1、. LTR P DESCRIPTION SMD-5962-89492 57 H 7999996 0003744 5 REV SHEET REV SHEET REV STATUS REV OF SHEETS I I SHEET I 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 PMIC WA STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE :OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC NIA I
2、 PREPAREDBY I DUAL, RETRIGGERABLE MONOSTABLE MULTIVIBRATOR, MONOLITHIC SI LICON SIZE CAGE CODE DRAWING APPROVW - A I 67268 91 -04-04 1 REVISION LEVEL I m I I I SHEET 1 OF 17 I 1 I I, 1 *US. MWRNMiNT PRIMING OiflCI: 1987 - 748-129/60911 DESC FORM 193 SEP 87 I 5962-El678 I DISTRIBUTION STATEMENT A. Ap
3、proved lor public release; dislrlbulion is unllmiied. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-89492 59 W 999999b 0003745 7 W b % 1 1.4 Recommended operating conditions. Supply vatage range - - - - - - - - - - - - - - - - Case operati
4、ng temperature range (TC) - - - - - - - Input rise or fali time: +2.0 V dc to +6.Q V dc -55C to +125“C Tc = -55C to +125“Cr vcc=z.(Fv - - O to 1000 ns O to 500 ns VCc = 6.0 V - - - - - - - - - - - - - - - - - - O to 400 ns Input voltage (V - - - - - - - - - - - - - - - - 0.0 V dc to Vcc Output votta
5、ge (60UT) - - - - - - - - - - - - - I - 0.0 V dc to Ycc vcc 4.5 v - - - - - - - - - - - - - - - - - - 1. SCOPE 1.1 Scope. This drawing describes device requirements for class 8 microcircuits in accordance with 1.mf MIL-STD-883, Provisions for the use of MIL-STD-883 in conjunction with compliant non-
6、JAN devices“. 1.2 Part number. The complete part number shall be as shown in the following example: - I SIZE MILITARY DRAWING A 5962-89492 , STANDARDIZED DEFENSE ELECTROP(ICS SUPPLY CENTER ZEMStON LEVEL SHEET DAYTON, OHi 45444 2 L 5962-89492 7 o1 I E 7- X 1- I i Case outline Lead finish per I Device
7、 type I Drawing number (1.21) (1.2.2) MIL-M-38510 1.2.1 Device type. The device type shalT identify the circuit function as folTows: Device type Generic number CIrcui t function o1 54HC423A Dual retrlggerable monostable mu1 tivibrator 1.2.2 Case outline. The case outline shall be as designated in ap
8、pendix C of MIL-M-38510, and as fol 1 ows: Outline letter Case outline E D-2 (16-lead, .840“ x .310“ x .200“), dual-in-Tine package 1.3 Absolute maximum ratings. i/ Supply voltage range - - - - - - - - - - - - - - - - OC input voltage range - - - - - - - - - - - - - - - DC output voltage range - - -
9、 - - - - - - - - - - - DC output current (per ptn) - - - - - - - - - - - - DC VCC or GND current (per pin) - - - - - - - - - - Storage temperature range - - - - - - - - - - - - - Maximum power dissipatian (PD) 2/ - - - - - - - - - Lead temperature (soldering, 10-seconds) - - - - - - Thermal resistan
10、ce, junction-to-case (Qc) - - - - - Junction temperature (TjI - = - - - - - - - - - - - -0.5 V dc to +7.0 Y dc -0.5 Y dc to Vcc -0.5 V dc to Vcc *20 ln4 t25 mA *50 mA -65C to +15OoC O mk +26OoC See MIL-M-38510, appendix C +175“1: Clamp diode current - - - - - - - - - - - - - - - - i =Tes - otherwise
11、 spectfied, all voltages are refereiced to ground. - 2/ For TC *lOOC to +i25C, derate linearly at 8 mW/ C I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-efied herein, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN dev
12、ices“ 3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facfl ity and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. SIZE A 5962-89492 STANDARDIZED MILITAR
13、Y DRAWING REVISION LEVU SHEET DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 4 i 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions chal 1 be as specified in MIL-M-38510 and herein. I 3.2.1 Terminal connections and timing components. The tennin
14、al connections and timing components shall be as specified on figure 1. I 3.2.2 Truth table. 3.2.3 Logic diagram. 3.2.4 Case outline. The case outline shall be in accordance with 1.2.2 herein. The truth table shall be as specified on figure 2. The logic diagram shall be as specified on figure 3. 3.3
15、 Electrical performance charac teri c tics, Unless otherwise cpeci fied herein, the electrical performance characteristics are as specified in table I and apply over the full case operating temperature range. I 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups
16、 specified in table II. The electrical tests for each subgroup are described in table I. I 3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall In addition, the manufacturers part number be mark- the part number listed in 1.2 herein. niay also be marked as li
