GOST 16252-1970 Chill moulds Ventilation passaged stoppers Construction and dimensions《冷硬铸模 通风道塞 结构和尺寸规格》.pdf

相关资源

GSFC-STD-7000 REV A-2013 GENERAL ENVIRONMENTAL VERIFICATION STANDARD (GEVS).pdf

GSFC-S-311-P-822 REV A-2008 Connectors PWB 2 mm cPCI Style High Reliability.pdf

GSFC-S-311-M-70 REV B-2009 SPECIFICATION FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA)《物理破坏性分析(DPA)规范》.pdf

GSFC NASA GPR 8830 1-2008 Facility Operations Managers [Cancelled GSFC NASA GMI 7234 2]《设备操作管理员[GSFC NASA GMI 7234 2作废]》.pdf

GSFC NASA GPR 7123 1-2008 Systems Engineering [Cancelled GSFC NASA GPR 7120 5 REV A GSFC NASA GPR 7120 5]《系统工程[GSFC NASA GPR 7120 5修订本A和GSFC NASA GPR 7120 5作废]》.pdf

GSFC NASA GPR 1860 1 REV B-2008 Ionizing Radiation Protection《电离性辐射保护》.pdf

GSFC NASA GPR 1800 1 REV B-2008 Goddard Space Flight Center (GSFC) Smoking Guidelines《戈达德宇航中心(GSFC)的吸烟指南》.pdf

GSA ZZ-I-550 F-1992 INNER TUBE PNEUMATIC TIRE《气轮胎内胎》.pdf

GSA W-C-1684-1977 CASSETTES MAGNETIC TAPE AUDIO RECORDING (TWIN-HUB COPLANAR)《音频记录盒式磁带(同面双中枢)》.pdf

GSA TT-W-572 B-1969 WOOD PRESERVATIVE WATER-REPELLENT《木料防腐剂 憎水剂》.pdf

猜你喜欢

DIN 50450-9-2003 Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9 Determination of oxygen nitrogen carbonm.pdf

DIN 50451-1-2003 en 5446 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1 Silver (Ag) gold (Au) calcium (Ca) copper (Cu) iron.pdf

DIN 50451-2-2003 en 4694 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2 Calcium (Ca) cobalt (Co) chromium (Cr) copper (Cu) .pdf

DIN 50451-3-2014 Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3 Determination of 31 elements in high-purity nitric acid.pdf

DIN 50451-4-2007 de 3234 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4 Determination of 34 elements in ultra pure water by.pdf

DIN 50451-5-2010 de 5058 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5 Guideline for the selection of materials and testin.pdf

DIN 50451-6-2014 de 1482 Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6 Determination of 36 elements in a high-purity a.pdf

DIN 50452-1-1995 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1 Microscopic determination of particles《半导体工艺用材料的检验 液体中粒子分.pdf

DIN 50452-2-2009 Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2 Determination of particles by optical particle counters《半.pdf