1、BRITISH STANDARDBS EN 61338-1-4:2006Incorporating corrigendum no. 1Waveguide type dielectric resonators Part 1-4: General information and test conditions Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequencyThe European Standard EN 61338-
2、1-4:2006 has the status of a British StandardICS 31.140g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 61338-1-4:2006This British Standard was
3、 published under the authority of the Standards Policy and Strategy Committee on 27 February 2006 BSI 2007ISBN 978 0 580 60887 2National forewordThis British Standard is the UK implementation of EN 61338-1-4:2006, incorporating corrigendum November 2006. It is identical with IEC 61338-1-4:2005.The U
4、K participation in its preparation was entrusted to Technical Committee EPL/49, Piezo-electric devices for frequency control and selection.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary
5、provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard cannot confer immunity from legal obligations.Amendments issued since publicationAmd. No. Date Comments17504 Corrigendum No. 131 December 2007 In the EN foreword, the last paragraph is rep
6、laced. Addition of Annex ZAEUROPEAN STANDARD EN 61338-1-4NORME EUROPENNE EUROPISCHE NORM February 2006 CENELECEuropean Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart
7、35, B - 1050 Brussels 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61338-1-4:2006 E ICS 31.140 English version Waveguide type dielectric resonators Part 1-4: General information and test conditions - Measurement method of
8、complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005)Rsonateurs dilectriques modes guids Partie 1-4: Informations gnrales et conditions dessais - Mthode de mesure de la permittivit relative complexe des matriaux des rsonateurs dilectriques
9、 fonctionnant des frquences millimtriques (CEI 61338-1-4:2005) Dielektrische Resonatoren vom Wellenleitertyp Teil 1-4: Allgemeine Informationen und Prfbedingungen - Messverfahren fr die komplexe relative Dielektrizittskonstante von dielektrischen Resonatorwerkstoffen im Mikrowellen-Frequenzbereich (
10、IEC 61338-1-4:2005) This European Standard was approved by CENELEC on 2005-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists
11、and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the resp
12、onsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hun
13、gary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. Incorporating corrigendum November 2006Foreword The text of document 49/748/FDIS, future edition 1 of IEC 61338-1-4, prepared
14、 by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61338-1-4 on 2005-12-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by pu
15、blication of an identical national standard or by endorsement (dop) 2006-09-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2008-12-01 _ Endorsement notice The text of the International Standard IEC 61338-1-4:2005 was approved by CENELEC as a Europea
16、n Standard without any modification. _ EN 61338-1-4:2006 2 Annex ZA has been added by CENELEC. 3 EN 61338-1-4:2006CONTENTS1 Scope and object52 Normative references .53 Measurement parameter.64 Dielectric rod resonator method excited by NRD-guide 74.1 Measurement equipment and apparatus.74.2 Theory a
17、nd calculation equations.104.3 Measurement procedure 154.4 Example of measurement result .185 Cut-off waveguide method excited by coaxial cables with small loops 205.1 Measurement equipment and apparatus.205.2 Theory and calculation equations.225.3 Measurement procedure 27Annex A (informative) Error
18、s on rH caused by air gap between dielectric specimen and upper conducting plate .29Annex B (informative) Derivation of equation (15) for rV .30Bibliography .32Figure 1 Schematic diagram of measurement equipment 7Figure 2 Measurement apparatus of dielectric rod resonator method excited by NRD-guide8
19、Figure 3 Waveguide transducer from NRD-guide to waveguide .10Figure 4 Configuration of a cylindrical dielectric rod resonator short-circuited at both ends by two parallel conducting plates 11Figure 5 Calculations of 2u and W as a function of 2v for TE011, TE021and TE031resonance modes .12Figure 6 Co
20、nfiguration of reference dielectric resonator for measurement of rV of conducting plates14Figure 7 Diameter d of TE011, TE021and TE031mode resonators with resonance frequency of 60 GHz .17Figure 8 Diameter d of TE011, TE021and TE031mode resonators with resonance frequency of 77 GHz .18Figure 9 Examp
