1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREV SHEETREVSHEETREV STATUSOF SHEETSREVSHET 12345678 910PMIC N/APREPARED BY RICK OFFICERDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDMICROCIRCUITDRAWINGTHIS DRAWING ISAVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF D
2、EFENSEAMSC N/A CHECKED BYRAJESH PITHADIAMICROCIRCUIT, LINEAR, PRECISION, HIGH SLEWRATE, WIDEBAND OPERATIONAL AMPLIFIER, MONOLITHIC SILICONAPPROVED BYMICHAEL FRYEDRAWING APPROVAL DATE96-01-31SIZEACAGE CODE672685962-96737REVISION LEVELSHEET 1 OF 10DESC FORM 193JUL 94 5962-E300-96DISTRIBUTION STATEMENT
3、 A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET2DESC FORM 193AJUL 941. SCOPE
4、1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part orIdentifying Number (PIN). When available, a ch
5、oice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.1.2 PIN. The PIN is as shown in the following example:5962 - 96737 01 Q G X G0DG0D G0DG0D G0DG0DG0DG0D G0DG0D G0DG0DG0D G0D G0D G0D G0D G0D Federal RHA Device Device Case Lead stock class designator type class outline finishd
6、esignator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3)/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and aremarked with the appropriate RHA designator. Device class M RHA marked devices meet the
7、 MIL-PRF-38535, appendix Aspecified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.1.2.2 Device type(s). The device type(s) identify the circuit function as follows:Device type Generic number Circuit function01 HA-2548 Precision, high slew rate,
8、widebandoperational amplifier1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows:Device class Device requirements documentationM Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JANclass level B
9、microcircuits in accordance with MIL-PRF-38535, appendix AQ or V Certification and qualification to MIL-PRF-385351.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleG MACY1-X8 8 Can P GDIP1-T8 or CDI
10、P2-T8 8 Dual-in-line1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix Afor device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELE
11、CTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET3DESC FORM 193AJUL 941.3 Absolute maximum ratings. 1/Voltage between +V and -V terminals 40 VSSDifferential input voltage . 5 VVoltage at either input terminal +V to -VSSPeak output current (10 % duty cycle) . 60 mAContinuous
12、 output current . 40 mAPackage power dissipation (P ): (T = +75G28C)DACase G . 0.70 W 2/Case P 1.03 W 2/Junction temperature (T ) +175G28CJLead temperature (soldering, 10 seconds) . +300G28CStorage temperature range. -65G28C to +150G28CThermal resistance, junction-to-case (G14 ) See MIL-STD-1835JCTh
13、ermal resistance, junction-to-ambient (G14 ):JACase G . 142G28C/WCase P 97G28C/W1.4 Recommended operating conditions.Supply voltage (V ) 15 VSAmbient operating temperature range (T ) -55G28C to +125G28CACommon mode input voltage (V ) G061/2 (+V - -V )INCM S SLoad resistance (R ) G071 kG36L2. APPLICA
14、BLE DOCUMENTS2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part ofthis drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issueof the Department of Defense In
15、dex of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation.SPECIFICATIONMILITARYMIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.MIL-STD-973 - Configuratio
16、n Management.MIL-STD-1835 - Microcircuit Case Outlines.HANDBOOKSMILITARYMIL-HDBK-103 - List of Standard Microcircuit Drawings (SMDs).MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
17、Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text ofthis drawing takes precedence. Nothing in this document, however, supersedes applicable
18、laws and regulations unless a specificexemption has been obtained.1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect reliability.2/ Derating factor above T = +75G28C for case G is 7.0 mW/G
19、28C and for case P is 10.3 mW/G28C.AProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET4DESC FORM 193AJUL 943. REQUIREMENTS3.1 Item require
20、ments. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QMplan shall not affect the form, fit, or function as described herein.
21、 The individual item requirements for device class M shall be inaccordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified inMIL-PRF-385
22、35 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.3 Electrical performance ch
23、aracteristics and postirradiation parameter limits. Unless otherwise specified herein, the electricalperformance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambientoperating temperature range.3.4 Electrical test requirements. The ele
24、ctrical test requirements shall be the subgroups specified in table II. The electrical testsfor each subgroup are defined in table I.3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be markedas listed in MIL-HDBK-103. For packages w
25、here marking of the entire SMD PIN number is not feasible due to space limitations, themanufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designatorshall still be marked. Marking for device classes Q and V shall be in accordance with MIL-
26、PRF-38535. Marking for device class Mshall be in accordance with MIL-PRF-38535, appendix A.3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required inMIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in
27、MIL-PRF-38535, appendix A.3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listedmanufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate ofcompliance shall be re
