EN 61967-2-2005 en Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz Part 2 Measurement of radiated emissions - TEM cell and wideband TEM cell method《.pdf
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1、BRITISH STANDARDBS EN 61967-2:2005Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell methodThe European Standard EN 61967-2:2005 has the status of a British StandardICS 31.080.99g49g50g3g38g50g51g60g
2、44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58BS EN 61967-2:2005This British Standard was published under the authority of the Standards Policy and Strategy Committee
3、on 23 January 2006 BSI 23 January 2006ISBN 0 580 47476 3National forewordThis British Standard is the official English language version of EN 61967-2:2005. It is identical with IEC 61967-2:2005. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, whic
4、h has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary.Cross-referencesThe British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section
5、 entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compl
6、iance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep UK interests informed; monitor related int
7、ernational and European developments and promulgate them in the UK.Summary of pagesThis document comprises a front cover, an inside front cover, the EN title page, pages 2 to 22, an inside back cover and a back cover.The BSI copyright notice displayed in this document indicates when the document was
8、 last issued.Amendments issued since publicationAmd. No. Date CommentsEUROPEAN STANDARD EN 61967-2 NORME EUROPENNE EUROPISCHE NORM October 2005 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Nor
9、mung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61967-2:2005 E ICS 31.080.99 English version Integrated circuits - Measurement of electromagnetic emissions, 150
10、kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005) Circuits intgrs - Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 2: Mesure des missions rayonnes - Mthode de cellule TEM et cellule TEM large bande (CEI 61967-2:2005) Integri
11、erte Schaltungen - Messung von elektromagnetischen Aussendungen im Frequenzbereich von 150 kHz bis 1 GHz Teil 2: Messung der abgestrahlten Aussendungen - TEM-Zellen- und Breitband-TEM-Zellenverfahren (IEC 61967-2:2005) This European Standard was approved by CENELEC on 2005-09-01. CENELEC members are
12、 bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to t
13、he Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the
14、same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Por
15、tugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. - 2 - Foreword The text of document 47A/722/FDIS, future edition 1 of IEC 61967-2, prepared by SC 47A, Integrated circuits, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved b
16、y CENELEC as EN 61967-2 on 2005-09-01. This part of EN 61967 is to be read in conjunction with EN 61967-1. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2006-07-01 latest da
17、te by which the national standards conflicting with the EN have to be withdrawn (dow) 2008-09-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61967-2:2005 was approved by CENELEC as a European Standard without any modification. In the official v
18、ersion, for Bibliography, the following notes have to be added for the standards indicated: IEC 61000-4-3 NOTE Harmonized as EN 61000-4-3:1996 (modified). IEC 61000-4-20 NOTE Harmonized as EN 61000-4-20:2003 (not modified). CISPR 16-1-1 NOTE Harmonized as EN 55016-1-1:2004 (not modified). CISPR 16-1
19、-2 NOTE Harmonized as EN 55016-1-2:2004 (not modified). CISPR 16-1-4 NOTE Harmonized as EN 55016-1-4:2004 (not modified). CISPR 16-1-5 NOTE Harmonized as EN 55016-1-5:2004 (not modified). CISPR 16-2-1 NOTE Harmonized as EN 55016-2-1:2004 (not modified). CISPR 16-2-2 NOTE Harmonized as EN 55016-2-2:2
20、004 (not modified). CISPR 16-2-3 NOTE Harmonized as EN 55016-2-3:2004 (not modified). CISPR 16-2-4 NOTE Harmonized as EN 55016-2-4:2004 (not modified). _ EN 61967-2:2005CONTENTS 1 Scope 5 2 Normative references .5 3 Terms and definitions .6 4 General6 5 Test conditions.6 5.1 General.6 5.2 Supply vol
21、tage.6 5.3 Frequency range .6 6 Test equipment.6 6.1 General.6 6.2 Shielding .6 6.3 RF measuring instrument.6 6.4 Preamplifier.7 6.5 TEM cell7 6.6 Wideband TEM/GTEM cell .7 6.7 50-Ohm termination .7 6.8 System gain 7 7 Test set-up.7 7.1 General.7 7.2 Test configuration7 7.3 Test PCB.8 8 Test procedu
22、re .11 8.1 General.11 8.2 Ambient measurement .11 8.3 DUT operational check 11 8.4 DUT emissions measurement 11 9 Test report .12 9.1 General.12 9.2 Measurement conditions 12 10 IC emissions reference levels .12 Annex A (informative) Example calibration however, the measured radio frequency (RF) vol
23、tage will be affected by many factors. The primary factor affecting the measured RF voltage is the septum to IC test board (cell wall) spacing. This procedure was developed using a 1 GHz TEM cell with a septum to floor spacing of 45 mm and a GTEM cell with average septum to floor spacing of 45 mm ov
24、er the port area. Other cells may not produce identical spectral output but may be used for comparative measurements, subject to their frequency and sensitivity limitations. A conversion factor may allow comparisons between data measured on TEM or GTEM cells with different septum to floor spacing. T
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