JEDEC JESD82-23-2007 Definition of the SSTUA32S869 and SSTUA32D869 DDR2 RDIMM Applications Registered Buffer with Parity for《SSTUB32S869和SSTUA32D869的定义 DDR2 RDIMM应用软件注册缓冲器加奇偶校验》.pdf

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1、JEDEC SOLID STATE TECHNOLOGY ASSOCIATIONJESD82-23MAY 2007JEDECSTANDARDDefinition of the SSTUA32S869 and SSTUA32D869 DDR2 RDIMM ApplicationsRegistered Buffer with Parity for NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approvedthrough the JEDEC Counci

2、l level and subsequently reviewed and approved by the EIA GeneralCounsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability andimprovement of products, and assisting t

3、he purchaser in selecting and obtaining with minimum delaythe proper product for use by those other than JEDEC members, whether the standard is to be usedeither domestically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption mayinvolve pa

4、tents or articles, materials, or processes. By such action JEDEC does not assume anyliability to any patent owner, nor does it assume any obligation whatever to parties adopting theJEDEC standards or publications. The information included in JEDEC standards and publications represents a sound approa

5、ch to product specification and application, principally from the solid state device manufacturer viewpoint. No claims to be in conformance with this standard may be made unless all requirements stated in thestandard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC

6、 standard or publicationshould be addressed to JEDEC Solid State Technology Association, 2500 Wilson Boulevard,Arlington, VA 22201-3834, (703)907-7559 or www.jedec.org. Published by JEDEC Solid State Technology Association 2007 2500 Wilson Boulevard Arlington, VA 22201-3834 This document may be down

7、loaded free of charge, however JEDEC retains the copyright on this material. By downloading this file the individual agrees not to charge for or resell the resulting material. Price: Please refer to the current Catalog of JEDEC Engineering Standards and Publications at www.jedec.org Printed in the U

8、.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the JEDEC Solid State Technology Association and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. Fo

9、r information, contact: JEDEC Solid State Technology Association 2500 Wilson Boulevard Arlington, Virginia 22201-3834 or call (703) 907-7559 JEDEC Standard No. 82-23Page 1DEFINITION OF THE SSTUA32S869 AND SSTUA32D869 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS(From JEDEC Board Ballot J

10、CB-07-09, formulated under the cognizance of the JC-40 Committee on Digital Logic.)1 ScopeThis standard defines standard specifications of DC interface parameters, switching parameters, and test loading for definition of the SSTUA32S869 and SSTUA32D869 registered buffer with parity for driving heavy

11、 load on high-density DDR2 RDIMM applications. A typical application would be a 36 SDRAM planar DIMM. The SSTUA32S869 and SSTUA32D869 are identical in functionality to the SSTU32S869 and SSTU32D869 devices respectively but specify tighter timing characteristics and a higher application frequency of

12、up to 410MHz. The purpose is to provide a standard for the SSTUA32S869 and SSTUA32D869 (see Note) logic devices, for uniformity, multiplicity of sources, elimination of confusion, ease of device specification, and ease of use.NOTE The designations SSTUA32S869 and SSTUA32D869 refers to the part desig

13、nation of a series of commercial logic parts common in the industry. This number is normally preceded by a series of manufacturer specific characters to make up a complete part designation.2 Device standard2.1 DescriptionThis 14-bit 1:2 registered buffer with parity is designed for 1.7 V 1.9 V VDDop

14、eration.All clock and data inputs are compatible with the JEDEC standard for SSTL_18. The control inputs are LVCMOS. All outputs are 1.8 V CMOS drivers optimized to drive the DDR2 DIMM load, following the SSTL_18 standard. They provide 50% more dynamic driver strength than the standard SSTUA32866 ou

15、tputs. The SSTUA32S869 and SSTUA32D869 operate from a differential clock (CK and CK). Data are registered at the crossing of CK going high, and CK going low.The device supports low-power standby operation. When the reset input (RESET) is low, the differential input receivers are disabled, and un-dri

