1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added case outline Z. Added terminal connection diagram to figure 2. Added footnote to table I for the RONtest. -sld 94-01-19 K. A. Cottongim B Changes in accordance with NOR 5962-R213-96. -sld 96-08-30 K. A. Cottongim C Added vendor cage 31757 f
2、or device type 01. Redrew entire document. -sld 98-08-07 K. A. Cottongim D Add device type 02. 01-10-24 Raymond Monnin E Added a class E device for cage 50434. Updated paragraphs 3.1 and 4.2. Added paragraph 4.3.6 in section 4 for listing the class E exceptions. Added the class E part numbers in the
3、 Standard Microcircuit Drawing Bulletin page. -sld 02-05-01 Raymond Monnin F Add device type 03. 03-08-22 Raymond Monnin G Table I; For the Input-output insulation current test (II-O), under the condition block changed “RH 45 %“ to “RH 65 %“. Editorial changes throughout. -sld 04-09-16 Raymond Monni
4、n H Table I; Changed the symbols in the conditions block for the Output withstand voltage, Output on resistance, Output leakage current, Input forward voltage, Turn-on time, and Turn-off time tests. Editorial changes throughout. -sld 04-12-09 Raymond Monnin J Added footnote to paragraph 1.2.2. Re-wo
5、rded paragraph 4.3.6 for clarification of the class E requirements -sld. 05-08-09 Raymond Monnin K Updated drawing paragraphs. -sld 12-03-09 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV K K K K K K K K K K K K K K OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zah
6、n DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID
7、, LINEAR, POWER MOSFET, SINGLE CHANNEL, OPTOCOUPLER DRAWING APPROVAL DATE 93-07-23 REVISION LEVEL K SIZE A CAGE CODE 67268 5962-93140 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E253-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHSSTANDARD MICROCIRCUIT DR
8、AWING SIZE A 5962-93140 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are avai
9、lable and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93140 01 H P X Federal RHA Device Device Case Lead stock class designator typ
10、e class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designato
11、r. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 1/ Generic number Circuit function 01 HSSR-7111, HSSR-711E, 53111-1 Power switch with optically isolated control 02 HSSR-7112, 53111-2 Power switch with optically
12、isolated control 03 53111-3 Power switch with optically isolated control 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as
13、qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This leve
14、l is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming f
15、low, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the
16、device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may
17、have a limited temperature range. 1/ See paragraph 4.3.6 herein for class E device(s).Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93140 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outli
18、ne(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line Z See figure 1 8 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PR
19、F-38534. 1.3 Absolute maximum ratings. 1/ Input current (IFON) . 20 mA Peak repetitive input current (IFPK) . 40 mA 2/ Peak surge input current (IFPKsurge) . 100 mA 3/ Reverse input voltage (VR) . 5 V dc Output current: IO(AC or DC loads, connection A) 0.8 A IO(DC load only, connection B) 1.6 A Sing
20、le shot output current: IOPKsurge (AC or DC loads, connection A, pulse width 10 ms) 5.0 A IOPKsurge (DC load only, connection B, pulse width 10 ms) 10.0 A Output voltage: VO(AC or DC loads, connection A) -90 V to +90 V VO(DC load only, connection B) . 0 V to +90 V Output power dissipation (PO) . 800
21、 mW 4/ Junction temperature (TJ) . +150 C Case operating temperature (TC) . +145 C 5/ Thermal resistance junction-to-case (qJC) . 15 C/W Lead temperature (soldering, 10 seconds) . +260 C Storage temperature range -65 C to +150 C 1.4 Recommended operating conditions. Input current range (IFON) Device
22、 type 01 10 mA to 20 mA Device types 02 and 03 5 mA to 20 mA Input voltage range (VFON) 0 to 0.6 V Ambient operating temperature range (TA) -55 C to +125 C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade per
23、formance and affect reliability. 2/ Pulse width 100 ms, duty cycle 50 %. 3/ Pulse width 0.2 ms, duty cycle 0.1 %. 4/ Output power dissipation (PO) is obtained when the part is handling the maximum output current (IO). 5/ Case operating temperature (TC) is measured at the center of package bottom. Pr
24、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHSSTANDARD MICROCIRCUIT DRAWING SIZE A 5962-93140 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, a
25、nd handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Micro
26、circuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Stand
27、ard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text o
28、f this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements
29、for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer
30、 may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicabl
31、e device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The te
32、rminal connections shall be as specified on figure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Switching time test circuit and waveform(s). The switching time test circuit and waveform(s) shall be as specified on figure 4. 3.2.5 Output transient rejection tes
33、t circuit and waveform(s). The output transient rejection test circuit and waveform(s) shall be as specified on figure 5. 3.2.6 Input-output transient rejection test circuit and waveform(s). The input-output transient rejection test circuit and waveform(s) shall be as specified on figure 6. Provided
34、 by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93140 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL K SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as sp
35、ecified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of
36、 device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device des
37、cribed herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. Thi
38、s data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this d
39、rawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be
40、provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall
41、not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the man
42、ufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in m
43、ethod 1015 of MIL-STD-883. (2) TAshall be +125 C minimum. Classes H, G, and D shall be 160 hours minimum. Classes K and E shall be 320 hours minimum. b. The class E device(s) shall meet the class K screening requirements of MIL-PRF-38534, except as specified herein. c. Interim and final electrical t
44、est parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for Resale-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93140 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 RE
45、VISION LEVEL K SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55 C TA +125 C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output withstand voltage VO(OFF) VF= 0.6 V, IO= 10 mA 1,2,3 All 90 V Output on resistance:
46、 Connection A Connection B RONIF= 10 mA, IO= 800 mA, pulse duration 30 ms 1/ 1,2,3 01 1.0 W IF= 5 mA, IO= 800 mA, pulse duration 30 ms 1/ 02,03 1.0 IF= 10 mA, IO= 1.6 A, pulse duration 30 ms 1/ 2/ 1,2,3 01 0.25 IF= 5 mA, IO= 1.6 A, pulse duration 30 ms 1/ 2/ 02,03 0.25 Output leakage current IO(OFF)
47、VF= 0.6 V, VO= 90 V 1,2,3 All 10 mA Input forward voltage VFOFFIF= 10 mA 1,2,3 01 1.0 1.7 V IF= 5 mA 02,03 1.0 1.7 Input reverse breakdown voltage VrIr= 100 mA 1,2,3 All 5.0 V Input-output insulation current 3/ 4/ II-OVI-O= 1500 V dc, t = 5 s, RH 65 %, TA= +25 C 1 All 1.0 mA Turn-on time tONIF= 10 m
48、A, VDD= 28 V dc, IO= 800 mA, see figure 4. 9,10,11 01 6.0 ms IF= 5 mA, VDD= 28 V dc, IO= 800 mA, see figure 4. 02,03 6.0 Turn-off time tOFFIF= 10 mA, VDD= 28 V dc, IO= 800 mA, see figure 4. 9,10,11 01 0.25 ms IF= 5 mA, VDD= 28 V dc, IO= 800 mA, see figure 4. 02,03 0.25 Output transient rejection dVO/dt VO(PEAK)= 50 V, CM= 1000 pF, RM 1 MW, CL= 15 pF, TA= +25 C, see figure 5. 9 All 1000 V/ms Input-output transient rejection dVI-O/dt VDD= 5 V dc, CL= 15 pF, VI-O(PEAK)= 50 V, RL= 20 kW, TA= +25 C, see figure 6. 9 All 500 V/ms 1/ During the pulse RO
