KS D ISO 22489-2012 Microbeam analysis-Electron probe microanalysis-Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy《微光束分析 电子探针微量分析 运用波.pdf

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1、 KSKSKSKSKSKSKSK KSKSKS KSKSK KSKS KSK KS KS D ISO 22489 KS D ISO 22489:2012 2012 3 9 http:/www.kats.go.krKS D ISO 22489:2012 : ( ) ( ) () () ( ) : () () : (http:/www.standard.go.kr) : :2012 3 9 2012-0104 : : ( 02-509-7274) (http:/www.kats.go.kr). 10 5 , . KS D ISO 22489:2012 i ii 1 1 2 1 3 2 4 .2 4

2、.1 .2 4.2 3 4.3 3 4.4 4 4.5 .7 4.6 .8 4.7 .8 5 .8 A( ) 10 A.1 .10 A.2 , Z10 A.3 , A .10 A.4 , F.10 B( ) .11 B.1 ZAF 11 B.2 -Z 11 B.3 Bence Albee 11 C( ) “ ” k- .13 14 KS D ISO 22489:2012 ii 2006 1 ISO 22489, Microbeam analysis Electron probe microanalysis Quantitative point analysis for bulk specime

3、ns using wavelength-dispersive X-ray spectroscopy , . KS D ISO 22489:2012 Microbeam analysis Electron probe microanalysis Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy 1 (SEM) (WDS) , m . . , ( , , , , ) . . , , . 2 . . ( ) . KS D ISO 14594, KS D ISO 1

4、4595, KS D ISO 22309, (EDS) KS Q ISO/IEC 17025, ISO 17470, Microbeam analysis Electron probe microanalysis Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry KS D ISO 22489:2012 2 3 EPMA(electron probe microanalyser) PHA(pulse height analyser) P/B(peak-to-backgroun

5、d ratio) 4 4.1 4.1.1 . . . . . . . . . 3 (Z), (A), (F) . , , / , . 4.1.2 . . . . . KS D ISO 14594 . 4( ) . , ( , , ) . mg/kg mg/kg . 1 ISO 17470 . 2 1 % (: B K). KS D ISO 22489:2012 3 , . 1 % 2 % . 3 , , 2 % . 4.1.3 KS D ISO 14595 . , . (4.2 ) . 4.2 ( ) . . . . (charging) . . , (: ) ( , ) . 20 nm .

6、. 4.3 4.3.1 . . . EDS EPMA , - (Duane-Hunt) 6 . EDS , . . 4.3.2 . . . KS D ISO 22489:2012 4 4.3.3 . (crystals) . . KS D ISO 14594 . 4.3.4 (dead time) . KS D ISO 14594 . 4.4 4.4.1 (530) kV , . 1.5 . . . . , . 4.4.2 . . . . . (: ) , . 4.4.3 , . . , KS D ISO 22489:2012 5 . , . . . SEM , 100 m . SEM/WDS

7、 . WDS ( ) , . 2 . . 4.4.4 . . . KS D ISO 14594 . , , . 4.4.5 , . , . . . . 4.4.6 . . ( ) . . , . 4.4.7 . a) P/B . b) . KS D ISO 22489:2012 6 c) . , . , (PHA ISO 17470 KS D ISO 14594 ). 1 , . 7. 4.4.8 , (crystal) . . (crystal) . (crystal) . , . , . 4.4.9 4.4.9.1 , . (1 keV) . ( C ). 4.4.9.2 , . 3 .

8、. , . . , N () N . (N) (P) (B) , N (N P B) . BPBPN+=+=22)()( “ ” . . . KS D ISO 22489:2012 7 4.4.10 KS D ISO 14594 . 4.5 4.5.1 1 . stdAunkAstdAunkAA/ CCIk = (1) unkAI : A stdAI : A unkAI stdAI . unkAC stdAC A . kA k- . (1) . . k- . stdAunkAstdAunkAA/ ZAFZAFCCk = (2) unkAZAF : stdAZAF : ZAF . 1951 (C

9、astaing) 2. ( A ). ZAF, -Z(- ) Bence-Albee(B A) . , . 2 % . (100 eV30 keV) (1 keV50 keV) . 4.5.2 3 (Z), (A) (F) ( A ). ZAF 3 (2) . k- (iterative procedure) . -Z , , (Z) (Z) (A) 3. 1980 -Z ZAF . Bence-Albee . Bence-Albee 2 k- KS D ISO 22489:2012 8 . - . 3 , k- - . - ZAF -Z . 4.6 4.6.1 . . . . . 4.6.2

10、 KS D ISO 14595 . . 3 . . 4.6.3 . . , . 100 % . . . ( , , , ) . 4.7 , , , , . KS D ISO 22309 C . 5 KS Q ISO/IEC 17025 5.10 . . a) (: KS D ISO 22489) KS D ISO 22489:2012 9 b) c) d) e) f) g) h) i) j) PHA k) l) m) n) o) , , (: ) p) q) KS D ISO 22489:2012 10 A ( ) A.1 A k- (kA) 3 CA . A.2 , Z Z (stoppin

11、g power factor) S R . S (Bethe) 15 . S (1) j AjQ (2) . R j . R Duncumb Reed Bishop11, 12 , Z . Z R/S A.3 , A . . A . A f() . = )(d)()(d)exp()()( ZZZZZf (A.1) eccos)/(= (A.2) (Z) : d(Z) Z d(Z) : (take-off angle) (/) : f() , Philibert 4. A.4 , F A A 2 . A j 1 1.25 . Fe Ni K- Cr K 2 . 2 , . 2 Reed11 F

12、. KS D ISO 22489:2012 11 B ( ) B.1 ZAF Z, A, F . k- . ()FAZGGGCCk =stdAunkAA (B.1) GZ: (R/S)unk/(R/S)stdGA: f()unk/f()stdGF: ( %). R, S, f() GF . B.2 -Z : (A.1) (Z). (Z) (Pouchou Pichoir)5, (Packwood & Brown)9 (Bastin)6 (Merlet)7 . (: Bastin exp 2(Z)2 ) Z (0) . (Z) . (Z) GZ GA . k- . ()() ()()() ()() = ZdZexpZZdZexpZstdAstdAunkAunkAstdAunkAA CCk

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