1、BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06Integrated circuits - EMC evaluation of transceiversPart 1: General conditions and definitionsBS EN IEC 622281:2018EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IEC 62228-1 June 2018 ICS 31.200 English Version In
2、tegrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 62228-1:2018) Circuits intgrs - valuation CEM des metteurs-rcepteurs - Partie 1 : Conditions gnrales et dfinitions (IEC 62228-1:2018) Integrierte Schaltungen - Bewertung der elektromagnetischen Vertr
3、glichkeit von Sende-Empfangsgerten - Teil 1: Allgemeine Bedingungen und Festlegungen (IEC 62228-1:2018) This European Standard was approved by CENELEC on 2018-02-13. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
4、Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions
5、 (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committ
6、ees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slova
7、kia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels 2018
8、 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN IEC 62228-1:2018 E National forewordThis British Standard is the UK implementation of EN IEC 622281:2018. It is identical to IEC 622281:2018.The UK participation in its preparation wa
9、s entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The
10、British Standards Institution 2018 Published by BSI Standards Limited 2018ISBN 978 0 580 96085 7ICS 31.200Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 June
11、 2018.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN IEC 622281:2018EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IEC 62228-1 June 2018 ICS 31.200 English Version Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and defin
12、itions (IEC 62228-1:2018) Circuits intgrs - valuation CEM des metteurs-rcepteurs - Partie 1 : Conditions gnrales et dfinitions (IEC 62228-1:2018) Integrierte Schaltungen - Bewertung der elektromagnetischen Vertrglichkeit von Sende-Empfangsgerten - Teil 1: Allgemeine Bedingungen und Festlegungen (IEC
13、 62228-1:2018) This European Standard was approved by CENELEC on 2018-02-13. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and b
14、ibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the
15、 responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia,
16、 Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Commit
17、tee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for C
18、ENELEC Members. Ref. No. EN IEC 62228-1:2018 E BS EN IEC 622281:2018EN IEC 62228-1:2018 (E) 2 European foreword The text of document 47A/1018/CDV, future edition 1 of IEC 62228-1, prepared by IEC/SC 47A “Integrated circuits“ of IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC paral
19、lel vote and approved by CENELEC as EN IEC 62228-1:2018. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-12-01 latest date by which the national standards conflictin
20、g with the document have to be withdrawn (dow) 2021-06-01 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the Inte
21、rnational Standard IEC 62228-1:2018 was approved by CENELEC as a European Standard without any modification. BS EN IEC 622281:2018EN IEC 62228-1:2018 (E) 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents a
22、re referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 Where an Intern
23、ational Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 61967-1 - Integr
24、ated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions EN 61967-1 - IEC 61967-4 2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct c
25、oupling method EN 61967-4 2002 + A1 2006 + A1 2006 - - + corrigendum Dec. 2006 IEC 62132-1 - Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions EN 62132-1 - IEC 62132-4 - Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to
26、 1 GHz - Part 4: Direct RF power injection method EN 62132-4 - IEC 62215-3 - Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method EN 62215-3 - ISO 10605 - Road vehicles - Test methods for electrical disturbances from electrostatic discharge - - B
27、S EN IEC 622281:2018This page deliberately left blank 2 IEC 62228-1:2018 IEC 2018 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Terms, definitions and abbreviated terms 5 3.1 Terms and definitions 6 3.2 Abbreviated terms . 6 4 Philosophy . 6 5 General test conditions and test board spec
28、ification 8 5.1 Test conditions . 8 5.2 Test board specification 8 6 Test report . 8 Figure 1 General test configuration for tests in functional operation modes 7 Figure 2 General test configuration for unpowered ESD test 7 Table 1 Overview of test and measurement methods . 6 2 IEC 62228-1:2018 IEC
29、2018 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Terms, definitions and abbreviated terms 5 3.1 Terms and definitions 6 3.2 Abbreviated terms . 6 4 Philosophy . 6 5 General test conditions and test board specification 8 5.1 Test conditions . 8 5.2 Test board specification 8 6 Test rep
30、ort . 8 Figure 1 General test configuration for tests in functional operation modes 7 Figure 2 General test configuration for unpowered ESD test 7 Table 1 Overview of test and measurement methods . 6 BS EN IEC 622281:2018IEC 62228-1:2018 IEC 2018 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INTEGRA
31、TED CIRCUITS EMC evaluation of transceivers Part 1: General conditions and definitions FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is t
32、o promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and G
33、uides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IE
34、C also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as
35、possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense
36、. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees under
37、take to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any atte
38、station of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition
39、of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct
40、or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable
41、 for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62228-1 has be
42、en prepared by subcommittee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices. The text of this International Standard is based on the following documents: CDV Report on voting 47A/1018/CDV 47A/1034/RVC Full information on the voting for the approval of this Internationa
43、l Standard can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. BS EN IEC 622281:2018 4 IEC 62228-1:2018 IEC 2018 A list of all parts in the IEC 62228 series, published under the general title Integrated
44、circuits EMC evaluation of transceivers, can be found on the IEC website. The committee has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date,
45、 the document will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. BS EN IEC 622281:2018IEC 62228-1:2018 IEC 2018 5 INTEGRATED CIRCUITS EMC evaluation of transceivers Part 1: General conditions and definitio
46、ns 1 Scope This part of IEC 62228 provides general information and definitions for electromagnetic compatibility (EMC) evaluation of integrated circuits (IC) with transceivers for wired network applications under network condition. It defines general test conditions, general test setups and test and
47、 measurement methods are applied to all parts of IEC 62228. 2 Normative references The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated referenc
48、es, the latest edition of the referenced document (including any amendments) applies. IEC 61967-1, Integrated circuits Measurement of electromagnetic emissions 150 kHz to 1 GHz Part 1: General conditions and definitions IEC 61967-4:2002, Integrated circuits Measurement of electromagnetic emissions 1
49、50 kHz to 1 GHz Part 4: Measurement of conducted emissions 1 /150 direct coupling method IEC 61967-4:2002/AMD1:2006 IEC 62132-1, Integrated circuits Measurement of electromagnetic immunity Part 1: General conditions and definitions IEC 62132-4, Integrated circuits Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method IEC 62215-3, Integrated circuits Measurement of impulse immunity P
