1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Paragraph 1.2.2, correct the generic number. Update drawing boilerplate. 04-07-28 Raymond Monnin REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER
2、 COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, OPERATIONAL AMPLIFIER AND AGENCIES OF THE DEPARTMENT O
3、F DEFENSE DRAWING APPROVAL DATE 96-10-28 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-94520 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E354-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENS
4、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflect
5、ed in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 94520 01 H X A Federal RHA Device Device Case Lead stock class designator type class outline finis
6、h designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicat
7、es a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OM3894 Operational amplifier, medium power 1.2.3 Device class designator. This device class designator shall be a single letter identifying the produ
8、ct assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability
9、class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the
10、Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other cla
11、sses (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufactur
12、er specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 D
13、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 14 Flat pack, surface mount
14、 Y See figure 1 14 Flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) 40 V dc Differential input voltage VCC Common mode input voltage VCCMaximum power dissipation (PD) 2/ 3/. 125 WStorage temperature range . -65
15、C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) 2.2C/W Junction temperature (TJ) +200C 1.4 Recommended operating conditions. Supply voltage (VCC) . 34 V dc Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Governm
16、ent specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIO
17、N MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit
18、Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of prece
19、dence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute m
20、aximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate 2.2C/W above +25C. 3/ TA +25C.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRC
21、UIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Co
22、mpliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the per
23、formance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, const
24、ruction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance cha
25、racteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II
26、. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In
27、addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should
28、include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certifica
29、te of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A
30、certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Qua
31、lity Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test conditi
32、on A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicabl
33、e, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in
34、are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97
35、TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C VCC= 34 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Input offset voltage VIO TA= +25C 1 01 -1 +1 mV Input offset voltage drift VIOTTA= -55C and +125C 2,3 01 -30 +30 V/C Input b
36、ias current IIB1,2,3 01 -50 +50 pA 1 -30 +30 pA Input offset current IOS2,3 01 -20 +20 nA 1 -10 +10 +PSRR -VCC= -34V dc, +VCC= +10 V to +40 V dc 2,3 01 -20 +20 V/V 1 -10 +10 Power supply rejection ratio -PSRR+VCC= +34V dc, -VCC= -10 V to -40 V dc 2,3 01 -20 +20 V/V 1 95 Common mode rejection ratio C
37、MRR VCM= 22 V dc, f = dc 2,3 01 90 dB Supply currents ICCVCM= 0 V, no load condition 1,2,3 01 -30 +30 mA IO= .94 A peak, RL= 30, 10 kHz sine wave, TA= +25C 4 28.0 Output voltage peak VOPRL= 10 k, 10 kHz sine wave, TA= -55C and +125C 5,6 01 30 V See footnotes at end of table. Provided by IHSNot for R
38、esaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Sym
39、bol Conditions -55C TA +125C VCC= 34 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Output current peak IOPRL= 30, VOUT= 28 V, TA= +25C 1/ 4 01 0.75 A 4 95 5 90 Voltage gain AVS RL= 10 k 6 01 85 dB Slew rate SR RL= 10.0, TA= +25C 7 01 6 V/s 1/ Internal current limit circu
40、itry is controlled by a single external resistor, RCL. To calculate the value of the current limit resistor, use RCL= (0.809/ILIM) - 0.057, where ILIMis equal to the desired output current (IOP). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD
41、 MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline X. DETAIL A mm Inches 0.08 .003 0.13 .005 0.15 .006 0.51 .020 0.76 .030 1.02 .040 1.09 .043 1.27 .050 2.54 .100 FIGURE 1. Case outline(s).Provi
42、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Case outline Y. Millimeters Inches Symbol Min Max Min Max
43、 A 2.90 3.55 .115 .140 b 0.30 0.46 .012 .018 C 0.18 0.33 .007 .013 D 9.55 9.75 .375 .385 E 9.55 9.75 .375 .385 E1 14.45 15.00 .570 .590 e 1.27 BSC .050 BSC L 8.90 12.70 .350 .500 Q 1.40 1.65 .055 .065 S 1.02 BSC .040 BSC NOTES: 1. The U.S. government preferred system of measurement is the metric SI.
44、 This item was designed using inch- pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
45、e from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outlines X and Y Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 +VCC+VCCVOUTVOUT-IN +IN -VCC-VCC-
46、VCCVOUTVOUT+VCC+VCCVSCFIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94520 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR
47、97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3 Group A test requirements 1, 2, 3 Group C end-point electrical parameters 1, 2, 3 End-point
48、 electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534
