1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R199-93. 93-07-01 M. A. FRYE B Add case outline X. Update thermal resistance in paragraph 1.3. Update boilerplate. Redrawn. -rrp 98-01-06 R. MONNIN C Add table IIB. Remove vendor CAGE 27014 from source of suppl
2、y for case outlines 2 and H. Add vendor CAGE 27014 to source of supply for device class V. -rrp 98-06-23 R. MONNIN D Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535. Drawing updated to reflect current requirements. - gt 04-05-07 R. MONNIN REV SHET REV SHET REV STATUS REV D D D D D
3、D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Rick C. Officer DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles E. Besore COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael
4、 A. Frye AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-12 MICROCIRCUIT, LINEAR, HIGH SPEED OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-92165 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E224-04 Provided by IHSNot for ResaleNo re
5、production or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consis
6、ting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PI
7、N. 1.2 PIN. The PIN is as shown in the following example: 5962 - 92165 01 M H X Federal stock class designator RHA designator (see 1.2.1) Devicetype (see 1.2.2) Deviceclass designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes
8、 Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA dev
9、ice. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LM6162 High speed operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as foll
10、ows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outl
11、ine(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier X GDFP1-G10 10 Flat pack with gullwing leads 1.2.5 Lead finis
12、h. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CENTER COLU
13、MBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (+VSto -VS) 36 V dc Differential input voltage. 8 V dc 2/ Common mode voltage range (+VS-0.7 V dc) to (+VS-0.3 V dc) Output short circuit to GND Continuous 3/ Operating suppl
14、y voltage range . 4.75 V dc to 32 V dc Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +260C Junction temperature (TJ). +150C Power dissipation (PD) 400 mW Thermal resistance, junction-to-case (JC): Cases H, P, and X . 21C/W Case 2 20C/W Thermal resistance, junction-
15、to-ambient (JA): Case H and X . 228C/W (still air, board mount) 140C/W (500 LFPM air flow mount) Case P 113C/W (still air, board mount) 51C/W (500 LFPM air flow mount) Case 2 90C/W (still air, board mount) 61C/W (500 LFPM air flow mount) 1.4 Recommended operating conditions. Positive supply voltage
16、(+VS) . +15 V dc Negative supply voltage (-VS). -15 V dc Phase margin. 45 Differential gain 0.1% Differential phase . 0.1 Power bandwidth 4.5 MHz Input noise voltage. 10 nV/ Hz Input noise current . 1.2 pA/ Hz Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Governm
17、ent specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. 1/ Stresses above the absolute max
18、imum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ In order to achieve optimum ac performance, the input stage was designed without protective clamps. Exceeding the maximum differential input voltage resul
19、ts in reverse breakdown of the base-emitter junction of one of the input transistors and probable degradation of the input parameters (especially VIOand IIO). 3/ Continuous short-circuit operation at elevated ambient temperatures can result in exceeding the maximum allowed junction temperature of +1
20、50C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-3
21、8535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit D
22、rawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of prece
23、dence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item require
24、ments. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herei
25、n. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PR
26、F-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical perfor
27、mance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requiremen
28、ts. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where markin
29、g of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535
30、. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVE
31、L D SHEET 5 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance
32、. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as a
33、n approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and he
34、rein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircui
35、ts delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class
36、 M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device clas
37、s M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the de
38、vice manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, s
39、creening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conform
40、ance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activ
41、ity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table IIA herein. Provided by I
42、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Co
43、nditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Input offset voltage VIO1 01 -5 +5 mV 2, 3 -8 +8 Input bias current IIB1 01 -3 +3 A 2, 3 -6 +6 Input offset current IIO1 01 -350 +350 nA 2, 3 -800 +800 Common mode voltage range +VCMVS= 15 V 1 01
44、 13.9 V 2, 3 13.8 +VS= +5 V 3/ 1 3.9 2, 3 3.8 -VCMVS= 15 V 1 -12.9 2, 3 -12.7 +VS= +5 V 3/ 1 1.8 2, 3 2.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CE
45、NTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Common mode rejection ratio CMRR
46、-12.9 V VCM 13.9 V 1 01 83 dB -12.7 V VCM 13.8 V 2, 3 79 Power supply rejection ratio PSRR 10 V VS 16 V 1 01 83 dB 2, 3 79 Output voltage swing +VOUTVS= 15 V, RL= 2 k 1 01 13.5 V 2, 3 13.3 +VS= 5 V, RL= 2 k 3/ 1 3.5 2, 3 3.3 -VOUTVS= 15 V, RL= 2 k 1 -13.0 2, 3 -12.7 +VS= 5 V, RL= 2 k 3/ 1 1.7 2, 3 2
47、.0 Output short circuit current IOSSource 1 01 -30 mA 2, 3 -20 Sink 1 30 2, 3 20 Total supply current ICC1 01 6.5 mA 2, 3 6.8 Large signal voltage gain AVOLVOUT= 10 V, RL= 2 k 4/ 4 01 1000 V/V 5, 6 500 Gain bandwidth product GBW f = 20 MHz 4 01 80 MHz 5, 6 55 See footnotes at end of table. Provided
48、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92165 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Slew rate +SR Rising edge, VOUT= -4 V to +4
