DLA SMD-5962-87565 REV D-2007 MICROCIRCUIT DIGITAL ECL QUAD 2-INPUT OR GATE MONOLITHIC SILICON《硅单块 四列二输入或门 发射极耦合逻辑 数字微型电路》.pdf

上传人:medalangle361 文档编号:699006 上传时间:2019-01-01 格式:PDF 页数:13 大小:161.95KB
下载 相关 举报
DLA SMD-5962-87565 REV D-2007 MICROCIRCUIT DIGITAL ECL QUAD 2-INPUT OR GATE MONOLITHIC SILICON《硅单块 四列二输入或门 发射极耦合逻辑 数字微型电路》.pdf_第1页
第1页 / 共13页
DLA SMD-5962-87565 REV D-2007 MICROCIRCUIT DIGITAL ECL QUAD 2-INPUT OR GATE MONOLITHIC SILICON《硅单块 四列二输入或门 发射极耦合逻辑 数字微型电路》.pdf_第2页
第2页 / 共13页
DLA SMD-5962-87565 REV D-2007 MICROCIRCUIT DIGITAL ECL QUAD 2-INPUT OR GATE MONOLITHIC SILICON《硅单块 四列二输入或门 发射极耦合逻辑 数字微型电路》.pdf_第3页
第3页 / 共13页
DLA SMD-5962-87565 REV D-2007 MICROCIRCUIT DIGITAL ECL QUAD 2-INPUT OR GATE MONOLITHIC SILICON《硅单块 四列二输入或门 发射极耦合逻辑 数字微型电路》.pdf_第4页
第4页 / 共13页
DLA SMD-5962-87565 REV D-2007 MICROCIRCUIT DIGITAL ECL QUAD 2-INPUT OR GATE MONOLITHIC SILICON《硅单块 四列二输入或门 发射极耦合逻辑 数字微型电路》.pdf_第5页
第5页 / 共13页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R052-92. 91-12-05 Monica L. Poelking B Changes in accordance with NOR 5962-R169-92. 92-04-06 Monica L. Poelking C Changes in accordance with NOR 5962-R129-93. 93-04-12 Monica L. Poelking D Redrawn with changes.

2、 Update drawing to current requirements. Editorial changes throughout. - gap 07-06-12 Robert M. Heber CURRENT CAGE CODE IS 67268 The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PR

3、EPARED BY Joe Kerby DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, DIGITAL, ECL, QUAD 2-INPUT AND AGENCIES OF THE DEPARTM

4、ENT OF DEFENSE DRAWING APPROVAL DATE 87-07-24 OR GATE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 14933 5962-87565 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E219-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU

5、IT DRAWING SIZE A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendi

6、x A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87565 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Gene

7、ric number Circuit function 01 10H503 Quad 2-input OR gate 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1

8、-N20 20 leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range -8.0 V dc minimum to 0.0 V dc maximum Input voltage range . -5.2 V dc to 0.0 V dc Storage temperature range . -65C to +165C Lead te

9、mperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 196 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V minimum to -4.94 V maximum Ambient operating temperature

10、 range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.650 V dc TA= -55C . -0.840 V dc Maximum low level input voltage (VIL) . -1.950 V dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCI

11、RCUIT DRAWING SIZE A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to

12、 the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Te

13、st Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assis

14、t.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of t

15、his drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class l

16、evel B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with

17、the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. The

18、se modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as

19、 specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Log

20、ic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance character

21、istics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot f

22、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, append

23、ix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 C

24、ertification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow optio

25、n is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shal

26、l affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3

27、.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore d

28、ocumentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shal

29、l be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shal

30、l be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical te

31、st parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

32、A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent cond

33、itions 1/ VIHVIL-0.780 -1.950 1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOH-0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOL-0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465

34、 2 -0.860 -0.650 High level threshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLAVEE= -5.2 V VCC1= 0.0 V VCC2= 0.0 V Load = 100 to -2.0 V 2/ -1.160 -1.510 3 -1.950 -1.610 V 1 -26 Power supply d

35、rain current IEE 3/ VEE= -5.2 V VCC1= 0.0 V VCC2= 0.0 V 2, 3 -29 mA 1 265 High level input current IIHAll inputs 2, 3 425 A 1, 3 0.5 Low level input current IILAll inputs 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

