1、JEDEC STANDARD Voltage Regulator Diode Noise Voltage Measurement JESD307 MAY 1965 (Reaffirmed and Revised JANUARY 1992) (Reaffirmed: APRIL 1999, APRIL 2002) JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approve
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6、tions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or call (703) 907-7559 or www.jedec.org Published by OJEDEC Solid State Technology Association 2002 2500 Wilson Boulevard Arlinmq VA 22201-3834 This document may be downloaded free
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8、Canada 1-800-854-7179, International (303) 397-7956 Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering
9、 int a license agreement. For informatioq contact: JEDEC Solid State Technology Association 2500 Wilson Boulevard Arlingtq Virginia 2220 1 - 3 8 34 or call (703) 907-7559 EIA-307 Page 1 VOLTAGE REGULATOR DIODE NOISE VOLTAGE MEASUREMENT (From 1.4 Standards Proposal No. 2406, formulated under the cogn
10、izance of EIA/JEDEC JC-22.4 Subccmmittee on Regulators and Signal Diodes.) 1. SCOPE This standard is intended to cover the measurement of mse voltage in voltage regulator diodes in the reverse breakdown regicn. It is intended to describe noise voltage measurement at specified conditions, but may als
11、o be used 3s a guide for makig such measurements at cther than specified conditions. 2. DISCUSSION The magnitude of noise voltage measured is dependent upon the test ci rcui t used, frequency of measurement, and test conditions. To adequately characterize this parameter, it is important that the tes
12、t current, noise bandwidth, and characteristics of the response detector (whether RMS, average, or peak-to-peak) be considered. The magnitude is further dependent upon the reverse voltage-current characteristic of the device under test, and upon ambient temperature. 3. TEST CONDITIONS TO BE SPECIFIE
13、D (1) Frequency range of noise being measured. (2) Test current and current range. (3) Ambient temperature. (4) Response detector to be used. 4. LIMITATIONS 4.1 Test Current The minimum should be in the reverse breakdown region of the device under test. The maximum allowable is determinod by the max
14、imum current or power rating of the device. 4.2 Minimum Measurable Noise Voltage Determined by the capability of the specified response detector. EIA-307 Page 2 5. TEST CIRCUIT n i BANDPASS R ESP0 NS E FILTER DETECTOR o Figure 1 Test Circuit 5.1 I, Provisions should be made either to hold I, constan
15、t at the desired test value, or to vary I, at a known rate through the breakdown region of interest in the diode. I, is the current through the diode in the breakdown region. 5.2 M - dc Current Meter 5.3 Bandpass Filter (Optional) If used, the input impedance should be h13h compared to the dynamic i
16、mpedance of the diode under test; also, tbe skirt selectivity should have a shape factor (the ratio of the bandwidth at 6 db point to that cf the 3 db point) of approximately 2. If no bandpass filter IS used, the input impedance if the response detector -should be high compared to the diode dynamic
17、impedance, and the bandpass characteri sti c of the response detector becomes a frequency-limiting factor and must meet the same conditions as listed above the filter. 5.4 Response Detector Specify whether the response characteristlc is RMS, average, peak- to-peak, or other. EIA-307 Page 3 6. PROCED
18、URE (i) Place st low noise resistor (equivalent to the dynamic impedance of the diode under test) in the test clips, and adjust the test current to the value at which the regulator diode is to be measured. The residual noise measured should be low compared to that of the diode under test. (2) Remove
19、 the resistor and place the diode in the test clips. (3) Adjust the test current to the desired value or range. (4) If noise other than broad band is to be measured, adjust the bandpass filter to obtain the roquired rsinge. (5) Set response detector sensitivity to al low measurement of the maximum specified value of noise voltage. (6) Measure the noise voltage.
