1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, correct conditions for ICCand IEE. Clarify figure 2. Update drawing requirements to MIL-PRF-38534. 01-03-20 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-06-18 Raymond Monnin REV SHEET REV SHEET REV STATUS REV
2、B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPA
3、RTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 11.8-VOLT, SYNCHRO AND RESOLVER TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-21 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-92048 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E2
4、42-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92048 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents f
5、ive product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN.
6、 The PIN shall be as shown in the following example: 5962 - 92048 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA
7、) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit fun
8、ction Frequency Accuracy 1 LSB 01 SDC-14570-112 14-bit, 11.8 V S/D converter 400 Hz 4 min 02 SDC-14571-112 14-bit, 11.8 V R/D converter 400 Hz 4 min 03 SDC-14575-112 14/16-bit, 11.8 V S/D converter 400 Hz 4 min 04 SDC-14576-112 14/16-bit, 11.8 V R/D converter 400 Hz 4 min 05 SDC-14575-114 14/16-bit,
9、 11.8 V S/D converter 400 Hz 2 min 06 SDC-14576-114 14/16-bit, 11.8 V R/D converter 400 Hz 2 min 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML C
10、ertification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military qualit
11、y class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufactu
12、rer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) m
13、ust be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified
14、 flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92048 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234
15、 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 26 Rectangular, bottom leaded, chip carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3
16、 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +7.0 V dc Negative supply voltage (VEE) . -7.0 V dc Reference input voltage 35 V rms Digital input voltage range. -0.3 V dc to +7.0 V dc Power dissipation, TA= +125C (PD). 170 mW Thermal resistance junction-to-case (JC) . 8.0C/W Thermal re
17、sistance junction-to-ambient (JA) 20C/W Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Positive supply voltage (VCC). +4.75 V dc to +5.25 V dc Negative supply voltage (VEE) . -4.75 V dc to -5.25 V dc Reference input volt
18、age range 2.0 V rms to 35 V rms Reference input carrier frequency range. 360 Hz to 5000 Hz Signal input voltage range. 10.62 V rms to 12.98 V rms Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following speci
19、fication, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification fo
20、r. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies
21、 of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawi
22、ng and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extende
23、d operation at the maximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92048 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B
24、 SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the dev
25、ice manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addi
26、tion, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(
27、s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwis
28、e specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for ea
29、ch subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general perfo
30、rmance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all para
31、meters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be req
32、uired from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as
33、 required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. Th
34、e modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test ci
35、rcuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the int
36、ent specified in method 1015 of MIL-STD-883. (2) TAor TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manuf
37、acturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92048 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance character
38、istics. Limits Test Symbol Conditions -55C TA +125C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Min Max Unit 01,02 14 A = 0 14 Resolution 1/ RES 2/ A = 1 7,8A,8B 03-06 16 Bits 01,02 -4 +4 03,04 -13 +13 Output accuracy 3/ AOUT 7,8A,8B 05,06 -7 +7 LSB Accuracy r
39、epeatability 3/ 4/ AR 7,8A,8B All -1.0 +1.0 LSB Reference input voltage range 4/ VIN14,5,6 All 2.0 35 V rms Single ended 60 Reference input impedance 4/ ZIN1Differential 4,5,6 All 120 k Reference input common mode range 4/ VCM14,5,6 All -50 +50 V pk Signal input common mode range 4/ VCM24,5,6 All -3
40、0 +30 V pk Line-to-line 52 Line-to-ground 01,03, 05 34 Single ended 70 Signal input impedance 4/ ZIN2 Differential 4,5,6 02,04,06 140 k Digital output low voltage 1/ VOLIOL= -1.6 mA 1,2,3 All 0.4 V Digital output high voltage 1/ VOHIOH= 0.4 mA 1,2,3 All 2.8 V Output leakage current 4/ IOZ1,2,3 All -
41、20 +20 A Digital input A. VIN= 2.0 V 03-06 pass/ fail Digital input high voltage 1/ VIHDigital inputs INH, EL, and EM. VIN= 2.0 V 1,2,3 01-06 pass/ fail See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC
42、UIT DRAWING SIZE A 5962-92048 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A
43、 subgroups Device type Min Max Unit Digital input A. VIN=0.8 V 03-06 pass/ fail Digital input low voltage 1/ VILDigital inputs INH, EL, and EM. VIN= 0.8 V 1,2,3 01-06 pass/ fail EL, EM, INH, internal pull-up 01,02 -2 -10 Digital input current 1/ IINA, internal pull down 4,5,6 03-06 200 A Inhibit vol
44、tage 1/ VINHNo digital angles change while INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 1/ VEEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01, 02, and bits 9 through 14/16 for device types 03 through 06. 7,8A,8B All 0.8
45、V Disable voltage 1/ (high impedance) VDEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01, 02, and bits 9 through 14/16 for device types 03 through 06. 7,8A,8B All 2.0 V Positive supply voltage ICCVCC= +5.25 V 1,2,3 All +17 mA Negative supply voltage IE
46、EVEE= -5.25 V 1,2,3 All -17 mA Analog velocity output voltage VOUT5/ 7,8A,8B All 3.24 4.00 V Bandwidth 1/ BW 7,8A,8B All 72 134 Hz 1/ These parameters are tested on a go-no-go basis only or in conjunction with other measured parameters and are not directly testable. 2/ Programmable to 14-bit or 16-b
47、it resolution. 3/ Output accuracy is measured at angles from 0, to 180, in 15 increments, and at 225, 270, and 315. 4/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all
48、lots not specifically tested. 5/ Analog output voltage is tested at 8 revolutions per second (rps) for device types 01, 02, and at 2 rps for device types 03 through 06. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92048 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Minimum Maximum Minimum Maximum A -