28、quired from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see6.6.2 herein). The certificate of compliance submitted to DESC-EC prior to listing as an approved source of supply for this drawingshall affirm that the manufacturers product meets, for device classe
29、s Q and V, the requirements of MIL-PRF-38535 and herein orfor device class M, the requirements of MIL-PRF-38535, appendix A and herein.3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or fordevice class M in MIL-PRF-38535, appendix
30、A shall be provided with each lot of microcircuits delivered to this drawing.3.8 Notification of change for device class M. For device class M, notification to DESC-EC of change of product (see 6.2 herein)involving devices acquired to this drawing is required for any change as defined in MIL-STD-973
31、.3.9 Verification and review for device class M. For device class M, DESC, DESCs agent, and the acquiring activity retain theoption to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made availableonshore at the option of the reviewer.3.10 Mic
32、rocircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuitgroup number 49 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE
33、ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET5DESC FORM 193AJUL 94TABLE I. Electrical performance characteristics.Test Symbol Conditions-55C G06 T G06+125CAunless otherwise specifiedGroup AsubgroupsDeviceTypeLimits UnitMin MaxInput offset voltage 1/VIOV = 0 VCM1 01 -
34、900 900 V2, 3 -1200 1200Input bias current 1/+IBV = 0 V, +R = 100.1 kG36,CM S-R = 100 G36S1 01 -50 50 nA2, 3 -100 100-IBV = 0 V, +R = 100 G36,CM S-R = 100.1 kG36S1 -50 502, 3 -100 100Input offset current 1/+IIOV = 0 V, +R = 100.1 kG36,CM S-R = 100 G36S1 01 -50 50 nA2, 3 -100 100-IIOV = 0 V, +R = 100
35、 G36,CM S-R = 100.1 kG36S1 -50 502, 3 -100 100Common mode range 1/ +CMR +V = +8 V, -V = -22 VSS1, 2, 3 01 7 V-CMR +V = +22 V, -V = -8 VSS1, 2, 3 -7Large signal voltage 1/gain+AVOLV = 0 V and +10 V,OUTR = 1 kG36L4 01 114 dB5, 6 108-AVOLV = 0 V and -10 V,OUTR = 1 kG36L4 1145, 6 108Common mode rejectio
36、n 1/ratio+CMRR G0CV = +2 V, V = -2 VCM OUT+V = +13 V, -V = -17 VSS10180 dB2, 3 80-CMRR G0CV = -2 V, V = +2 VCM OUT+V = +17 V, -V = -13 VSS182, 3 80Output voltage swing 1/+VOUTR = 1 kG36L4, 5, 6 01 11 V-VOUTR = 1 kG36L4, 5, 6 -11Output current 1/+IOUTV = +10 VOUT4, 5, 6 01 30 mA-IOUTV = -10 VOUT4, 5,
37、 6 -30Quiescent power supply 1/current+ICCV = 0 V, I = 0 mAOUT OUT1, 2, 3 01 18 mA-ICCV = 0 V, I = 0 mAOUT OUT1, 2, 3 -18Power supply rejection 1/ratio+PSRR G0CV = 10 VSUP+V = +10 V, -V = -15 VSS+V = +20 V, -V = -15 V1, 2, 3 01 86 dB-PSRR G0CV = 10 VSUP+V = +15 V, -V = -10 VSS+V = +15 V, -V = -20 V1
38、, 2, 3 86See footnote at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET6DESC FORM 193AJUL 94TABLE I. Electrical performan
39、ce characteristics - Continued.Test Symbol Conditions-55C G06 T G06+125CAunless otherwise specifiedGroup AsubgroupsDeviceTypeLimits UnitMin MaxAverage offset 2/ 3/voltage driftVTCIOV = 0 VCM1, 2, 3 01 7 V/G28COffset voltage adjustment V ADJIO2/ 3/ 4/1 mVInput noise voltage 2/ 3/densityENR = 10 G36,
40、f = 1 kHzSO101 13nV/G08G09HG09zInput noise current 2/ 3/densityINR = 10 G36, f = 1 kHzSO101 1.0pA/G08G09HG09zGain bandwidth 2/ 3/productGBWP V = 1.0 V, f = 1 MHzOO4 01 130 MHz5, 6 110Slew rate 2/ 3/ +SR V = -5 V to +5 VOUT40180 V/s5, 6 70-SR V = +5 V to -5 VOUT485, 6 70Full power bandwidth FPBW V =
41、10 V 2/ 3/ 5/PEAK4011. MHzMinimum closed loop 2/ 3/stable gainCLSG R = 1 kG36, C = 10 pFLL4, 5, 6 01 5 V/VRise and fall time 2/ 3/tRV = -100 mV to OUT+100 mV,measured between 10 %and 90 % points901 15 ns10, 11 20tFV = +100 mV to OUT-100 mV,measured between 10 %and 90 % points91510, 11 20Overshoot 2/
42、 3/ +OS V = -100 mV to OUT+100 mV401 30 %5, 6 35-OS V = +100 mV to OUT-100 mV435, 6 35Settling time 2/ 3/tSTo 0.01% for a 10 V step 9 01 260 nsPower consumption 2/ 3/ 6/PCV = 0 V, I = 0 mAOUT OUT1, 2, 3 01 540 mW1/ Unless otherwise specified, V = 15 V, load resistance (R ) = 100 kG36, and V = 0 V.SL
43、OUT2/ Unless otherwise specified, V = 15 V, load resistance (R ) = 1 kG36, and load capacitance (C ) G06 10 pF.L3/ These tests are controlled via design or process and are not directly tested. These parameters are characterized on initialdesign release and upon design changes which affect these char
44、acteristics.4/ Offset adjustment range is (V (measured) 1 mV) minimum referred to output. This test is for functionality only to assureIOadjustment through 0 V. 5/ Full power bandwidth guarantee based on slew rate measurement using FPBW = slew rate/(2 x G25 x V ).PEAK6/ Power consumption based upon
45、quiescent supply current test maximum. No load on outputs.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET7DESC FORM 193AJUL 94Device ty
46、pe 01Case outlines G and PTerminal number Terminal symbol12345678+BALANCE-INPUT+INPUT-VS-BALANCEOUTPUT+VSCOMPENSATIONFIGURE 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY
47、 CENTERDAYTON, OHIO 45444SIZEA5962-96737REVISION LEVEL SHEET8DESC FORM 193AJUL 944. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Man
48、agement (QM) plan. The modification in the QM plan shall notaffect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordancewith MIL-PRF-38535, appendix A.4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted onall devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance withmethod 5004 of MIL-STD-883, and shall be conducted on all devices prior to qual