16、ven (floating) data, clock and reference voltage (VREF) inputs are allowed. In addition, when RESET is low all registers are reset, and all outputs except PTYERR are forced low. The LVCMOS RESET input must always be held at a valid logic high or low level.To ensure defined outputs from the register

17、before a stable clock has been supplied, RESET must be held in the low state during power up.In the DDR2 RDIMM application, RESET is specified to be completely asynchronous with respect to CK and CK. Therefore, no timing relationship can be guaranteed between the two. When entering reset, the regist

18、er will be cleared and the outputs will be driven low quickly, relative to the time to disable the differential input receivers. However, when coming out of reset, the register will become active quickly, relative to the time to enable the differential input receivers. JEDEC Standard No. 82-23Page 2

19、2 Device standard (contd)2.1 Description (contd)SSTUA32S869 and SSTUA32D869 must ensure that the outputs remain low as long as the data inputs are low, the clock is stable during the time from the low-to-high transition of RESET and the input receivers are fully enabled. This will ensures that there

20、 are no glitches on the output. If the data inputs are not held low, then DCS and CSR must be held high, DODT and DCKE must be held low, and all other inputs must remain stable (either low or high) for a minimum of tACT(max) after the rising edge of RESET.The parity error output PTYERR will be reset

21、 to high by RESET transitioning low and will not be decoded until after RESET goes high and DCS and/or CSR are asserted low.The device monitors both DCS and CSR inputs and will gate the Qn, PPO (Partial-Parity-Out) and PTYERR (Parity Error) Parity outputs from changing states when both DCS and CSR a

22、re high. If either DCS or CSR input is low, the Qn, PPO and PTYERR outputs will function normally. The RESET input has priority over the DCS and CSR controls and will force the Qn and PPO outputs low and the PTYERR high. The SSTUA32S869 and SSTUA32D869 include a parity checking function. The SSTUA32

23、S869 and SSTUA32D869 accept a parity bit from the memory controller at its input pin PARIN one or two cycles after the corresponding data input, compares it with the data received on the D-inputs and indicates on its open-drain PTYERR pin (active low) whether a parity error has occurred. The number

24、of cycles depends on the setting of C1/C2, see Figure 6 and 7.When used as a single device, the C1/C2 inputs are tied low. When used in pairs, the C1/C2 inputs are tied low for the first register (front) and the C1/C2 inputs are tied high for the second register. When used as a single register, the

25、PPO and PTYERR signals are produced two clock cycles after the corresponding data input. When used in pairs, the PTYERR signals of the first register are left floating. The PPO outputs of the first register are cascaded to the PARIN signals on the second register (back). The PPO and PTYERR signals o

26、f the second register are produced three clock cycles after the corresponding data input. Parity implementation and device wiring for single and dual die is described in Figure 1.If an error occurs, and the PTYERR is driven low, it stays low for two clock cycles or until RESET is driven low. The DIM

27、M-dependent signals (DCKE, DCS, CSR and DODT) are not included in the parity check computations.All registers used on an individual DIMM must be of the same configuration, i.e single or dual die.JEDEC Standard No. 82-23Page 32 Device standard (contd)2.1 Description (contd)Figure 1 Parity implementat

28、ion and device wiring for SSTUA32S869 and SSTUA32D869PTYERR1 W1Register 1(Front)Parin1, W4NC, A8ParinSingle DiePPO1, W8 Parin1, W4NC, A4Register 2(Back)NC, A8NC, A11Set C1 = 0 for Register 1; Set C1 = 1 for Register 2. NC denotes No ConnectPTYERR1 W1Register 1(Front)Parin1, W4Parin2, A8ParinDual Die

29、PPO1, W8 Parin1, W4PPO2, A4Register 2(Back)Parin2, A8PTYERR2, A11Set C1 and C2 = 0 for Register 1; Set C1 and C2 = 1 for Register 2.JEDEC Standard No. 82-23Page 42 Device standard (contd)2.2 150-ball TFBGA (MO-246)Package options include 150-ball Thin Profile Fine Pitch BGA (TFBGA) (11 19 array, 8.0

