IEC 60384-24 CORR 1-2016 Fixed capacitors for use in electronic equipment - Part 24 Sectional specification - Fixed tantalum electrolytic surface mount capacitors with conductive p.pdf

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1、IEC 60384-24:2015/COR1:2016 1 IEC 2016 INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION LECTROTECHNIQUE INTERNATIONALE _ IEC 60384-24 Edition 2.0 2015-07 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 24: Sectional specification Fixed tantalum electrolytic surface mount capacitors with co

2、nductive polymer solid electrolyte IEC 60384-24 dition 2.0 2015-07 CONDENSATEURS FIXES UTILISES DANS LES EQUIPEMENTS ELECTRONIQUES Partie 24: Spcification intermdiaire Condensateurs fixes lectrolytiques au tantale pour montage en surface lectrolyte solide en polymre conducteur CORRIGENDUM 1 Correcti

3、ons to the French version appear after the English text. Les corrections la version franaise sont donnes aprs le texte anglais. Table 3 Sampling plan for qualification approval, assessment level EZ Replace with the following new Table 3: Group no. Test Subclause Number of specimens n dPermissible nu

4、mber of non- conforming items c 0 High surge current c4.18 120+12 f0 Visual examination 4.4 Dimensions 4.4 Leakage current 4.5.1 Capacitance 4.5.2 Tangent of loss angle 4.5.3 Equivalent series resistance c4.5.4 Spare specimens 1A Resistance to soldering heat 4.6 12 0 Component solvent resistance c4.

5、16 1B Solderability 4.7 12 0 Solvent resistance of marking c4.17 2 Substrate bending test e4.9 12 0 3 aMounting 4.3 84 0 bVisual examination 4.4.2 IEC 60384-24:2016-12/COR1:2016-12(en-fr) 2 IEC 60384-24:2015/COR1:2016 IEC 2016 Leakage current 4.5.1 Capacitance 4.5.2 Tangent of loss angle 4.5.3 Equiv

6、alent series resistance c4.5.4 3.1 Shear test 4.8 12 0 Rapid change of temperature 4.10 Climatic sequence 4.11 3.2 Damp heat, steady state 4.12 12 0 3.3 Characteristics at high and low temperature 4.13 12 0 Surge voltage 4.14 3.4 Endurance 4.15 36 0 3.5 Storage at high temperature 4.19 12 0 a The va

7、lues of these inspections serve as initial inspections for the tests of Group 3. bThe capacitors found non-conforming after mounting shall not be taken into account when calculating the non-conforming items for the following tests. They shall be replaced by spare capacitors. c If required. dFor case

8、 size/voltage combinations, see 3.4.2. eNot applicable to capacitors, which shall be mounted on alumina substrates only, according to their detail specification. fSpare specimens. Table 4 Test schedule for qualification approval Replace the row concerning GROUP 3 with the following new row: GROUP 3

9、D See Table 3 4.3 Mounting See 4.3.3 4.3.2 Initial inspections Capacitance See 4.5.2.2 4.3.4 Final inspections Visual examination See 4.4.2 No visible damage Leakage current See 4.5.1.2 See detail specification Capacitance See 4.5.2.2 | C/C| 8 % of value measured in 4.3.2 Tangent of loss angle See 4

10、.5.3.2 See detail specification Equivalent series resistance eSee 4.5.4.2 See detail specification 4.3 Mounting Replace with this new subclause 4.3: 4.3 Mounting 4.3.1 General See IEC 60384-1:2008, 4.33, with the details in 4.3.2, 4.3.3 and 4.3.4. IEC 60384-24:2015/COR1:2016 3 IEC 2016 4.3.2 Initial

11、 inspections See Table 4. 4.3.3 Test conditions The test method shall be the reflow method and reflow temperature profile specified in the detail specification. 4.3.4 Final inspections and requirements See Table 4. 4 IEC 60384-24:2015/COR1:2016 IEC 2016 Corrections la version franaise: Tableau 3 Pla

12、n dchantillonnage pour homologation niveau dassurance EZ Remplacer par le nouveau Tableau 3 suivant: Groupe n Essai Paragraphe Nombre dprouvettes n dNombre admissible dlments non conformes c 0 Surintensits c4.18 120+12 f0 Examen visuel 4.4 Dimensions 4.4 Courant de fuite 4.5.1 Capacit 4.5.2 Tangente

13、 de langle de perte 4.5.3 Rsistance-srie quivalente c4.5.4 prouvettes de rechange 1A Rsistance la chaleur de brasage 4.6 12 0 Rsistance du composant aux solvants c4.16 1B Brasabilit 4.7 12 0 Rsistance du marquage aux solvants c4.17 2 Essai de pliage du substrat e4.9 12 0 3 aMontage 4.3 84 0 bExamen

14、visuel 4.4.2 Courant de fuite 4.5.1 Capacit 4.5.2 Tangente de langle de perte 4.5.3 Rsistance-srie quivalente c4.5.4 3.1 Essai de cisaillement 4.8 12 0 Variations rapides de temprature 4.10 Squence climatique 4.11 3.2 Chaleur humide, essai continu 4.12 12 0 3.3 Caractristiques hautes et basses tempr

15、atures 4.13 12 0 Surtension 4.14 3.4 Endurance 4.15 36 0 3.5 Stockage haute temprature 4.19 12 0 a Les valeurs de ces inspections servent dinspections initiales pour les essais du Groupe 3. bLes condensateurs considrs non conformes aprs le montage ne doivent pas tre pris en compte pour le calcul des

16、 lments non conformes pour les essais suivants. Ils doivent tre remplacs par des condensateurs de rechange. c Si ncessaire. dPour les combinaisons dimension de botier/tension, voir 3.4.2. eNe sapplique pas aux condensateurs qui, conformment leur spcification particulire, doivent seulement tre monts

17、sur des substrats en alumine. IEC 60384-24:2015/COR1:2016 5 IEC 2016 fprouvettes de rechange. Tableau 4 Programme dessai pour homologation Remplacer la ligne concernant le GROUPE 3 par la ligne suivante: GROUPE 3 D Voir Tableau 3 4.3 Montage Voir 4.3.3 4.3.2 Inspections initiales Capacit Voir 4.5.2.

18、2 4.3.4 Inspections finales Examen visuel Voir 4.4.2 Aucun dommage visible Courant de fuite Voir 4.5.1.2 Se reporter la spcification particulire Capacit Voir 4.5.2.2 | C/C| 8 % de la valeur mesure en 4.3.2 Tangente de langle de perte Voir 4.5.3.2 Se reporter la spcification particulire Rsistance-sri

19、e quivalente eVoir 4.5.4.2 Se reporter la spcification particulire 4.3 Montage Remplacer par le nouveau Paragraphe 4.3 suivant: 4.3 Montage 4.3.1 Gnralits Voir 4.33 de lIEC 60384-1:2008, avec les dtails du 4.3.2, 4.3.3 et 4.3.4. 4.3.2 Inspections initiales Voir le Tableau 4. 4.3.3 Conditions dessai La mthode dessai doit tre la mthode de refusion et le profil de la temprature de refusion doit tre prcis dans la spcification particulire. 4.3.4 Inspections finales et exigences Voir le Tableau 4.

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