17、sted in MIL-BUL-103 (see 6.6 herein). in order to be Ilsted as n approved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall affinn that the manufacturers product meets the requirements of MIL-S
18、TD-883 (see 3.1 herein) and the requirements herein. herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.6 Certificate of com liance. A certificate of compliance shall be requjred from a manufacturer 3.7 Certificate of conformance. A certificate of conformance as re
19、quired in MIL-STD-883 see 3.1 3.8 Notification of change, Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 ( see 3.1 herein). I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Test STANDARDIZED SIZE MILITARY DRAWING
20、 A High level output vol tage 5962-89492 Low level output vol tage iigh level input voltage - 2/ TABLE I. Electrical performance characteristics. I I I I I LUIIUI LIU115 II uevice woup A Jyii“i I -55OC 5 TC +125C - (type Isubgroupcl* Uni I Min I Max I I I I I I I unless otherwTse specified I I I i i
21、Vcc = 6.0 V i IVIN = VIH minimum IVcc = 4.5 V I I I I I I lor V L maximum I I I 1101 = 4.0 mA 1 I I I i I VIM = VIH minimum Vcc = 6.0 V i I lor V L maximum I I I I I IIof = 5.2 mA I I IVCC = 2.0 v I o1 I I IH I I I I I ivcc = 4.5 v i I I I i i- iVcc = 6.0 V i I I I I i 1 0.1 I IT1 I I I I I I I I I
22、I I III I I 0.4 I i i i I I I - I 30151 I I I 4.2 I I 1, 2, 3 I 1.5 I IV I I I I I I I IiI l I ;ee footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I STANDARDIZED SIZE A MILITARY DRAWING SMD-5962-87492 59 9999996 0003749 4 =
23、 5962-89492 TABLE I. Electrical performance characteristics - Continued. I I I I unless otherwise specified Test /Symbol I Conditions i/ I -55C 5 TC +125OC - I I LOW level input VIL i voltage 2/ I I I I I I l I ivcc = 2.0 v I IVCC = 4.5 v I i i -i- IVcc = 6.0 V I I I I I I I I I I Device IGroup A I
24、Limits I Uni1 type I subgroupslI1 I I Min I Max I I I I I I I I Ir1 I I I 0.9 I I I I I I IiI I I 1 1.2 I I 01 I 1, 2, 3 I i i i i 1160 I UA I l I 1 I Quiescent supply IIcc1 IVIN = V c or GND IVCC = 6.0 V I O1 current (standby) I 110 = 6 d I I I ! I 1 1 I I I 1 I Active supply IVcc = 2.0 V I O1 I 1,
25、 2, 3 I I130 I NA I I I I I I I IVIN = VCC (ail other pins) I I I 1 1.0 I Functional tests I I See 4.3.ld IO1 17,8 I I I current (per monostable) I I I I I I I I I I IVCC = 4.5 v I I I I 1.6 I mA I I I I I I I I I I II I IiI I IVIN = Y (R/CEXT) I I I I 5.0 I I IVcc = 6.0 V I I I Input current IIIN I
26、Vcc = 6.0 V l 01 I 1, 2, 3 I I I UA I IVIN = GhS (R/CEX 1 I I I I -5.0 I I IVIN = GEJD (all other pins) I I I I -1.0 I I I I I I I I I I I I I I I See footnotes at end of table. sp 87.-. . . II U. 8. QOVERNMENT PRINTING OFFICE lD90-549-249 Provided by IHSNot for ResaleNo reproduction or networking p
27、ermitted without license from IHS-,-,-SMD-5962-89492 59 9999996 0003750 O W STANDARDIZED SIZE MILITARY DRAWING A TABLE I. Electrical performance characteristics - Continued. 5962-89492 I Test I Symbol I Trigger propagation itpLH1 del ay time, I A to Q, B to Q I I I 3/ I I - I I I I I I I I rrigger p
28、ropagation itpHL1 del ay time y I I A tov, B tov I I 3/ i I I I - i I Conditions i/ IDevice I lape vcc = 2.0 Y I o1 I TC = +25OC CL = 50 PF See figure 4 TC = -55C, +125C See figure 4 CL = 50 PF rc = +25“c :L = 50 pF See figure 4 rc = -55“c, +i25c :L = 50 PF jee figure 4 i I vcc = 4.5 Y I I I I Ycc =
29、 2.0 v I o1 I I l Y, = 4.5 Y I I i I Ycc = 2.0 v I o1 I I I Ycc = 6.0 Y I I I Icc = 2.0 Y I o1 I I i /cc = 4.5 Y I I Group A 1 Limits I Uni subgroups 17- I Min I Max 1 91 1169 I ns - I I I I I I I , A 5962-89492 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVWON LEVEL SHEET DAYTO
30、N. OHIO 45444 14 1 tr 56 ns INPUT 9 _I TRUE OUTPUT INVERTED OUTPUT. KOA “4 10% VOL t I I c -. U. Si OOVERNMENT PRINTINQ aPFICL 1990-949-249 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-P STANDARDIZED MILITARY DRAWING DEFENSE
31、ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SMD-59bZ-qZ 59 M 999999b 0003758 5 = SIZE A 5962 -89492 REVISION LEVEL SHEET 15 4.3.1 a, b. C. d. 4.3.2 a. b. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sainpling and inspection. Sampling and inspection procedures shall be in accordance with 4.2 Screening. Scree
