1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add flat package. Change CAGE code to 67268. 87-10-09 R. P. EVANS B Add device type 02. Editorial changes throughout. 93-09-22 M. A. FRYE C Drawing updated to reflect current requirements. - ro 02-06-26 R. MONNIN D Five year review requirement. -
2、 ro 07-10-23 R. HEBER E Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 13-01-09 C. SAFFLE CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PRE
3、PARED BY DONALD R. OSBORNE DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LIN
4、EAR, DUAL DIFFERENTIAL HIGH SPEED COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-01-13 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 14933 5962-87516 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E136-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
5、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38
6、535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87516 01 C A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: D
7、evice type Generic number Circuit function 01 521 Dual differential comparator 02 522 Dual differential comparator (open collector) 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 o
8、r CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage (+V) . +7 V dc Negative supply voltage (-V) . -7 V dc Differential input voltage (VIDR) 6.0 V dc In
9、put voltage (VIN): Common mode 5 V dc Strobe / gate +5.25 V dc Maximum power dissipation (PD) . 600 mW 1/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1
10、.4 Recommended operating conditions. Positive supply voltage range (+V) . +4.5 V dc to +5.5 V dc Negative supply voltage range (-V) . -4.5 V dc to -5.5 V dc Common mode voltage range (VICR) . 3 V dc Ambient operating temperature range (TA) . -55C to +125C _ 1/ Must withstand the added PDdue to short
11、 circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Gover
12、nment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICAT
13、ION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard M
14、icrocircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the e
15、vent of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The indi
16、vidual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been grant
17、ed transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the r
18、equirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, co
19、nstruction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specif
20、ied on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature
21、 range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN
22、listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance i
23、ndicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo r
24、eproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless
25、 otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIO+V = +4.5 V, -V = -4.5 V 1 01,02 7.5 mV 2,3 15 Input bias current IIB+V = +5.5 V, -V = -5.5 V 1 01,02 20 A 2,3 40 Input offset current IIO+V = +5.5 V, -V = -5.5 V 1 01,02 5 A 2,3 12 Low level input voltage
26、 VIL+V = +4.5 V, -V = -4.5 V 1 01,02 0.8 V 2,3 0.7 High level input voltage VIH+V = +4.5 V, -V = -4.5 V 1,2,3 01,02 2.0 V Input current high, 1G or 2G strobe IIH+V = +5.5 V, -V = -5.5 V, VIH= 2.7 V 1,2,3 01,02 50 A Input current high, common strobe S IIH+V = +5.5 V, -V = -5.5 V, VIH= 2.7 V 1,2,3 01,
27、02 100 A Input current low, 1G or 2G strobe IIL+V = +5.5 V, -V = -5.5 V, VIL= 0.5 V 1,2,3 01,02 -2.0 mA Input current low, common strobe S IIL+V = +5.5 V, -V = -5.5 V, VIL= 0.5 V 1,2,3 01,02 -4.0 mA Output leakage current IOH+V = +4.5 V, -V = -4.5 V, VOUT= +5.5 V 1,2,3 02 250 A Output voltage high V
28、OHVSTROBE= 2.0 V, +V = +4.5 V, -V = -4.5 V, IOH= -1 mA 1,2,3 01 2.5 V Output voltage low VOL+V = +4.5 V, -V = -4.5 V, IOL = 20 mA 1 01,02 0.5 V +V = +4.5 V, -V = -4.5 V, IOL= 10 mA 2,3 0.5 Supply current positive +ICC+V = +5.5 V, -V = -5.5 V, 1 01,02 35 mA VSTROBE= 0 V 2,3 50 Supply current negative
29、 -ICC+V = +5.5 V, -V = -5.5 V, VSTROBE= 0 V 1,2,3 01,02 -28 mA Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR
30、 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Short circuit output current ISC+V = +5.5 V, -V = -5.5 V 1,2,3 01 -35 -115 mA Propagation delay, 1/ input A or B to output
31、tPLH1+V = +5.0 V, -V = -5.0 V, RL= 280 , CL= 15 pF, 9 01 12 ns low to high TA= +25C 02 15 Propagation delay, 1/ input A or B to output tPHL1+V = +5.0 V, -V = -5.0 V, RL= 280 , CL= 15 pF, 9 01 9 ns high to low TA= +25C 02 12 Propagation delay, 2/ STROBE G or S to output tPLH2+V = +5.0 V, -V = -5.0 V,
32、 RL= 280 , CL= 15 pF, 9 01 10 ns low to high TA= +25C 02 13 Propagation delay, 2/ STROBE G or S to output tPHL2+V = +5.0 V, -V = -5.0 V, RL= 280 , CL= 15 pF, 9 01 6 ns high to low TA= +25C 02 9 1/ Response time measured from 0 V point of 100 mVp-p 10 MHz square wave to the 1.5 V point of the output.
33、 2/ Response time measured from 1.5 V point of input to 1.5 V of the output. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitte
34、d to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appe
35、ndix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes age
36、nt, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
37、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines C and D Terminal number Terminal symbol 1 INPUT 1A 2 INPUT 1B 3 NC 4 OUTPUT 1Y 5 STROBE 1G 6 STROBE S 7 GROUND
38、8 STROBE 2G 9 OUTPUT 2Y 10 NC 11 INPUT 2B 12 INPUT 2A 13 -V 14 +V NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO
39、43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET
40、8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality confo
41、rmance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring ac
42、tivity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II here
43、in, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following addi
44、tional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in tabl
45、e II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test ci
46、rcuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo rep
47、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87516 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance
48、 with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3 Group A test requirements (method 5005) 1, 2, 3, 9 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (ori
