1、 IEC 61000-4-20Edition 2.0 2010-08INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides Compatibilit lectromagntique (CEM) Partie 4-20: Techniques dessa
2、i et de mesure Essais dmission et dimmunit dans les guides donde TEM IEC61000-4-20:2010 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEMTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication ma
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17、EElectromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides Compatibilit lectromagntique (CEM) Partie 4-20: Techniques dessai et de mesure Essais dmission et dimmunit dans les guides donde TEM INTERNA
18、TIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XCICS 33.100.10; 33.100.20 PRICE CODECODE PRIXISBN 978-2-88912-149-6BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission
19、Electrotechnique Internationale 2 61000-4-20 IEC:2010 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope and object7 2 Normative references .7 3 Terms, definitions and abbreviations 8 3.1 Terms and definitions 8 3.2 Abbreviations 11 4 General 11 5 TEM waveguide requirements.12 5.1 General .12 5.2 General re
20、quirements for the use of TEM waveguides.12 5.2.1 TEM mode verification .12 5.2.2 Test volume and maximum EUT size .12 5.2.3 Validation of usable test volume 13 5.3 Special requirements and recommendations for certain types of TEM waveguides .15 5.3.1 Set-up of open TEM waveguides .15 5.3.2 Alternat
21、ive TEM mode verification for a two-port TEM waveguide 16 6 Overview of EUT types .16 6.1 General .16 6.2 Small EUT.16 6.3 Large EUT.16 7 Laboratory test conditions 17 7.1 General .17 7.2 Climatic conditions 17 7.3 Electromagnetic conditions17 8 Evaluation and reporting of test results.17 Annex A (n
22、ormative) Emission testing in TEM waveguides.19 Annex B (normative) Immunity testing in TEM waveguides.40 Annex C (normative) HEMP transient testing in TEM waveguides 46 Annex D (informative) TEM waveguide characterization.53 Annex E (informative) Calibration method for E-field probes in TEM wavegui
23、des .61 Bibliography71 Figure A.1 Routing the exit cable to the corner at the ortho-angle and the lower edge of the test volume .30 Figure A.2 Basic ortho-axis positioner or manipulator 31 Figure A.3 Three orthogonal axis-rotation positions for emission measurements32 Figure A.4 Twelve-face (surface
24、) and axis orientations for a typical EUT .33 Figure A.5 Open-area test site (OATS) geometry .34 Figure A.6 Two-port TEM cell (symmetric septum) .35 Figure A.7 One-port TEM cell (asymmetric septum) .36 Figure A.8 Stripline (two plates).38 Figure A.9 Stripline (four plates, balanced feeding)39 61000-
25、4-20 IEC:2010 3 Figure B.1 Example of test set-up for single-polarization TEM waveguides 44 Figure B.2 Uniform area calibration points in TEM waveguide45 Figure C.1 Frequency domain spectral magnitude between 100 kHz and 300 MHz 52 Figure D.1 Simple waveguide (no TEM mode)59 Figure D.2 Example waveg
26、uides for TEM-mode propagation59 Figure D.3 Polarization vector59 Figure D.4 Transmission line model for TEM propagation 59 Figure D.5 One- and two-port TEM waveguides .60 Figure E.1 An example of the measurement points for the validation62 Figure E.2 Setup for validation of perturbation .63 Figure
27、E.3 Setup for measuring net power to a transmitting device 66 Figure E.4 Example of setup for calibration of E-field probe .67 Figure E.5 Setup for calibration of E-field probe by another method.69 Figure E.6 Equivalent circuit of antenna and measurement apparatus70 Table 1 Values K for expanded unc
28、ertainty with normal distribution .15 Table B.1 Uniform area calibration points.42 Table B.2 Test levels .42 Table C.1 Radiated immunity test levels defined in the present standard .52 Table E.1 Calibration frequencies 63 Table E.2 Calibration field strength level64 4 61000-4-20 IEC:2010 INTERNATION
29、AL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardizat
30、ion comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes Internatio
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36、or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carri
37、ed out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Comm
38、ittees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn t
39、o the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be
40、held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-20 has been prepared by 77B: High-frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility, in cooperation with CISPR (International Special Committee on Radio Interference) su
41、bcommittee A: Radio interference measurements and statistical methods. This second edition cancels and replaces the first edition published in 2003 and its amendment 1 (2006), and constitutes a technical revision. It forms Part 4-20 of IEC 61000. It has the status of a basic EMC publication in accor
42、dance with IEC Guide 107. The main changes with respect to the first edition of this standard and its amendment are the following: consistency of terms (e.g. test, measurement, etc.) has been improved; 61000-4-20 IEC:2010 5 clauses covering test considerations, evaluations and the test report have b
43、een added; references to large TEM waveguides have been eliminated; a new informative annex has been added to deal with calibration of E-field probes. The text of this standard is based on the following documents: FDIS Report on voting 77B/637/FDIS 77B/641/RVDFull information on the voting for the a
44、pproval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61000 series, published under the general title Electromagnetic compatibility (EMC), can be
45、found on the IEC website. The committee has decided that the contents of the base publication and its amendments will remain unchanged until the stability result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the public
46、ation will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 61000-4-20 IEC:2010 INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Pa
47、rt 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques
48、Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic Standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards, Technical Specifications or Techni
49、cal Reports, some of which have already been published as sections. Others are and will be published with the part number followed by a dash and a second number identifying the subdivision (example: IEC 61000-6-1). This part of IEC 61000 is an International Standard which gives emission, immunity and HEMP transient testing requirements. 61000-4-20