36、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A

37、subgroups Min Max Unit Cases E and F DC rapid test conditions 4/ VIHVIL-0.789 -1.950 1 -1.018 -0.789 -0.659 -1.950 2 -0.869 -0.659 High level output voltage VOH-0.849 -1.950 3 -1.069 -0.849 V -0.789 -1.950 1 -1.950 -1.583 -0.659 -1.950 2 -1.950 -1.568 Low level output voltage VOL-0.849 -1.950 3 -1.9

38、50 -1.613 V -1.118 -1.483 1 -1.018 -0.789 -0.969 -1.468 2 -0.869 -0.659 High level threshold output voltage VOHA-1.169 -1.513 3 -1.069 -0.849 V -1.118 -1.483 1 -1.950 -1.583 -0.969 -1.468 2 -1.950 -1.568 Low level threshold output voltage VOLAVEE= -5.2 V VCC1= 0.0 V VCC2= 0.0 V Load = 100 to -2.0 V

39、2/ -1.169 -1.513 3 -1.950 -1.613 V 1 -25 Power supply drain 3/ current IEE2, 3 -28 mA 1 250 High level input current IIHVEE= -5.2 V VCC1= 0.0 V VCC2= 0.0 V All inputs 2, 3 410 A 1, 3 0.5 Low level input current IILAll inputs 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo repr

40、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Condit

41、ions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Case 2 DC rapid test conditions 4/ VIHVIL-0.794 -1.950 1 -1.023 -0.794 -0.665 -1.950 2 -0.874 -0.665 High level output voltage VOH-0.855 -1.950 3 -1.074 -0.855 V -0.794 -1.950 1 -1.950 -1.584 -0.665 -1.950 2 -1.950 -1.570 L

42、ow level output voltage VOL-0.855 -1.950 3 -1.950 -1.615 V -1.123 -1.484 1 -1.023 -0.794 -0.974 -1.470 2 -0.874 -0.665 High level threshold output voltage VOHA-1.174 -1.515 3 -1.074 -0.855 V -1.123 -1.484 1 -1.950 -1.584 -0.974 -1.470 2 -1.950 -1.570 Low level threshold output voltage VOLAVEE= -5.2

43、V VCC1= 0.0 V VCC2= 0.0 V Load = 100 to -2.0 V 2/ -1.174 -1.515 3 -1.950 -1.615 V 1 -25 Power supply drain 3/ current IEE2, 3 -28 mA 1 250 High level input current IIHVEE= -5.2 V VCC1= 0.0 V VCC2= 0.0 V All inputs 2, 3 410 A 1, 3 0.5 Low level input current IILAll inputs 2 0.3 A Cases E, F, and 2 AC

44、 test conditions 9 0.50 1.80 10 0.50 1.90 Transition time tTLH, tTHL11 0.50 1.70 ns 9 0.40 1.40 10 0.50 1.65 Propagation delay tPHH, tPLL, tPHL, tPLHVEE= -2.94 V VCC= 2.0 V CL 5 pF Load all outputs 100 to GND See figure 4 11 0.40 1.40 ns 1/ The quiescent limits are determined after a device has reac

45、hed thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C air blowing on the unit and with power applied for at least 4 minutes before the reading is taken. 2/ The high and low level output current varies with temperature, and shall be calculated

46、 using the following formulas: IOH= (-2.0 V - VOH)/100 IOL= (-2.0 V - VOL)/100 3/ The IEElimits, although specified in the minimum column, shall not be exceeded, in magnitude, as a maximum value. 4/ The dc rapid test forcing functions and limits are used for all dc testing. These limits are determin

47、ed for each device type based on the power dissipation and package type. The rapid test (delta V) limits and forcing functions are skewed allowing rapid testing to be performed at standard temperatures without the addition of delta Ts. Provided by IHSNot for ResaleNo reproduction or networking permi

48、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87565 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outlines E F 2 Terminal number Terminal symbol 1 VCC1B3 IN NC 2 Y1 OUT Y4 OUT VCC13 Y2 OUT Y3 OUT Y1 OUT 4 A1 IN VCC2Y2 OUT 5 B1 IN VCC1A1 IN 6 A2 IN Y1 OUT NC 7 B2 IN Y2 OUT B1 IN 8 VEEA1 IN A2 IN 9 3Y OUT B1 IN B2 IN 10 A4 IN A2 IN VEE11 B4 IN B2 IN NC 12 A3 IN VEE3Y OUT 13 B3 IN 3Y OUT A4 IN 14 Y4 OUT A4 IN B4 IN 15 Y3 OUT B4 IN A3 IN 16 VCC2A3

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1