1、 4287 2014 (GPS) . . , ISO 4287:1997 Geometrical Product Specifications (GPS) Surface texture: Profile method Terms, definitions and surface texture parameters (IDT) 2015 4287 2014 II 1 ( -) , 4 2 453 3 - 12 2014 . 2078- 4 4287:1997 (GPS). . . , (ISO 4287 Geometrical Product Specifications (GPS) Sur
2、face texture: Profile method Terms, definitions and surface texture parameters) - , - A. 5 1.0 2012 ( 8). ( 1 ) , -. () - . , (gost.ru) , 2015 -, - 4287 2014 1 (GPS) , Geometrical Product Specifications (GPS). Surface texture. Profile method. Terms, definitions and surface texture parameters 2016 01
3、 01 1 , (, ) -. 2 , . -. , , - , - , . (IEC) . 3274:1996 (GPS). . - () . (IS0 3274:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Nominal characteristics of contact (stylus) instruments) 4288:1996, (GPS). . - . . (IS0 4288: 1996, Geometrical Product Specifications (GP
4、S) Surface texture: Profile method Rules and procedures for the assessment of surface texture) 11562:1996, (GPS). . - . . (IS0 11562:1996, Geometrical Product Specifications (GPS) Surface texture: Profile method Metrological characterization of phase correct filters) 3 3.1 3.1.1 (profile filter): ,
5、. 115621 4287 2014 2 , (. 1). , 11562, . 3.1.1.1 s (profile filter s): , , (. 1). 3.1.1.2 c (profile filter c): , (. 1). 3.1.1.1 f (profile filter f): , , (. 1). 1 3.1.2 (coordinate system) , . , , X , Y - , Z ( ). - . 3.1.3 (real surface): , . 3.1.4 (surface profile): , - (. 2). , - . 4287 2014 3 2
6、 3.1.5 (primary profile) (. 3274). . 3.1.6 (roughness profile): , - c; - (. 1). 1 s c (. 2.6 3.2 11562). 2 . 3 s 4.4 3274 3.1.7 (waviness profile): , f c , f, - c; . 4287 2014 4 1. - ( ), f -. , - . . 2. c f (. 2.6 3.2 11562). 3. . 3.1.8 3.1.8.1 (mean line the roughness profile): , , c (. 11562:1996
7、, 3.2). 3.1.8.2 (mean line the waviness profile): , - , - f (. 11562:1996, 3.2). 3.1.8.3 (mean line for the primary profile): , - - . 3.1.9 (sampling length lp, Ir, lw): X, - , . lr lw - c, f . - lp . 3.1.10 In (evaluayion length In): X, . 1 . 2 4288, 4.4 4288 W. 3.2 3.2.1 P- (P-parameter): , . 3.2.
8、2 R- (R-parameter): , -. 3.2.3 W- (W-parameter): , -. , 4, . . , Ra , Pt . 3.2.4 (profile peak): ( ) , X. 3.2.5 (profile valley): ( -) , - X. 3.2.6 / (height and/or spacing discrimination): - . Pz, Rz, Wz , . 3.2.7 (profile element): (. 3). 4287 2014 5 . -. 3.2.8 Z(x) (ordinate value Z(x): x. , X, -
9、 . 3 3.2.9 dzdx(local slope dzdx): ix (. 4). 1 , , Pq, Rq Wq - X. 2 : 3 2 1 1 2 3dz 1 9 4 5 4 5 9d x 6 0i i i i i i iz z z z z zX , 3274 , zi i- , X - . 3.2.10 Zp (profile peak height Zp): - (. 3). 4287 2014 6 4 3.2.11 Zv (profile valley depth Zv): (. 3). 3.2.12 Zt (profile element height Zt): (. 3)
10、. 3.2.13 Xs (profile element wight Xs): , - (. 3). 3.2.14 c Ml(c) (material length of profile at the level Ml(c): , , - c (. 5). 5 4 4.1 ( ) 4.1.1 Pp, Rp, Wp (maximum profile peak height Pp , Rp , Wp ): Zp (. 6). 4287 2014 7 6 ( ) 4.12 Pv, Rv, Wv (maximum profile valley depth Pv, Rv, Wv): Zv (. 7). 7 ( ) 4.1.3 Pz, Rz, Wz (maximum height of profile Pz, Rz, Wz): Zp Zv - (. 8). 4287-1 Rz , - . , Rz. , , , , . 4.1.4 P, Rc, W (mean height of profile elements P, Rc, W): Zt (. 9). 4287 2014 8 11, , m iiPc Rc W c Ztm Pc, Rc, Wc
