1、Measurement procedures for materials used in photovoltaic modulesPart 1-2: Encapsulants Measurement of volume resistivity of photovoltaic encapsulants and other polymeric materialsBS EN 62788-1-2:2016BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordTh
2、is British Standard is the UK implementation of EN 62788-1-2:2016. It isidentical to IEC 62788-1-2:2016.The UK participation in its preparation was entrusted to TechnicalCommittee GEL/82, Photovoltaic Energy Systems.A list of organizations represented on this committee can be obtained onrequest to i
3、ts secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2016.Published by BSI Standards Limited 2016ISBN 978 0 580 84248 1ICS 27.160Compliance with a British Standard can
4、not confer immunity fromlegal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 June 2016.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62788-1-2:2016EUROPEAN STANDARD NORME EUROPENNE EUROP
5、ISCHE NORM EN 62788-1-2 June 2016 ICS 27.160 English Version Measurement procedures for materials used in photovoltaic modules - Part 1-2: Encapsulants - Measurement of volume resistivity of photovoltaic encapsulants and other polymeric materials (IEC 62788-1-2:2016) Procdures de mesure des matriaux
6、 utiliss dans les modules photovoltaques - Partie 1-2: Encapsulants - Mesurage de la rsistivit transversale des encapsulants photovoltaques et autres matriaux polymres (IEC 62788-1-2:2016) Messverfahren fr Werkstoffe, die in Photovoltaikmodulen verwendet werden - Teil 1-2: Verkapselungsstoffe - Mess
7、ung des spezifischen Durchgangswiderstandes von Verkapselungsstoffen und Rckseitenfolien von Photovoltaikmodulen (IEC 62788-1-2:2016) This European Standard was approved by CENELEC on 2016-06-16. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the condit
8、ions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exi
9、sts in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the nat
10、ional electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Po
11、rtugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-
12、1000 Brussels 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62788-1-2:2016 E BS EN 62788-1-2:2016EN 62788-1-2:2016 2 European foreword The text of document 82/1085/FDIS, future edition 1 of IEC 62788-1-2, prepared by IEC/TC 8
13、2 “Solar photovoltaic energy systems“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62788-1-2:2016. The following dates are fixed: latest date by which the document has to beimplemented at national level bypublication of an identical nationalstandard or by endorsement(
14、dop) 2017-03-16 latest date by which the nationalstandards conflicting with thedocument have to be withdrawn(dow) 2019-06-16 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for iden
15、tifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62788-1-2:2016 was approved by CENELEC as a European Standard without any modification. BS EN 62788-1-2:2016EN 62788-1-2:2016 3 Annex ZA (normative) Normative references to international publications
16、 with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced docu
17、ment (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cene
18、lec.eu. Publication Year Title EN/HD Year IEC 61340-2-3 2000 Electrostatics - Part 2-3: Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation EN 61340-2-3 2000 IEC 62631-3-2 2015 Dielectric and resistive properties of
19、 solid insulating materials - Part 3-2 Determination of resistive properties (DC Methods) - Surface resistance and surface resistivity EN 62631-3-2 2016 ISO/IEC 17025 - General requirements for the competence of testing and calibration laboratories - - ASTM D 257-14 - Standard Test Methods for DC Re
20、sistance or Conductance of Insulating Materials - - BS EN 62788-1-2:2016 2 IEC 62788-1-2:2016 IEC 2016 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references. 6 3 Sampling . 6 4 Apparatus 6 5 Procedure . 7 5.1 Preconditioning . 7 5.2 Test conditions 8 5.2.1 Room temperature . 8 5.2.2 Elevated temper
21、atures . 8 5.3 Measurement voltage 8 5.3.1 Method A voltage . 8 5.3.2 Method B voltage . 9 5.4 Measurement cycle . 9 5.4.1 Method A cycle 9 5.4.2 Method B cycle 9 5.5 Results . 9 6 Test report. 10 Annex A (informative) Historical studies of the volume resistivity of encapsulation materials 12 Annex
22、B (informative) Example data . 13 Bibliography . 14 Figure 1 Schematic of electrode apparatus for resistivity measurements . 7 Figure B.1 Example data showing current and voltage as a function of time for Method A measurement 13 Table B.1 End of cycle current measurements and values used for calcula
23、tion of volume resistivity according to Method A . 13 BS EN 62788-1-2:2016IEC 62788-1-2:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT PROCEDURES FOR MATERIALS USED IN PHOTOVOLTAIC MODULES Part 1-2: Encapsulants Measurement of volume resistivity of photovoltaic encapsulants
24、and other polymeric materials FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of IEC is to promoteinternational co-operation on all questions conce
25、rning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, IEC publishes International Standards, Technical Specifications,Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IECPublication(s)”). Their p
26、reparation is entrusted to technical committees; any IEC National Committee interestedin the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closel
27、ywith the International Organization for Standardization (ISO) in accordance with conditions determined byagreement between the two organizations.2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an internationalconsensus of opinion on the relevant sub
