1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes IAW NOR 5962-R209-94. - tvn 94-06-08 Monica L. Poelking B Update boilerplate to MIL-PRF-38535 requirements. Add footnote 6 to paragraph 1.4. jak 00-12-04 Thomas M. Hess C Update the boilerplate paragraphs to current requirements as specif
2、ied in MIL-PRF-38535. - jak 09-04-01 Thomas M. Hess REV SHEET REV C C C C C C SHEET 15 16 17 18 19 20 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Thanh V. Nguyen STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen DEFENSE SUPP
3、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-11-15 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT REGISTERED TRANSCEIVER
4、 WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-93241 SHEET 1 OF 20 DSCC FORM 2233 APR 97 5962-E241-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR
5、AWING SIZE A 5962-93241 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V)
6、. A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93241 01 M X A Federal R
7、HA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked
8、with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
9、 Device type Generic number Circuit function 01 54ABT16543 16-bit registered transceiver with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements
10、documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-18
11、35 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-56 56 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or net
12、working permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93241 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input vol
13、tage range (except I/O ports) (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VIN 0.0 V). -18 mA DC output clamp current (IOK) (VOUT 0.0 V). -50 mA DC output current (IOUT) (per output) . +96 mA VCCcurrent (IVCC). 514 mA Ground
14、 current (IGND). 1059 mA Storage temperature range (TSTG). -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C Maximum power dissipation (PD) . 615 mW 5/ 1.4 Recommended operating conditions. 2/ 3/
15、 6/ Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCC Maximum low level input voltage (VIL) +0.8 V Minimum high level input voltage (VIH). +2.0 V Case operating temperature range (TC). -55C to +125C Maximum input
16、 rise and fall rate (t/V) 10 ns/V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliabi
17、lity. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative voltage ratings may be exceeded provided that the input an
18、d output clamp current ratings are observed. 5/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein and n represents the total number of outputs. 6/ Unused pins (input or I/O) must be
19、held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93241 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2.
20、 APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. D
21、EPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MI
22、L-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.
23、) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements
24、 for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
25、 device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q
26、 and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figu
27、re 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce test circuit and waveforms. The ground bounce test circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall b
28、e as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93241 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical perform
29、ance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements.
30、The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of
31、the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Mar
32、king for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-385
33、35, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required f
34、rom a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q an
35、d V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A s
36、hall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
37、 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10
38、Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 126 See MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
39、IZE A 5962-93241 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test condition 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type
40、VCCGroup A subgroups Limits 3/ Unit Min Max VOH1For all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 V VOH2For all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -3 mA All 5.0 V 1, 2, 3 3.0 High level output voltage 3006 VOH3For all i
41、nputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 Low level output voltage 3007 VOLFor all inputs affecting output under test VIH= 2.0 V or VIL= 0.8 V IOL= 48 mA All 4.5 V 1, 2, 3 0.55 V Negative input clamp voltage 3022 VIC-For input under test IIN= -18 mA
42、 All 4.5 V 1, 2, 3 -1.2 V Three-state output leakage current high 3021 IOZH4/ 5/ For control inputs affecting output under test, VIN= VIHor VIL VIH= 2.0 V VIL= 0.8 V VOUT= 2.7 V All 5.5 V 1, 2, 3 10.0 A Three-state output leakage current low 3020 IOZL4/ 5/ For control inputs affecting output under t
43、est, VIN= VIHor VIL VIH= 2.0 V VIL= 0.8 V VOUT= 0.5 V All 5.5 V 1, 2, 3 -10.0 A Off-state leakage current IOFFFor input or output under test VINor VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100.0 A High-state leakage current ICEXFor output under test VOUT= 5.5 V Outputs at high logic state All
44、5.5 V 1, 2, 3 50.0 A Control inputs 5.5 V 1, 2, 3 +1.0 Input current high 3010 IIH6/ For input under test, VIN= VCCA or B ports All 5.5 V 1, 2, 3 +100 A Control inputs 5.5 V 1, 2, 3 -1.0 Input current low 3009 IIL6/ For input under test, VIN= GND A or B ports All 5.5 V 1, 2, 3 -100 A Output current
45、3011 IOUT 7/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50.0 -200.0 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93241 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO
46、N LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test condition 2/ -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Quiescent supply current
47、delta, TTL input levels 3005 ICC8/ For input under test, VIN= 3.4 V For all other inputs VIN= VCCor GND All 5.5 V 1, 2, 3 0.5 mA Quiescent supply current, outputs high 3005 ICCHVIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 2.0 mA Quiescent supply current, outputs low 3005 ICCLVIN= VCCor GND IOUT= 0.0
48、 A All 5.5 V 1, 2, 3 35.0 mA Quiescent supply current, outputs disabled 3005 ICCZVIN= VCCor GND IOUT= 0.0 A All 5.5 V 1, 2, 3 2.0 mA Input capacitance 3012 CINSee 4.4.1c TC= +25C Control inputs All 5.0 V 4 10.5 pF I/O capacitance 3012 CI/OSee 4.4.1c TC= +25C A or B ports All 5.0 V 4 15.0 pF Low level ground bounce noise VOLP9/ All 5.0 V 4 880 mV Low level ground bounce noise VOLV9/ All 5.0 V 4 -1250 mV High level VCCbounce noise VOHP9/ All 5.0 V 4 1375 mV High level VCCbounce noise VOHV9/ VIH= 3.0 V VIL= 0.0 V TA= +25C See figure 4 See 4.4.1d All 5.0 V 4 -550 m
