT
33、ER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max Propagation delay time, from select to output Y tPLH2
34、 CL= 15 pF 10%, RL= 280 5% 2/ 9 17 ns 3/ 9, 10, 11 22 ns tPHL2 2/ 9 20 ns 3/ 9, 10, 11 26 ns Propagation delay time, from OE to output Y tPZH2/ 9 19.5 ns 3/ 9, 10, 11 25 ns tPZL2/ 9 21 ns 3/ 9, 10, 11 27 ns Propagation delay time, from OE to output Y tPHZ2/ 9 8 ns 3/ 9, 10, 11 10 ns tPLZ2/ 9 15 ns 3
35、/ 9, 10, 11 20 ns 1/ Not more than one output should be shorted at a time and the duration of the short circuit condition should not exceed one second. 2/ VCC= 5.0 V. 3/ VCC= 4.5 V to 5.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI
36、CROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines E and F 2 Terminal number Terminal symbols 1 I-3NC 2 I-2I-33 I-1I-24 I0I-15 I1I06 I2NC 7 I3I18 GND I29 S1I310 S0GND 11 Y3NC12 Y2S1
37、13 OE S014 Y1Y315 Y0Y216 VCCNC 17 OE 18 Y119 Y020 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEV
38、EL C SHEET 8 DSCC FORM 2234 APR 97 OE S1 S0 I3 I2 I1 I0 I-1 I-2 I-3 Y3 Y2 Y1 Y0 H X X X X X X X X X Z Z Z Z L L L D3 D2 D1 D0X X X D3 D2 D1 D0 L L H X D2 D1 D0 D-1 X X D2 D1 D0 D-1 L H L X X D1 D0 D-1 D-2 X D1 D0 D-1 D-2 L H H X X X D0 D-1 D-2 D-3 D0 D-1 D-2 D-3 H = High level X = Dont care L = Low
39、level Z = High impedance state Dnat input Inmay be either high or low and output Ym will follow the selected Dninput level. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE
40、 SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS C
41、OLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall b
42、e conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be m
43、ade available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test par
44、ameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Inte
45、rim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, i
46、f not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A in
47、spection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
48、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86718 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 11 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, C, or D. The test circuit shall be maintained by the manufacturer under document revision level c