21、le of TE021mode resonant peak .19Figure 10 Measurement result of temperature dependence of 0f and H of sapphire 20Figure 11 Measurement apparatus for cut-off waveguide method 21Figure 12 Frequency response for the empty cavity with dimensions of d = 7 mm and h = 31 mm 23Figure 13 Correction term aHH
22、 / .25Figure 14 Correction terms AA/ and BB / .26Annex ZA (normative) Normative references to international publications with theircorresponding European publications.33EN 61338-1-4:2006 4 Figure 15 Measurement apparatus for temperature coefficient of relative permittivity.27Figure 16 Mode chart of
23、TE011and TE013modes for an empty cavity28Figure A.1 Error on H caused by air gap between dielectric specimen and upper conducting plates29Table 1 Diameter of conducting plate .9Table 2 Dimension of dielectric strip of NRD-guide .9Table 3 Dimensions of waveguide transducer .9Table 4 Dimensions of ref
24、erence sapphire resonators and their partial electric energy filling factor Peand geometric factor G 14Table 5 Diameter d of test specimens for 60 and 77 GHz measurement. Height h is fixed to 2,25 mm and 1,80 mm for 60 GHz and 77 GHz measurement, respectively 16Table 6 Measurement results of rV of c
25、onducting plates.19Table 7 Measurement results of H and tan G of sapphire and PTFE specimen 19Table 8 Recommended dimensions for conducting cylinder.22 5 EN 61338-1-4:2006WAVEGUIDE TYPE DIELECTRIC RESONATORS Part 1-4: General information and test conditions Measurement method of complex relative per
26、mittivity for dielectric resonator materials at millimetre-wave frequency 1 Scope and object This part of IEC 61338 describes the measurement method of dielectric properties for dielectric resonator materials at millimetre-wave frequency. This standard consists of two measurement methods: a) the die
27、lectric rod resonator method excited by NRD-guide (Non-Radiative Dielectric waveguide) and b) the cut-off waveguidemethod excited by coaxial cables with small loops. a) The dielectric rod resonator method excited by NRD-guide is similar to the dielectric rod resonator method given in IEC 61338-1-3.
28、This method has the following characteristics: a complete and exact mathematical solution of complex permittivity is given by computer software; the measurement error is less than 0,3 % for Hc and less than 0,05 u104for tan G; the applicable measuring ranges of complex permittivity for this method a
29、re as follows: frequency: 30 GHz 5. Table 2 shows the example of dimensions for dielectric stripsof NRD-guide in Figure 2b. Dielectric strips of the NRD-guide are made of PTFE or cross-linked styrene copolymer. Figure 3 shows a waveguide transducer that connects the measuring apparatus to the measur
30、ement equipment with WR-15 or WR-10 waveguides. Table 3 shows the dimensions of the waveguide transducers. As shown in Figure 2b, the end of the dielectric strip of the NRD-guide is sharpened in the transducer. Table 1 Diameter of conducting plate Diameter d d = 5d: 10dd : diameter of dielectric spe
31、cimen Material of conducting plate Copper or silver is recommended Table 2 Dimension of dielectric strip of NRD-guide Material Measurement frequency range GHzHeight hsmmWidth wsmmPTFE 55 to 65 2,25 2,50 0= 2,075 to 80 1,80 1,90 Cross-linked styrene 55 to 65 2,25 2,00Copolymer (0= 2,5) 75 to 80 1,80
32、1,60Table 3 Dimensions of waveguide transducer Waveguide Frequency range GHz hwgmmwwgmmhsmmWR-15 55 to 65 3,80 1,90 2,25WR-10 75 to 80 2,54 1,27 1,80EN 61338-1-4:2006 10 12,0 mmhsWaveguide FlangeWwgWwghwg12,0 mm 12,0 mm 12,0 mm IEC 2007/05 Figure 3 Waveguide transducer from NRD-guide to waveguide 4.
33、2 Theory and calculation equations 4.2.1 Measurement of relative permittivity and loss factor Figure 4 shows a configuration of the TE0m1mode resonator. The cylindrical dielectric specimen is short-circuited at both ends by the two parallel conducting plates. The values Hand tan G of the dielectric
34、resonator are calculated from the resonance frequency f0and unloaded quality factor Qumeasured for the TE0m1resonance mode. It is recommended to use the TE011, TE021and TE031resonance modes for the materials with H = 2to4, 4to 20 and 20to 30, respectively. The resonance wavelength 0O in free space a
35、nd the guiding wavelength gO in the dielectric transmission line are given by the following equations: hfc2,g00 OO (6) where c is the velocity of light in a vacuum (c = 2,997 9 u 108m/s). As described in 4.1b), the air gap h can be neglected for the calculation of H and tan G in the case of h GuQ ).
