DLA SMD-5962-87772-1988 MICROCIRCUITS DIGITAL BIPOLAR REGISTERED TRANSCEIVER MONOLITHIC SILICON《硅单片加法器收发器两极化数字微电路》.pdf

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1、DESC-DWG-7772 57 E 7777975 OOLL4L9 7 E 7-6J-3/ I DESCRIPTION DATE (YR-MO-DA) - LTR - APPROVED PMIC WA STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENTOFDEFENSE AMSC NIA I PREPAREDBY *I - DEFENSE ELECTRONICS SUPPLY CENTER DATON, OHIO 45

2、444 CaCKEDBY . MICROCIRCUITS, DIGITAL, BIPOLAR, REGISTERED TRANSCEIVER, MONOLITHIC SILICON 1 REVISION LEVEL I I I SHEET 1 OF 15 DESC FORM 193 ii U.S. OOvtWfNl PRIHTIHO CfPKE; 1987 - 748-1?9/60911 SEP 87 5962-E759 DiSTRiBUTION STATEMENT A. Approved for public release; distribution Is uniimiled. Licen

3、sed by Information Handling ServicesDESC-DWG-87772 57 m 7777775 CIOLL420 5 m 1. SCOPE 1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance ith 1.23f MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant on-JAN devices“. 1.2 Part nu

4、mber. The complete part number shall be as shown in the following example: 5962-87772 I I I o1 I I I L T I I X T- I I i Lead finish per i tase outline I i Orawing number Device type (1.2.11 (1.2.2) MI L-M-38510 1.2.1 Device types. The device types shall identify the circuit function as follows: Devi

5、ce type Generic number Circuit function . o1 02 2952A 2953A 8-bit registered transceiver, bidirectional 8-bi t registered transceiver, bidirectional 1/0 ports , noni nverti ng I/O ports, inverting 1.2.2 Case outline. The case outline shall be as designated in appendix C of MIL-M-38510, and as ollows

6、: Out1 ine 1 etter Case outline L D-9 (24-leadY 1.280“ x .310“ x .200“), dual-in-line package 1.3 Absolute maximum ratings. Supply voltage range - - - - - - - - - - - - - - - - DC output current into outputs - - - - - - - - - - - Storage temperature ranye - - - -.- - - - - - - - - Thermal resistance

7、, junction-to-case (0,ic) - - - - - Junction temperature (TJ) - - - - - - - - - - - - - -0.5 V dc minimum to t7.0 V dc maximum -0.5 V dC to t5.5 V dc 30 mA -30 mA to t5.0 id 1.1 w i/ -65C t t15O“C See MIL-M-38510, appendix C t175“C Input voltage range DC input current - - - - - - - - - - - - - - - -

8、 - - - - - - - - - - - - - - - - - Maximum power dissipation (PD) - - - - - - - - - - - 1.4 Recomnended operating conditions. Supply voltage (Vcc) - - - - - - - - - - - - - - - - Minimum high level input voltage (VI ) - - - - - - - Maximum low levei input voltage (VIL“ - - - - - - - Case operating t

9、emperature range (TC) - - - - - - - t4.5 V dc minimum to t5.5 V dc maximum 2.0 V dc 0.8 V dc -55C to t125“C TEX withstand the added PD due to short circuit test; e.g., 10s. 5962-87772 STANDARDIZED SIZE A MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 2 DAYTON, OHIO 45444 I I

10、 I f? U.S. QWERHMENT PRINllNG OFFICE 1537-SW53 DESC FORM 193A SEP 87 / I - Licensed by Information Handling ServicesDESC-DWG-87772 57 7777775 0033423 7 W - STANDARDIZED MILITARY DRAWING DEFENSE ELEClRNICS SUPPLY CENTER DAYTON, OHIO 45444 P b 5962-87772 SIZE A REVISION LEVEL SHEFT 3 2. APPLICABLE DOC

11、UMENTS 2.1 Government specification and standard. Unless otherwise specified, the following ipecification and standard, of the issue listed in that issue of the Department of Defense Index of ipecifications and Standards specified in the solicitation, form a part of this drawing to the bxtent speci

12、f i ed herei n. SPECIFICATION MILITARY MIL-M-38510 - Microcircuits, General Specification for. STAEIDAR D MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific icquisition functions sho

13、uld be obtained from the contracting activity or as directed by the ,ontracting activity.) eferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence, In the event of a conflict between the text of this drawing and the 3. REQUIREMENTS 3.1 Item requirements. The i

14、ndividual item requirements shall be in accordance with 1.2.1 of IIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAW devices“ .nd as specified herein. 3.2 Design, construction, and physical dimensions. limensions shall be as specified in MIL-M-38510 and herein.

