1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R067-93 93-02-26 M. A. FRYE B Drawing updated to reflect current requirements. -ro 02-11-20 R. MONNIN C Update SMD paragraphs. -rrp 09-06-03 J. RODENBECK THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPL
2、ACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE
3、 BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, QUAD, PRECISION, HIGH SPEED, JFET OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-06-24 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-89897 SHEET 1 OF 9 DSCC FOR
4、M 2233 APR 97 5962-E046-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. Thi
5、s drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89897 01 C X Drawing number Device type (see 1.2.1) C
6、ase outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 1058A Quad, precision, high speed, JFET operational amplifier 02 1058 Quad, precision, high speed, JFET operational amplifier
7、 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line X CQCC4-N20 20 Rectangular leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in
8、MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) 22 V dc Differential input voltage 40 V dc Input voltage (VIN) . 20 V dc Power dissipation (PD) 500 mW 1/ Output short circuit duration . Indefinite Storage temperature range -65C to +150C Lead temperature (soldering, 10 se
9、conds) +300C Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case outline C . 100C/W Case outline X . 90C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) . -55C to +125C Supply v
10、oltage (VS) . 15 V dc _ 1/ For case C, for TAabove +75C, derate linearly at 6.7 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LE
11、VEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those ci
12、ted in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlin
13、es. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Bui
14、lding 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exe
15、mption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML)
16、certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as docum
17、ented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535
18、 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein
19、. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature
20、range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN l
21、isted in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance in
22、dicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo re
23、production or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+1
24、25C VS= 15 V, VCM= 0 V Group A subgroups Device type Limits 2/ Unit unless otherwise specified Min Max Input offset voltage VOS4 01 -600 600 V 2,3 -1600 1600 4 02 -1000 1000 2,3 -2500 2500 Average temperature coefficient of VTOSTA= +125C, -55C 3/ 2,3 01 -10 +10 V/C input offset voltage 02 -15 +15 In
25、put offset current IOSFully warmed up, TA= +25C, +125C 1 01 -40 40 pA 2 -2 2 nA 1 02 -50 50 pA 2 -3 3 nA Input bias current IBFully warmed up, TA= +25C, +125C 1 01 -50 50 pA 2 -4.5 4.5 nA 1 02 -75 75 pA 2 -6 6 nA Supply current per amplifier ISVO= 0 V, TA= +25C, +125C 1 01 2.5 mA 2 1.9 1 02 2.8 2 2.
26、2 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electric
27、al performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C VS= 15 V, VCM= 0 V Group A subgroups Device type Limits 2/ Unit unless otherwise specified Min Max Common mode input voltage range VCM3/ 1 All -10.5 +10.5 V 2.3 -10.4 +10.4 Common mode rejection ratio CMRR VCM= 10.5 V 4
28、 01 84 dB VCM= 10.4 V 5,6 84 VCM= 10.5 V 4 02 80 VCM= 10.4 V 5,6 80 Power supply rejection ratio PSRR VS= 10 V to 18 V 1 01 88 dB 02 86 VS= 10 V to 17 V 2,3 01 86 02 83 Gain bandwidth product GBW fO= 1 MHz, 3/ 4 01 3.5 MHz TA= +25C 02 3 Output voltage swing +VOUTRL= 2 k 4,5,6 All +12 V -VOUT-12 Larg
29、e signal voltage gain AVOLVO= 10 V, RL= 2 k 4 01 150 V/mV 02 100 5,6 01 40 02 30 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, O
30、HIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C VS= 15 V, VCM= 0 V Group A subgroups Device type Limits 2/ Unit unless otherwise specified Min Max Large signal voltage gain AVOLVO= 10 V, R
31、L= 1 k 4 01 120 V/mV 02 80 Input noise voltage density enfO= 1 kHz, 3/ 4 01 22 nV/ Hz TA= +25C 02 24 Input noise current density InfO= 10 kHz, 1 kHz, 3/ 4/ 4 01 4 fA/ Hz TA= +25C 02 6 Slew rate +SR RL= , CL= 0 pF, AVCL= +2, 7 01 10 V/s VOUT= -10 V to +10 V, measured at -7 V to +7 V, 02 8 rising edge
32、 8 3/ 01 7 02 5 -SR RL= , CL= 0 pF, AVCL= +2, 7 01 10 VOUT= -10 V to +10 V, measured at -7 V to +7 V, 02 8 falling edge 8 3/ 01 7 02 5 1/ RLis actual resistance from output to ground, and fOis test frequency. 2/ The algebraic convention, whereby, the most negative value is a minimum and the most pos
33、itive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ Current noise is calculated from the formula IN= (2 x q x IB)where q = 1.6 x 1019cou
34、lomb. The noise of source resistors up to 1 G swamps the contribution of current noise. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
35、LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines C X Terminal number Terminal symbol 1 OUTPUT A NC 2 -INPUT A OUTPUT A 3 +INPUT A -INPUT A 4 +VS+INPUT A 5 +INPUT B NC 6 -INPUT B +VS7 OUTPUT B NC 8 OUTPUT C +INPUT B 9 -INPUT C -INPUT B 10 +INPUT C OUTPUT B 11 -VSNC 12 +INPUT
36、 D OUTPUT C 13 -INPUT D -INPUT C 14 OUTPUT D +INPUT C 15 - NC 16 - -VS17 - NC 18 - +INPUT D 19 - -INPUT D 20 - OUTPUT D NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
37、IZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 her
38、ein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as requi
39、red in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring act
40、ivity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PR
41、F-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C. The t
42、est circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent s
43、pecified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection.
44、 Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 in table I, metho
45、d 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C. The test circuit shall be maintained by the manufacturer unde
46、r document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, m
47、inimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89897 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISI
48、ON LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*,2,3,4,5,6,7 Group A test requirements (method 5005) 1,2,3,4,5,6,7,8 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1.