36、 The value rV at the resonance frequency01f = G0f is given by the following equation: 2eu1e1ue1e11u1u000r/ GGGGGGPQPQPGPGGGQQfVSPVVV (15) 15 EN 61338-1-4:2006where Pe1and PGeare the partial electric energy filling factors of the reference TE021and TE02Gresonators, respectively. G1and GGbeing the geo
37、metric factors for each reference resonators. Calculated values of Peand G for the reference sapphire resonators with H = 9,4 are given in Table 4. These values are applicable when the actual dimensions agree with the designed dimensions within the deviation of 0,01 mm. The derivation of equation (1
38、5) and the formulas for P and G are given in Annex B. NOTE 3 Loss factor of reference resonators is calculated by the following equation if needed. tan1G =tanGG =GGGGGe1e11uu1u1u1PGPGQGQGQQ(16) 4.2.3 Temperature coefficient of resonance frequency and relative permittivity The temperature coefficient
39、 of resonance frequency TCF is given by measuring the resonance frequency at temperature T and reference temperature refT using equation (4). In the same way, temperature coefficient of relative permittivity HTC is given by calculating relative permittivity at temperature T and reference temperature
40、 refT using equation (3). A dielectric material generally has nonlinear dependence of relative permittivity on temperature. A procedure to deal with this non-linear temperature dependence of resonance frequency or relative permittivity is described in IEC 61338-1-3. 4.2.4 Temperature dependence of l
41、oss factor The temperature dependence of tan G is given by measuring the tan G at various temperatures. For the calculation of tan G at each temperature, the temperature dependence of rV is needed. The temperature dependence of conductivity for the annealed copper in conformity with the internationa
42、l standard is given as follows. 201093,31108,5)(370uuT=TV (S/m) (17) When the rV at reference temperature refT is measured, one can use following equation for as the first order approximation of rV at temperature T . ref3rr1093,31)(TT=TuVV (%) (18) 4.3 Measurement procedure The preparation of dielec
43、tric specimens and measurement procedure are as follows: a) Preparation of reference sapphire resonator Prepare the reference sapphire resonators with the dimensions shown in Table 4. In order to minimize the measurement error on rV of the conducting plates, their c-axes shall be parallel to z-direc
44、tion, and both ends of the rod shall be polished parallel to each other and perpendicular to c-axis. EN 61338-1-4:2006 16 b) Preparation of test specimens The TE011mode dielectric resonators have very small dimensions for the measurement at millimetre-wave frequency. It is preferable to use the TE02
45、1or TE031resonance modes especially for measuring the high- H materials. Table 5 shows recommended diameters for the materials with H from 2 to 40. The height h is fixed to 2,25 mm and 1,80 mm for the measurement at 60 GHz and 77 GHz, respectively. Figures 7 and 8 show the diameter d of the TE011, T
46、E021and TE031mode resonators with resonance frequencies 60 GHz and 77 GHz, respectively. Table 5 Diameter d of test specimens for 60 and 77 GHz measurement. Height h is fixed to 2,25 mm and 1,80 mm for 60 GHz and 77 GHz measurement, respectively Hd (mm)f0= 60 GHz d (mm)f0= 77 GHz TE011TE021TE031TE01
47、1TE021TE0312,0 5,05 - 3,68 2,5 3,80 - 2,83 3,0 3,16 - 2,38 3,5 2,75 - 2,08 4,0 2,47 5,49 1,88 4,20 5,0 - 4,67 3,59 6,0 - 4,14 3,19 8,0 - 3,45 2,67 10,0 - 3,02 2,34 12,0 2,72 2,11 14,0 2,50 1,93 16,0 2,32 1,80 18,0 2,17 1,69 20,0 2,05 3,21 1,59 2,49 25,0 2,85 2,21 30,0 2,58 2,01 35,0 2,38 1,85 40,0 2
48、,22 1,73 c) Preparation of measurement apparatus Set up the measurement equipment and apparatus as shown in Figures 1 and 2. All measure-ment equipments, apparatus and dielectric specimens shall be kept in a clean, dry state as high humidity degrades unloaded Q. The relative humidity is preferable to be less than 60 %. d) Measurement of reference level Measure the through level of transmission power, reference level. Connect the input and output NRD-guides with a dielectric strip, the length of which is 14 mm, and the height hsand width Wsshown in Table 2. Measu