15、The design, construction, and physical 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth tables. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3. The truth tables shall be as Specified on figure 2. 3.2.4 Switching waveforms a

16、nd test circuits. The switching waveforms and test circuits shall be is specified on figure 4. 3.2.5 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical Nerformance characteristics are as spec

17、ified in table I and apply over the full case operating .emperature range. 3.4 Markin . Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall le markhall be made available onshore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. S

18、ampling and inspection procedures shall be in accordance with iection 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STO-883, and shall be :onducted on all devices prior to quality conformance inspecti

19、on. The following additional criteria ;hall apply: a, Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C or D using the circuit submitted with the certificate of compl (see 3.5 herein). (2) TA = +125C, minimum. ance b. Interim and final electrical test parameters shall be as specified ln

20、 table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. I I I f? US GOVERNMENT PRYITINQ OWE lE7-MW ESC FORM 193A SEP 87 _v- _ i _-_ Licensed by Information Handling ServicesDESC-DWG-87772 57 7777775 CIOLL425 4 W SIZE A 5962-877

21、72 STANDARMZU) MILITARY DRAWING SHEET 7 REVISION LEVEL DEFENSE ELECTRONICC SUPPLY CENTER DAYTON, OHIO 45444 P Device type 01 NOTE: Bi is inverted on device type 02. DESC FORM 193A SEP 87 Licensed by Information Handling ServicesREGISTER FUNCTION TABLE (Applies to R or S Register) SIZE A STANDARDIZED

22、 i I I inputs I -Idinternal I IFunction I I IData ICP ICE I Q I III I I X I X I H I NC IHold data i I III I I ILoad data I i I IL H IdLI IjILI L H I I 5962-87772 i iii I I OUTPUT CONTROL I I Q I ty es I Function I I! l-r-bn I H = HIGH L = LOW X = Dont care Z = High impedance NC = No change f = LOW-t

23、o-HIGH transition Licensed by Information Handling ServicesDESC-DWG-7772 57 m 7777775 OOLL427 W SIZE A STANDARDIZED Device type O1 5962-87772 A7 ta- o I 1 NOTE: Device type O2 provides inverting data output. FIGURE 3. Logic diagram. Licensed by Information Handling ServicesTHREE-STATE OUTPUTS vcc 1

24、“d NORMAL OUTPUTS vcc ? Notes: 1. CL 50 pF includes scope probe, wiring and stray capacitances without device in test fixture. 2. SI, Se, S3 are closed during function tests and all AC tests except output enable tests. 3. S1 and S3 are closed while S2 is open for tpZH tests. Si and S2 are closed whi

25、le S3 is open for tpZL tests. 4. CL = 5.0 pF for output disable tests. FIGURE 4. Switching waveforms and test circuits. CIZE A 5962-87772 STANDARDIZED MILITARY DRAWING SHEET 10 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL DESC FORM 193A SEP a7 _.- I ,- - - - ,- Licensed by Inf

26、ormation Handling ServicesDESC-DWG-87772 57 m 7777775 0033427 3 W SIZE A STANDARDIZED 3.0 V ov INPUTS 5962-87772 3.0 V - ov CLOCK 2” CLOCK OUTPUT DELAY INPUT OUTPUT DELAY -To I OUTPUTS R - REGISTER tpwh2 r- tpw12 -+ , 1.- I AO-7 )o( I I I I I tHf2 7 tLZ2 I I I 1.sv- BO-7 Licensed by Information Hand

27、ling ServicesS - REGISTER $whl p- tpw11 -j I, I SIZE A 5962-87772 STANDARDIZED MILITARY DRAWING DEFENSE UECTRONICC SUPPLY CENTER REVISION LEVEL SHEET 12 DAYION, OHIO 45444 r DESC FORM 193A SEP 87 Licensed by Information Handling ServicesDESC-DWG-87772 57 W 7797775 CIOLL431 T W STAN DARDI ZED MILITAR

28、Y DRAWING EFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 TABLE I I. Electrical test requirements. I I Subgroups r I MIL-STD-883 test requirements I (per method I I I 5005, table 1) I I I I I Interim electrical parameters I - I (method 5004) I I I Final electrical test parameters I 1*, 2, 3, 7*,