30、 13.0 mm body size, 0.65 mm pitch, 1.2mm height, MO-246, Variation TBD).Figure 2 Pinout configuration1(TOP VIEW)23456789101ABCDEFGHJKLMNPRTUVWJEDEC Standard No. 82-23Page 52 Device standard (contd)2.3 Pinout top view for 150-ball TFBGA150-ball, 11 19 grid, TOP VIEWFigure 3 specifies the pinout for S

31、STUA32S869 and SSTUA32D869. Unlike other configurable registers the device has symmetric pinout with center inputs and outputs to the left and right sides. Therefore the pinout for the device in front configuration is identical to pinout in back configuration. The recommended placement is back to ba

32、ck on both sides of the PCB. VIAs for the inner ball connections (Vdd, GND, Inputs) are to be placed at the NB locations.NB indicates no ball is populated at that gridpoint. NC denotes a no-connect (ball present but not connected to the die).Figure 3 Pinout top view for 150-ball TFBGANOTE 1 MCL deno

33、tes input pin that must be connected Low. Register Vendors: Implement NC or input on Ball A3, A9, W3, W9 NOTE 2 NC for single die version123456789101ANB VDDMCL(1)PP02(2)GND VREF GNDPARIN2(2)MCL(1)VDDPTYERR2(2)BVDD NB VDD GND GND GND GND GND VDD NB VDDCQCKEA VDD NB GND NB GND NB GND NB VDD QCKEBDQ2A

34、VDD GND NB DCKE NB D2 NB GND VDD Q2BEQ3A VDD NB D3 NB NC NB DODT NBC2(2)Q3BFQODTA VDD GND NB NC NB NC NB GND VDD QODTBGQ5A VDD GND D5 NB CLK NB D6 GND VDD Q5BHQ6A NB GND NB NC NB NC NB GND NB Q6BJQCSA VDD NB NC NB RESET NB CSR NB VDD QCSBKVDD VDD GND GND NB NB NB GND VDD VDD VDDLQ8A VDD NB DCS NB CL

35、K NB D8 NB VDD Q8BMQ9A NB GND NB NC NB NC NB GND NB Q9BNQ10A VDD GND D9 NB NC NB D10 GND VDD Q10BPQ11A VDD GND NB NC NB NC NB GND VDD Q11BRQ12A C1 NB D11 NB NC NB D12 NB VDD Q12BTQ13A VDD GND NB D13 NB D14 NB GND VDD Q13BUQ14A VDD NB GND NB GND NB GND NB VDD Q14BVVDD NB VDD GND GND GND GND GND VDD N

36、B VDDWPTYERR1 VDDMCL(1)PARIN1 GND VREF GND PPO1MCL(1)VDD NBJEDEC Standard No. 82-23Page 62 Device standard (contd)2.4 Terminal functionsNOTE 1 Inputs D1, D4 and D7 and their corresponding outputs Qn are not included in this range. NOTE 2 NC for single die version. Table 1 Terminal functionsSignal Gr

37、oup Signal Name Type DescriptionUngated inputs DCKE, DODT SSTL_18 DRAM function pins not associated with Chip Select.Chip Select gated inputsD1 . D14(1)SSTL_18 DRAM inputs, re-driven only when Chip Select is LOW.Chip Select inputsDCS, CSR SSTL_18 DRAM Chip Select signals. These pins initiate DRAM ad

38、dress/command decodes, and as such at least one will be low when a valid address/command is present. Re-driven outputsQ1A.Q14A, Q1B . Q14B, QCSA, QCSB QCKEA, QCKEB QODTA,QODTB1.8 V CMOS Outputs of the register, valid after the specified clock count and immediately following a rising edge of the cloc

39、k.Parity input PARIN1, PARIN2(2)SSTL_18 Input parity is received on pin PARIN and should maintain parity across the D1.D14(1)inputs, at the rising edge of the clock, one clock cycle after Chip Select is LOW.Parity outputPPO1, PPO2(2)SSTL_18Partial Parity Output. Indicates parity out of D1-D14(1)Pari

