1、 EIA STANDARD TP-37C Contact Engagement and Separation Test Procedure for Electrical Connectors EIA-364-37C (Revision of EIA-364-37B) June 2009 ANSI/EIA-364-37C-2009(R2015) Approved: June 11, 2009 Reaffirmed: March 23, 2015 EIA-364-37C NOTICE EIA Engineering Standards and Publications are designed t
2、o serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such
3、 Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA mem
4、bers, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assum
5、e any obligation whatever to parties adopting the Standard or Publication. This EIA standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progresses to the point where a valid comparison between the EIA Standard a
6、nd the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicabil
7、ity of regulatory limitations before its use. (From Standards Proposal No. 5184, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Socket Standards, and reaffirmed per Standards Proposal No. 5345.10). Published by Electronic Components Industry Association 2015 St
8、andards rate of application not to exceed 0.051 meter per minute (2 inches per minute). Depth of engagement shall be as specified. Faster rates of application for automatic test equipment may be used (for in process testing only). EIA-364-37C Page 3 4.1.4 The spring member of the contact shall be co
9、nditioned by inserting and withdrawing the maximum size gauge one time unless otherwise specified in the referencing document. 4.1.5 The maximum size gauge shall be engaged to the specified depth and the force required to mate the gauge shall be measured. The gauge shall then be removed. 4.1.6 The m
10、inimum size gauge shall be engaged to the specified depth. The gauge shall then be withdrawn and the force required to withdraw the gauge shall be measured. 4.2 Method B, approved mating component This method measures the force to engage and separate an approved mating component with the spring memb
11、er contact under test. Due to the variations in the mating component size and surface finish, this method is less consistent than method A. 4.2.1 Unless otherwise specified, axial forces shall be applied gradually; rate of application not to exceed 0.051 meter per minute (2 inches per minute). Depth
12、 of engagement shall be as specified. Faster rates of application for Automatic Test Equipment may be used (for in process testing only). 4.2.2 The spring member of the contact shall be conditioned by inserting and withdrawing an approved mating component one time unless otherwise specified in the r
13、eferencing document. 4.2.3 An approved mating component shall be engaged to the specified depth and the force required to engage the mating component shall be measured. 4.2.4 The mating component shall then be withdrawn and the force required to withdraw the mating component shall be measured. 4.2.5
14、 The mating component shall not be used for further testing. 4.3 Method C, gauge force This method utilizes GO-NO GO type testing, with gauges, to determine if the spring member contact meets the engagement and separation force limits as specified by the referencing document. This method shall be th
15、e referee method in case of dispute. 4.3.1 Gauges shall be cleaned prior to use and periodically (typically every 10 cycles) to remove any foreign surface film that may affect the engagement or separation limits. EIA-364-37C Page 4 4.3.2 Depth of engagement shall be as specified. 4.3.3 The spring me
16、mber of the contact shall be conditioned by inserting and withdrawing the maximum size gauge one time unless otherwise specified in the referencing document. 4.3.4 The contact shall be positioned such that the axis of mating is vertical. 4.3.5 Align and place a maximum size and weight gauge such tha
17、t gravity will tend to mate the gauge with the spring member contact under test. The gauge shall engage with the spring member contact under test. Remove the gauge. 4.3.6 A minimum size and weight gauge shall be engage with the spring member contact under test. Slowly bring the gauge and contact int
18、o a vertical position such that gravity will tend to withdraw the gauge. The spring member contact under test shall retain the gauge. Remove the gauge. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Applicable test pin, blade, or mating component
19、5.2 Depth of test pin or blade engagement 5.3 Rate of engagement or separation 5.4 Number of contacts to be tested 5.5 Preparation of conditioning of test specimen, if required 5.6 Test method to be used EIA-364-37C Page 5 6 Test documentation Documentation shall contain the details specified in cla
20、use 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description, including fixture if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure and test method 6.5 Values and observations 6.5 Name of operator start/finish date(s) of test E
21、IA-364-37C Page 6 A Contact size Minimum + 0.002 (0.0001) - 0.000 (0.0000) Maximum + 0.000 (0.0000) - 0.002 (0.0001) B Maximum flat 24 0.622 (0.0245) 0.648 (0.0255) 0.18 (0.007) 23 0.660 (0.0260) 0.699 (0.0275) 22 0.749 (0.0295) 0.775 (0.0305) 20 0.991 (0.0390) 1.041 (0.0410) 16 1.562 (0.0615) 1.613
22、 (0.0635) 0.38 (0.015) 12 2.362 (0.0930) 2.413 (0.0950) 10 3.150 (0.1240) 3.200 (0.1260) 0.76 (0.030) 8 3.581 (0.1410) 3.632 (0.1430) 6 4.496 (0.1770) 4.547 (0.1790) 4 5.690 (0.2240) 5.740 (0.2260) 2 7.163 (0.2820) 7.214 (0.2840) 0 9.042 (0.3560) 9.093 (0.3580) 1.52 (0.060) 4/0 12.675 (0.4990) 12.72
23、5 (0.5010) NOTES 1 Dimensions in parentheses are inch. 2 Material: Tool steel or tungsten carbide for all gages; handle optional 3 Finish: 0.15 micrometer (6 microinches) to 0.25 micrometer (10 microinches) 4 Plating: None. Figure 1 - Gage pin for socket contact engagement test EIA-364-37C Page A-1
24、Annex A Previous MIL-STD-1344 designations (Informative) This informative annex is provided as a cross reference to the designations previously contained in MIL-STD-1344, method 2014.1. Table A.1 Test duration designation EIA-364-37 designations MIL-STD-1344, method 2014 designations Method A Proced
25、ure I Method B Procedure II Method C - Revision History Revision letter Project number Additions, changes and deletions C SP-5184 Delete gage pin material column in figure 1 Revised paragraph 6.5 and Note 2 in figure 1 Add Annex ECIA Document Improvement Proposal If in the review or use of this docu
26、ment, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245)
27、Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