29、 8,I I (method 5004) I 9, 10, 11 I I (method 5005) I 9, 10, 11 I I Groups C and D end-point I 1, 2, 3 I Group A test requirements I 1, 2, 3, 7, 8 I 5962-87772 SIZE A REVISION LEVEL SHEET 13 I electrical parameters I I I (method 5005) I I * PDA applies to subgroups 1 and 7. 4.3 Quality conformance in

30、s ection. Quality conformance inspection shall be in accordance with ethod 5005 of MIL - STD 88 3-incyuding groups A, By Cy and D inspections. The following additional ri teri a chal 1 apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in tab

31、le 1, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 tests shall verify the truth tables as specified on figure 2 herein. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 100

32、5 of MIL-STD-883. (1) Test condition C or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) TA = +125OC, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The .requirements for pac

33、kaging shall be in accordance with 6. NOTES 6.1 IL-M-38510. Intended use. Microcircuits conforming to this drawing are intended for use when military pecifications do not exist and qualified military devices that will perform the required function re not available for OEM application. y this drawing

34、 has been qualified for listing on QPL-38510, the device specified herein will be nactivated and will not be used for new design. The QPL-38510 product shall be the preferred item or all applications. When a military specification exists and the product covered Licensed by Information Handling Servi

35、cesDESC-DWG-87772 57 W 7777775 OOLL432 L STANDARDIZED MILiTARY DRAWING DEFENSE ELECTRONICS SUPPLY CEKIER DAWW, OHIO 45444 6.2 Re laceability. Microcircuits covered by this drawing will replace the same generic device 6.3 Comments. Comments on this drawing should be directed to DESC-ECS, Dayton, Ohio

36、 45444, or 6.4 Symbol s and defini ti ons. :overe + y a contractor-prepared specification or drawing. telepho-96-5375. 5962-87772 SIZE A RMSK)N LEVEL SHEET 14 I I I Name I I/O I Description I I I I AO-7 i 1/0 i Eight bidirectional lines carrying the R register inputs or i I I S register outputs. I I

37、 I I I I 80-7 I 1/0 I Eight bidirectional lines carrying the S register inputs or I I R register outputs. I I I I I I I I I I entered into the R register on the low-to-high transition of I I I I I CPR I I I The clock for the R register. When ER is low, data is I I the CPR signal. I I I i i I i The c

38、lock enable for the R register. When KR is low, i I I I data is entered into the R register on the low-to-high I I I transi tions. I I I transition of the CPR signal. When ER is high, the R register holds its contents, regardless of CPR signal II EBR I i The output enable for the R register. When EB

39、R is low, i I I I I I I I I I I the R register thrE-state outputs are enabled onto the I 90-7 lines. When OEBR is high, the R register outputs I are in the high-impedance state. CPs i I i The clock for the S register. When Es is low, data is i I I I I entered into the S register on the low-to-high t

40、ransition I I I I I of the CPs signal. I I -I Es I I I The clock enable for the S register. When Es is low, I I I data is entered into the S register on the low-to-high I I transition of the CPs signal. When Es is high, the S I register holds its contents, regardless of CPs signal I I I transi ti on

41、s. I I I I I EAS i I i The output enable for the S register. When EAS is low, i I I I I I the S register three-state outputs are enabled onto the I I AO-7 lines. When OE s is high the S register outputs I are in the high-impeiance state. 1 Ik US. GOYERNMENT PRMWG ORICE 1887-549088 ESC FORM 193A SEP

42、a7 Licensed by Information Handling Services- DESC-DWG-7772 57 W 7777775 OOLLq33 3 - 6.5 Approved source of supply. An approved source of supply is iisted herein. Additional sources will be added as they become available. The vendor listed herein has agreed to this drawing and a certificate of compl

43、iance (see 3.5 herein) has been submitted to DESC-ECS. I Military drawing Vendor I Vendor I part number I CAGE I similar part I I I I number I number L/ I I 1 I I I I I I I 5962-8777201LX I 34335 I AM2952A/BLA I l I I I I I I 5962-8777202LX I 34335 I AM2953A/BLA I I I I I - l/ Caution. Do not use th

44、is number for item mtion. not satisfy the performance requirements of thi s drawing. Items acquired to this number may Vendor CAGE number 34335 Vendor name and address Advanced Micro Devices, Incorporated 901 Thompson Place Sunnyvale, CA 94081 5962-87772 STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET 15 DAYTON, OHIO 45444 DESC FORM 193A 7!7 US. GOVERNMENT PRINTING OFFICE 1987-549096 SEP 87 Licensed by Information Handling Services

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