1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added RHA and class K devices. Added RHA requirements. Redrew entire document. -sld 97-10-23 K. A. Cottongim B Added case outlines Y and Z. Table I, IINmaximum limit, change from 4 mA to 5 mA. 99-07-12 Raymond Monnin C Made corrections to paragra
2、ph 4.3.5.a. Updated paragraph 1.2.3 to define the five reliability class levels. Made changes to table I . -sld 01-07-10 Raymond Monnin D Figure 1, case outlines Y and Z, change the maximum D/E dimension from 1.105“ (28.07 mm“) to 1.110“ (28.19 mm) and change the R maximum dimension from 0.600“ (1.5
3、2 mm) to .065“ (1.65 mm). 05-04-18 Raymond Monnin E Add paragraph 1.5 and note 2. Add paragraph 3.2.3. Table 1, add new note 2 for enhanced low dose rate effects (renumber remaining notes in sequence). Paragraph 4.3.5.a, add enhanced low dose rate effects. Add RHA level P to device type 02 in paragr
4、aphs 1.3, 1.5, 4.3.5 (table), table I, and SMD bulletin. -gz 07-06-06 Robert M. Heber F Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-09-03 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3
5、4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED
6、BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 15 VOLT, DUAL CHANNEL, DC/DC CONVERTER DRAWING APPROVAL DATE 93-12-06 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-93090 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E403-09 Provided by IHSNot for ResaleNo reproduction or networking permitte
7、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-3
8、8534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93090 01 H X
9、X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified R
10、HA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MSA2815D/883, MGA2815D/883 DC-DC converter, 5 W, 15 V outputs 02
11、 SMSA2815D DC-DC converter, 5 W, 15 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
12、and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in ap
13、plications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer g
14、uarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document;
15、 therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature r
16、ange. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) a
17、re as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-line Y See figure 1 20 Flat pack Z See figure 1 20 Flat pack with formed leads 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolu
18、te maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01 and 02 (non-RHA) 1.8 W Device type 02 (RHA levels P, L and R) 2.0 W Output power . 5.3 W Lead soldering temperature (10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended op
19、erating conditions. Input voltage range +16 V dc to +40 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels P, L and R) 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specificatio
20、n, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534
21、- Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HD
22、BK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict betwe
23、en the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damag
24、e to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for t
25、he conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVIS
26、ION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated
27、 in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device cla
28、ss. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Ca
29、se outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document re
30、vision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operati
31、ng temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device s
32、hall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables f
33、ormat) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control b
34、y the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall aff
35、irm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and in
36、spection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accord
37、ance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the a
38、cquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and f
39、inal electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
40、CUIT DRAWING SIZE A 5962-93090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL = 0,unless otherwise specified Group A subgroups D
41、evice types Limits Unit Min Max Output voltage +VOUTIOUT= 167 mA 1 01,02 14.85 15.15 V 2,3 01,02 14.40 15.60 P,L,R 1,2,3 02 14 16 -VOUT1 01,02 -14.70 -15.30 2,3 01,02 -13.80 -16.20 P,L,R 1,2,3 02 -14 -16 Output current 3/ IOUTVIN= 16 V dc to 40 V dc 1,2,3 01,02 0.0 267 mA P,L,R 02 0.0 0.700 VOUToutp
42、ut ripple voltage (VOUT) VRIPIOUT= 167 mA, B.W. = 10 kHz to 2 MHz 1 01 150 mV p-p 02 300 2,3 01 250 02 500 P,L,R 1,2,3 02 2 V p-p VOUTline regulation +VOUTVRLINEIOUT= 167 mA, VIN= 16 V dc to 40 V dc 1,2,3 01,02 50 mV P,L,R 02 100 -VOUT01,02 180 P,L,R 02 400 VOUTload regulation +VOUTVRLOADIOUT= 0 to
43、167 mA, both outputs changed simultaneously 1,2,3 01,02 50 mV P,L,R 02 100 -VOUT01,02 200 P,L,R 02 400 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93090 DEFENSE SUPPLY CENTE
44、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL = 0,unless otherwise specified Group A subgroups Device types Limits Unit Min Max Input c
45、urrent IINIOUT= 0, inhibit pin (pin 1) = 0 V dc 1,2,3 01,02 5 mA P,L,R 02 25 IOUT= 0, inhibit pin (pin 1) = open 01,02 60 P,L,R 02 100 Input ripple current IRIPIOUT= 167 mA, LIN = 2 H, B. W. = 10 kHz to 10 MHz 1 01 100 mA p-p 02 200 2,3 01 150 02 300 P,L,R 1,2,3 02 600 Efficiency Eff IOUT= 167 mA 1
46、01 70 % 02 68 2,3 01 68 02 66 P,L,R 1,2,3 02 64 Isolation ISO 500 V dc, Input to output, input to case or output to case, TC= +25C 1 01,02 100 M P,L,R 02 100 Short circuit internal power dissipation PDPD= PIN- total POUT1 01,02 1.6 W 2,3 1.8 P,L,R 1,2,3 02 2.0 Switching frequency FSIOUT= 167 mA 4 01
47、,02 450 600 kHz 5,6 01,02 400 620 P,L,R 4,5,6 02 400 600 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93090 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
48、LEVEL F SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN= 28 V dc 0.5 V, CL = 0,unless otherwise specified Group A subgroups Device types Limits Unit Min Max VOUTresponse to step transient load changes 4/ (VOUT) VOTLOAD50% load to/from 100% load; balanced loads on each output 4 01 -450 +450 mV pk 02 -600 +600 5,6 01,02 -1400 +1400 P,L,R 4,5,6 02 -3000 +3000 VOUTrecove