32、ning shall be in accordance with method 5004 of MIL-STD-883, and shall be iection 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). :onducted on all devices prior to quality conforniance inspection. The following additional criteria ;hall apply: a. Burn-in test, method 1015 o
33、f MIL-STD-883. (1) Test condition A, B, Cy or D using the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125C, minimum. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in
34、are optional at the discretion of the manufacturer. 4.3 Quality confotmance inspection. Quality conformance inspection shall be in accordance with b. iethod 5005 of MIL-STD-883 including groups A, B, C, and D inspections. :riteria shall apply. The following additional Group A inspection. Tests shall
35、 be as specified in table II herein. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. Subgroup 4 (GIN measurement) shall be measured only for the initial test and after process or design changes which may affect capacitance. Test all applicable pins on five devices with zer
36、o failures. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2. Groups C and D inspections, End-point electrical parameters shall be as specified in table II herein. Steady-state 1 ife test condition, method 1005 of MIL-STD-883. (1) Test condition A, By C, or D using the c
37、ircuit submitted with the certificat compliance (see 3.6 herein). (2) TA = +125OC, minimum. of (3) Test duration: 1,000 hours, except as petmitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_- SMD-59b2-9492 59 H 99
38、9999b 0003759 7 62 Replaceability. Microcircuits covered by this drawing will replace the same generic device :covered by a contractor-prepared specification or drawing. : 6.3 Cqnfiguratiom contro? of SMDS. All proposed changes to existing SMDs will be coordinated :with the users of record for the i
39、ndividual documents. :accordance with MIL-STO-481 using ID Farm 1693, Engineering Change Proposal (Short Form) Center when a system application requires configuration control and the applicable SMD. DESC wilT malntain a record of users and this list will be used for coordination and dictrfbutiorr of
40、 changes to the drawings, Users of drawtngs covering microelectronics devices CFSC 59625 chouTd contact :DESC-ECS, telephone (513) 296-6022. This Coordination will be accompitshed in 6.4 Record of users. Military and industrial users shall inform Defense Electronics SuppTy . i SIZE A STANDARDIZU) TA
41、BLE II. Electrical test requirements. 5962-8 9492 I I MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 I MI L-STD-883 test requirements I Subgroups i REVISION LEVEL I (per-method I I 5005, table I) t I interim electrical parameters i 1 i (method 5004) I I Final electrical test p
42、arameters i 1*, 2, 3, 7, i (method 5004) I 8, 9 I I Group A test requirements i 1, 2, 3, 4, 7, i (method 50051 I 8, 9, 10, 1: I t Groups C and D end-point i 1, 2, 3 i I elect ri cal parameters I (method 5005) I * PDA applies to subgroup 1. 1 5. PACKAGING 5.1 Packaging requirements. The requirements
43、for packaging shall be in accordance with MIL -M- 38510. t I DESC FORM 193Pi SEP 87 1 U. C. GOVERNMENT PtHNTING OFFICE: ME-550-547 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i STANDARDIZED SIZE A MILITARY DRAWING t - 5962-89492 - 6.6 Approved so
44、urces of supply. Approved sources of supply are listed in MIL-BUL-103. Additional sources will be added to MIL-BUL-103 as they become available. The vendors listed in MIL-BUL-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DESC-E
45、CS. purposes only and are current only to the date of the last action of this document, The approved sources listed below are for information I Vendor Vendor I Military drawing i CAGE i similar part I I part I I I I number I number L/ I 5962-8949201EX I 27014 I MM54HC423AJ/883 I I I I - l/ Caution.
46、Do not use this number for item acquisition. not satisfy the performance requirements of this drawing. Items acquired to this number may Vendor CAGE number Vendor name and address 27014 National Semiconductor 2900 Semiconductor Drive P.O. Box 58090 Santa Clara, CA 95052-8090 Point of contact: 333 Western Avenue South Portland, ME 04106 - - SMD-5962-87492 59 9999996 0003760 3 sE, 87 ._“ U. 8. GOVERNMENT PRINTING OFFICE 1090.549-249 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
