1、 IEEE Standard Environmental and Testing Requirements for Communications Networking Devices Installed in Transmission and Distribution Facilities Sponsored by the Substations Committee and the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energ
2、y SocietyIEEE Std 1613.1-2013IEEE Std 1613.1-2013 IEEE Standard Environmental and Testing Requirements for Communications Networking Devices Installed in Transmission and Distribution Facilities Sponsor Substations Committee Co-Sponsor Transmission and Distribution Committee of the IEEE Power and En
3、ergy Society Approved 11 December 2013 IEEE-SA Standards Board Abstract: Environmental testing requirements are defined for communications networking devices to be installed in transmission and distribution facilities. This standard establishes a common reproducible basis for designing and evaluatin
4、g devices utilizing radio frequency (RF) up to 6 GHz, power line communications, and broadband over power line (BPL) technologies. It also requires immunity to five IEC electromagnetic compatibility standards for which there are no IEEE equivalent standards. This standard is an extension to IEEE Std
5、 1613-2009 and IEEE Std 1613a-2011. Keywords: common-mode disturbances, communications networking device, conducted RF, damped oscillatory magnetic fields, IEEE 1613.1, immunity, power frequency magnetic fields, radiated, RFI hazards, surge The Institute of Electrical and Electronics Engineers, Inc.
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35、ch rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. viParticipants At the time this draft standard was completed, the PES Substations C2 Working Group had the following membership: John Te
36、ngdin, Co-Chair G. Larry Clark, Co-Chair Gerald Ramie, Vice Chair Krista Gluchoski, Secretary John Banting James Bougie Didier Chan-Foy Bui Dac-phoue Michael J. Dood Ron Farquharson Richard Harada Chris Huntley Marc Lacroix Alex Lee Brian Mugalian Jay Murphy Daniel Nordell Arnold Offner Craig Preuss
37、 Mark Simon Tyler Stinson Eric Thibodeau Jian-Chang Tan The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Saleman Alibhay John Banting Paul Barnhart Philip Beaumont Robert Beresh Osc
38、ar Bolado James Bougie Gustavo Brunello William Byrd Thomas Callsen Paul Cardinal Didier Chan-Foy Suresh Channarasappa Robert Christman Stephen Conrad Randall Crellin Michael J. Dood John Egan Kenneth Fodero Fredric Friend Jalal Gohari Stephen Grier Randall Groves Roger Hedding Jeffrey Helzer Lee He
39、rron Gary Heuston Werner Hoelzl Yi Hu Chris Huntley Noriyuki Ikeuchi Gael Kennedy Yuri Khersonsky Jim Kulchisky Marc Lacroix Chung-Yiu Lam Thomas McCarthy William Mccoy John McDonald Jose Morales Brian Mugalian Jerry Murphy R. Murphy Bruce Muschlitz Michael Newman Joe Nims Gary Nissen Lorraine Padde
40、n Bansi Patel Percy Pool Craig Preuss Farnoosh Rahmatian Michael Roberts Charles Rogers Benjamin Rolfe Thomas Rozek Sergio Santos Bartien Sayogo Dennis Schlender Thomas Schossig Devki Sharma Mark Simon Veselin Skendzic Jerry Smith John Spare Gary Stoedter Gary Stuebing John Tengdin Joe Uchiyama Eric
41、 Udren Benton Vandiver John Vergis Jane Verner James Wilson Daidi Zhong Sergio Zimath Copyright 2013 IEEE. All rights reserved. viiWhen the IEEE-SA Standards Board approved this standard on 11 December 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hule
42、tt, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpin Gary Hoffman Paul Houz Jim Hughes Michael Janezic Joseph L. Koepfinger* Oleg Logvinov Ron Petersen Gary Robinson Jon
43、 Walter Rosdahl Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger Senior Program Manager, IEEE-SA
44、Content Publishing Erin Spiewak Program Manager, IEEE-SA Technical Community Copyright 2013 IEEE. All rights reserved. viiiIntroduction This introduction is not part of IEEE Std 1613.1-2013, IEEE Standard Environmental and Testing Requirements for Communications Networking Devices Installed in Trans
45、mission and Distribution Facilities. This document is an extension of IEEE Std 1613-2009 and its amendment (IEEE Std 1613a-2011) from two perspectives. The scope has been broadened to include devices installed in all electric power facilities, not just substations, and includes the communications mo
46、dules installed in Smart Meters. It adds two installation zones(Zone A) inside a facilitys building/control house or fenced area, and (Zone B) outside these buildings or fenced areas. Thus, it is expressly applicable for devices used for distribution automation and distributed generation. Added are
47、the device testing and performance requirements for communications via radio frequency (RF), via power line carrier/communications, via Broadband over Power Line (BPL), or via Ethernet cable. Five IEC immunity tests have also been added as suggested in the SGIP-EMI Issues White paper B5awith specifi
48、c immunity levels for Zone A and Zone B installations. The test conditions and acceptance criteria in Annex A have been revised to help ensure that the transmit function of the device is exposed to the test conditions at some point during the tests in Clause 5 through Clause 12. This is a new requir
49、ement in this text, and may not be a requirement in other standards. The requirements in Clause 6 of IEEE Std 1613-2009 regarding the application of the fast transient (EFT) test waveform for transverse mode testing of a devices input/output circuits have been deleted. Transverse mode testing for EFT is only required on dc power supply terminals rated 48 volts or above. Other than these changes and the reduced test levels in Zone B, all the remaining requirements in IEEE Std 1613-2009 are unchanged, and are applicable to IEEE 1613.1 devices. The reverse is a