28、jects since each technical committee has representation from allinterested IEC National Committees.3) IEC Publications have the form of recommendations for international use and are accepted by IEC NationalCommittees in that sense. While all reasonable efforts are made to ensure that the technical c
29、ontent of IECPublications is accurate, IEC cannot be held responsible for the way in which they are used or for anymisinterpretation by any end user.4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publicationstransparently to the maximum extent possibl
30、e in their national and regional publications. Any divergencebetween any IEC Publication and the corresponding national or regional publication shall be clearly indicated inthe latter.5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformityass
31、essment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for anyservices carried out by independent certification bodies.6) All users should ensure that they have the latest edition of this publication.7) No liability shall attach to IEC or its directors, employ
32、ees, servants or agents including individual experts andmembers of its technical committees and IEC National Committees for any personal injury, property damage orother damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) andexpenses arising out of the pub
33、lication, use of, or reliance upon, this IEC Publication or any other IECPublications.8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications isindispensable for the correct application of this publication.9) Attention is drawn to the possibili
34、ty that some of the elements of this IEC Publication may be the subject ofpatent rights. IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 62788-1-2 has been prepared by IEC technical committee 82: Solar photovoltaic energy systems. The text o
35、f this standard is based on the following documents: FDIS Report on voting 82/1085/FDIS 82/1105/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Dir
36、ectives, Part 2. BS EN 62788-1-2:2016 4 IEC 62788-1-2:2016 IEC 2016 A list of all parts in the IEC 62788 series, published under the general title Measurement procedures for materials used in photovoltaic modules, can be found on the IEC website. The committee has decided that the contents of this p
37、ublication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended.BS EN 62788-1-2:2016IEC 62788-
38、1-2:2016 IEC 2016 5 MEASUREMENT PROCEDURES FOR MATERIALS USED IN PHOTOVOLTAIC MODULES Part 1-2: Encapsulants Measurement of volume resistivity of photovoltaic encapsulants and other polymeric materials 1 Scope This part of IEC 62788 provides a method and guidelines for measuring the volume resistivi
39、ty of materials used as encapsulation, edge seals, front-sheets, backsheets, or any other insulating material in a photovoltaic (PV) module. The test is performed on dry, humid or wet preconditioned samples. In the case of frontsheets and backsheets comprised of multiple layers, the measured resisti
40、vity is an effective value. This test is designed for room temperature measurement, but can also be utilized at higher temperatures. Degradation of PV modules is known to occur in part by electrochemical corrosion, and other potential induced degradation processes. These processes may be dependent u
41、pon the resistivity of a polymeric component. Therefore, the DC resistivity of polymeric components is relevant to module design and durability in the field. The resistivity may depend on cure state, temperature, water content, and voltage history. A number of options are included to allow the measu
42、rement to be performed in a manner consistent with representative fielded module conditions. Most resistivity measurement methods and equipment typically become inaccurate and variable for materials with volume resistivity above 1016cm 51.Therefore, this standard is used for measurements less than 1
43、1017cm. Both monolithic and multilayer materials (e.g. frontsheets and backsheets) are suitable for measurement. Methods are described for room temperature measurement, with guidelines included for testing at elevated temperatures. Results will vary with moisture content, therefore materials should
44、be tested in a manner anticipatory of usage. Preconditioning procedures for dry, humid and wet environments are included. Depending on the material, voltage history will affect the measured result. The rate of change of current, and time to equilibrium varies with material often taking hours or days
45、 to come to a static level. For this reason, long and short duration methods are included (Methods A and B). The specified short-duration alternating polarity Method B is intended for qualitative comparison. Method A, long-duration on/off polarity, is recommended for characterization with regard to
46、PID resistance. Measurements obtained using either method may be used by material manufacturers for the purpose of quality control of their electrical insulating material as well as for reporting in product datasheets. PV module manufacturers may use these methods for the purpose of material accepta
47、nce, material selection, process development, design analysis, or failure analysis. _ 1Numbers in square brackets refer to the Bibliography. BS EN 62788-1-2:2016 6 IEC 62788-1-2:2016 IEC 2016 This measurement method can also be utilized to monitor the performance of electrical insulating materials a
48、fter weathering, to assess their durability. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of
49、 the referenced document (including any amendments) applies. IEC 61340-2-3:2000, Electrostatics Part 2-3: Methods for test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation IEC 62631-3-2:2015, Dielectric and resistive properties of solid insulating materials Part 3-2: Determination of resistive properties (DC methods) Surface resistance and surface resistivity ISO/IEC 17025, General requirements for t