40、ty error outputPTYERR1,PTYERR2(2)Open drain When LOW, this output indicates that a parity error was identified associated with the address and/or command inputs. PTYERR will be active for two clock cycles, and delayed by in total 2 clock cycles for compatibility with final parity out timing on the i

41、ndustry-standard DDR2 register with parity (in JEDEC definition).Configuration InputsC1, C2 1.8V LVCMOSWhen Low, register is configured as Register 1. When High, register is configured as Register 2. Clock inputs CK, CK SSTL_18 Differential master clock input pair to the register. The register opera

42、tion is triggered by a rising edge on the positive clock input (CK).Miscellaneous inputsRESET 1.8 V LVCMOSAsynchronous reset input. When LOW, it causes a reset of the internal latches, thereby forcing the outputs LOW. RESET also resets the PTYERR signal.VREF 0.9 V nominal Input reference voltage for

43、 the SSTL_18 inputs. Two pins (internally tied together) are used for increased reliability.VDD Power Input Power supply voltageGND Ground Input GroundJEDEC Standard No. 82-23Page 72 Device standard (contd)2.5 Function tableTable 2 Function table (each flip flop)Inputs OutputsRESET DCS CSR CK CKDn,

44、DODT, DCKEQn QCSQODT, QCKEHLLLLLLHLLHHLHH L L L or H L or H XQ0Q0Q0HLHLLLLHLHHHLHH L H L or H L or H XQ0Q0Q0HHLLLHLHHLHHHHH H L L or H L or H XQ0Q0Q0HHHLQ0HLHHHHQ0HHH H H L or H L or H XQ0Q0Q0LX or floatingX or floatingX or floatingX or floatingX or floatingLLLJEDEC Standard No. 82-23Page 82 Device

45、standard (contd)2.5 Function table (contd)Table 3 Parity and Standby function tableNOTE 1 Inputs D1, D4 and D7 are not included in this range.NOTE 2 PARIN1 and PARIN2 arrives one (C1, C2 =0) or two (C1, C2=1) clock cycles after data to which it applies.NOTE 3 This transition assumes PTYERR is high a

46、t the crossing of CK going high and CK going low. If PYTERR is low, it stays latched low for two clock cycles or until RESET is driven low. PARIN1 is used to generate PPO1 and PTYERR1. PARIN2 is used to generate PPO2 and PTYERR2.NOTE 4 PARIN2, PPO2 and PTYERR2 not required for single die.Inputs Outp

47、utRESET DCS CSR CK CK of inputs = HD1.D14(1)PARIN1(2),PARIN2(4)PPO1(2),PPO2(4)PTYERR1(3)PTYERR2HLX EvenLL HHLX OddLH LHLX EvenHH LHLX OddHL HHLL EvenLL HHLL OddLH LHLL EvenHH LHLL OddHL HHHHXXPPOn0PTYERRn0HX X L or H L or H XXPPOn0PTYERRn0LX or floatingX or floatingX or floatingX or floatingX or flo

48、ating X or floating L HJEDEC Standard No. 82-23Page 92 Device standard (contd)2.6 Logic diagramFigure 4 Logic diagram (positive logic)CKDODTDRDRDCSDRDRDRPARIN1,PARIN2DRDCKEVREFD1D14LSP0 internal node (CS Active)QODTAQODTBQCSAQCSBQCKEAQCKEBQ14AQ14BQ1AQ1B11RESETCKCSRPARITYGENERATORANDCHECKER222PTYERR1

49、,PTYERR2PPO1,PPO2JEDEC Standard No. 82-23Page 102 Device standard (contd)2.7 Register timingNOTE 2 PARIN1 is used to generate PPO1 and PTYERR1. PARIN2 is used in the dual die version to generate PPO2 and PTYERR2. PARIN2, PPO2 and PTYERR2 are not present in single die versions.Figure 5 Timing of clock, data and parity signals. JEDEC Standard No. 82-23Page 112 Device standard (contd)2.7 Register timing (contd) Figure 6 Timing Diagram for the 1st SSTUA32S869 and SSTUA32D869 C1/C2=0NOTE 1 This

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